Methods, devices, and systems for testing the flexibility of a sample such as an electronic device are provided herein. A testing system can have a motor operably connected to a mandrel such that the motor causes the mandrel to accurately and precisely rotate and cause the sample to conform to an outer surface of the mandrel. Moreover, a proximal end of the sample is secured to the outer surface of the mandrel, and the opposing distal end is controlled by a retractable holder such that the entire sample is subjected to a constant bend radius as the mandrel rotates. Other aspects and features such as controlling the environment around the mandrel and securing small samples to the mandrel are also described herein.

A stress luminescence measurement device according to a first aspect is provided with a load application mechanism configured to deform a sample by applying a load to the sample, a light source configured to emit excitation light to a stress luminescent material 2 arranged on a surface of the sample, a camera configured to image luminescence of the stress luminescent material, and a controller configured to control the load application mechanism, the light source, and the camera. The controller acquires a deformation state of the sample at the imaging timing by the camera and stores the acquired deformation state of the sample in association with the image captured by the camera in a memory.

A material testing apparatus comprising a frame having three or more tracks, and a plurality of mounts positioned within the three or more tracks. The mounts including an attachment mechanism to attach the mounts to a material being tested. The mounts including a force measurement elements. Some of the mounts free mounts that move in a track slot within the track, the free mounts free to move to any position within the track slot. The apparatus further comprising a data collector to collect data from the force measurement elements in the mounts when the material is placed under stress, to characterize the material.

A bending test apparatus includes a jig including first to third supporting members arranged in a first direction; a shaft member including a first shaft, a second shaft, and a third shaft extending in a second direction intersecting the first direction and respectively connected to the first to third supporting members; a driving member connected to the first shaft and providing a rotation force to the first shaft; a sliding member including a first slider and a second slider respectively connected to the second shaft and the third shaft; and a rail member extending in the first direction and guiding movements of the first slider and the second slider. When the first shaft rotates the first supporting member in a first rotation direction, the second and third supporting members rotate in a second rotation direction opposite to the first rotation direction.

Provided is a deformation tester where a specimen is deformed and can be observed and analyzed in any deformation state without removal. The tester includes: a detachable part repeating a relative displacement cycle, two portions of the specimen attached to a first and a second attachment portion of a first and a second part member, the specimen deformed from a first to a second shape state and back to the first shape state during the cycle; and a main body part that the detachable part is detachably attached to; wherein a state retaining part for fixing a relative position of the second to the first part member in at least one shape state is freely attachable to the detachable part mounted on the main body part and the detachable part with the state retaining part is freely attachable to the main body part.

A test apparatus for measuring strength of a specimen includes: a lower container having an opening that opens upward; an upper container having an opening that opens downward and being sized to be insertable into the opening of the lower container; a support unit that is provided in the opening of the lower container and supports the specimen; a pressing unit including an indenter that presses the specimen, and a load measurement unit that measures a load applied to the indenter; and a movement mechanism that moves the indenter closer and away relative to the support unit, in which when the specimen supported by the support unit is pressed by the indenter moved by the movement mechanism, the upper container is positioned so as to cover the specimen.

A system and method for automated transfer of a tape segment onto the face of a tissue block to be thin sectioned by microtomy includes applying, to a carrier strip, a plurality of serially-spaced patches of sample tape having an adhesive outer surface, transporting the carrier strip along a path adjacent to and spaced from the exposed sample surface to position one of the patches of sample tape adjacent to and covering the exposed sample surface, adhering the one of the patches of sample tape to the exposed sample surface.

A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable system is configured to move the film sample in the material holder system to the tear analysis device.

Disclosed are a rolling test device and a rolling test method. The rolling test device includes a test platform having a rolling surface for placing a test piece to be rolled; a rolling jig located on one side of the rolling surface; and a driving member connected to the rolling jig. A roller is connected to one end of the rolling jig towards the rolling surface, and after the roller is pressed against the rolling surface, the driving member drives the rolling jig to move on the rolling surface to drive the roller to perform a rolling test on the rolling surface.

Apparatus for inspecting the tension of a tape adhered to an annular frame having, in the center thereof, an opening for accommodating a wafer includes: a frame support section that supports the annular frame, a light source that applies light toward the tape, an imaging camera that captures, through the tape, the light applied from the light source, a first polarizing plate disposed between the tape and the light source, and a second polarizing plate disposed between the tape and the imaging camera and positioned so as to shield the light of linearly polarized light transmitted through the first polarizing plate. If distortion is generated in a polarization plane of the light due to application, onto the tape, of the light of the linearly polarized light transmitted through the first polarizing plate, the light is transmitted through the second polarizing plate, and the imaging camera images the transmitted light.