The invention provides a testing probe, which includes a base, an elastic extensible element and a probe needle, the probe needle being disposed on the base through the elastic extensible element, and the elastic extensible element being in a stretched state. By the testing probe provided by the invention, only coating silver adhesive on the testing area of the liquid crystal screen previously is needed, and the steps of making solder wire, fixing solder wire, etc. are not needed any more. Therefore not only the preparation before testing can be simplified largely, but also reliability of connection is ensured, so as to reduce testing time largely and improve testing efficiency. The invention further provides a testing device including the above testing probe.

A fluid pressure actuated device for establishing electrical contact includes a first side and a second side each defining a respective cavity. A respective flexible membrane is positioned across each cavity. Each membrane has an outer side that carries an electrically conducting contactor. The contactors are electrically connected to a conducting connector that extends at least partially through the device. Each flexible membrane extends and withdraws moving the associated electrically conducting contactor in opposing directions when fluid pressure is increased and decreased in the associated cavity. Each membrane may have an undulating shape by including concentric frustum portions that narrow in opposite directions. The contacts may have neutral positions that are internal relative to outer surfaces of the device until fluid pressure is increased in the respective cavities causing extension by movement of the membranes.

It is described a contact probe for a testing head of an apparatus for testing electronic devices including a body essentially extended along a longitudinal direction between a contact tip and a contact head, that contact probe comprising at least one multilayer structure, in turn including a superposition of at least one inner layer or core and a first inner coating layer, and an outer coating layer that completely covers the multilayer structure and made of a material having a higher hardness than a material realizing the core.

A contact terminal has a support section that holds an elastically deformable axle so as to rotate about the axle with an elastic deformation of the axle, and a contact section extending from the support section. The contact section has, at a distal end thereof, a contact portion configured to make a contact with a testing element. The contact section deforms elastically while rotating with the support section by the contact of the contact portion with the testing element.

The present invention intends to suppress a contact probe from interfering with a guide plate to produce shavings. The present invention has stacked structure that sandwiches an intermediate metallic layer 12 between outer metallic layers 11 and 13, and includes: a contact part 2 that is brought into abutting with a test object; an elastic deformation part 4 that is elastically deformed so as to be curved in a predetermine direction of curvature N by compression force in the longer direction; and a fore end part 3 that is formed between the contact part 2 and the elastic deformation part 4 and supported by a through-hole 121 of a guide plate 120 so as to make the contact part 2 movable in the longer direction, in which side surfaces of the fore end part 3 formed in the direction of curvature N and a direction N′ opposite to the N of the elastic deformation part 4 are configured to include the three metallic layers 11 to 13, and on the side surfaces, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13.

An electrical probe includes a main body, a probe head and a plurality of pins. The probe head is disposed on the main body, and the probe head has a surface and a plurality of openings on the surface. Each pin includes a contacting portion and an inserting portion connected to each other. Each pin has an obtuse angle between the contacting portion and the inserting portion, and the inserting portions of the pins respectively inserted into the openings.

A contact inspection device including contacts that contact with a test object for inspection, each contact having a base end portion, a needle tip portion having a needle tip that contacts with the test object, and an elastically deformable portion located between the base end portion and the needle tip portion, with the base end portion and the needle tip portion having axes which coincide with each other. The elastically deformable portion is deformable under a compressive force applied in the axial direction of the needle tip portion while the needle tip is pressed against the test object and converts the compressive force into a tilting motion of the needle tip portion about the needle tip through deformation. The needle tip portion is displaceable in a direction in which the needle tip portion is pivotally tilted while the needle tip is pressed against the test object.

A testing device is disclosed including a plurality of elastic members, a plurality of elastic terminals, and a plurality of terminal boards. Each elastic member is provided with an arc-shaped elastic deformation portion, at least one elastic terminal is arranged as one set and is clamped on one elastic member with an inner arc of the elastic deformation portion. Each terminal board is provided with a recess for accommodating one of the elastic members, the recess is provided with at least one arc-shaped groove each matched with a respective elastic terminal, an outer arc of the elastic deformation portion is embedded in a respective arc-shaped groove, each arc-shaped groove has an upper end extending to an upper surface of the terminal board, and a lower end extending to a lower surface of the terminal board.

A probe card device and a directivity probe thereof are provided. The directivity probe having an elongated shape includes a conductive pin and a ring-shaped insulator. The conductive pin includes a stroke segment and two end segments respectively extending from the stroke segment. The stroke segment has two broad side surfaces and two narrow side surfaces, and has only one transverse slot that is recessed in one of the two broad side surfaces and that extends from one of the two narrow side surfaces to the other narrow side surface. The transverse groove has a maximum depth that is 1%-10% of a maximum distance between the two broad side surfaces. The stroke segment of the directivity probe can be bent by applying a force to the two end segments, and an inflection point of the bent stroke segment is located in the transverse slot.

An electrical contactor includes: an installing portion; a base end portion extending continuously toward the installing portion; a plurality of arm portions extending from the base end portion in a longitudinal direction; a coupling portion coupled to the tip of each of the arm portions; a pedestal portion provided continuously toward the coupling portion; and a contact portion provided at a lower end of the pedestal portion, wherein each of the plurality of arm portions elastically supports the contact portion in contact with a first contact target, and a curved portion is provided on the coupling portion side or the base end portion side of a closest-to-contact-portion arm portion that is the closest to the contact portion among the plurality of arm portions.