A flexible contactor that electrically connects a pad of an inspection target object with a pad of an inspection device includes, a first elastic part configured to contain a first conductive particle and be formed elastically deformable; and a second elastic part, which is connected in parallel to the first elastic part in a longitudinal direction, configured to contain a second conductive particle and be formed elastically deformable. The first elastic part and the second elastic part are different from each other in at least one of physical properties including hardness, Young's modulus, and resistivity.

A probe card for a test equipment of electronic devices includes a flexible membrane configured to carry high frequency signals between a device under test and a support plate. The flexible membrane is connected to the support plate through a peripheral zone, and a damping structure is arranged between the support plate and the flexible membrane. A plurality of micro contact probes include a body extending between a first end and a second end, and the second end is configured to abut onto contact pads of the device under test, and the damping structure and the first ends of the micro contact probes are in contact with opposite faces of a same contact zone of the flexible membrane. The flexible membrane includes at least one weakening zone arranged between the contact zone and the peripheral zone.

The present invention relates to a contact and a socket device for testing a semiconductor device. The contact of the present invention is a spring contact which is integrally formed by blanking and bending a metal plate member and includes an elastic portion made of various strips of certain pattern and a tip provided at both ends of the elastic portion. Preferably, an inner volume of the contact is filled with a filler having conductivity and elasticity, whereby durability and electrical characteristics are excellent. Further, the test socket according to the present invention is a rubber type employing the above-mentioned contact and has an advantage that it is suitable for testing a fine pitch device.

A probe pin is provided with a plate-like movable pin including: a flexible part configured to extend and contract lengthwise; a first contact part and a second contact part each provided at an end of the flexible part lengthwise; and a conduction-path forming element overlapping the movable pin along the thickness thereof. The conduction-path forming element includes a first contact surface and a second contact surface at lengthwise ends configured to contact the first contact part and second contact part; the movable pin and the conduction-path forming element are arranged to allow the first contact part to remain in contact with the first contact surface and the second contact part to remain in contact with the second contact surface while allowing relative movement of the movable pin and the conduction-path forming element lengthwise.

A probe pin includes a first contact part and a second contact part; a middle part located between the first contact part and the second contact part; a first flexible part configured to move the first contact part relative to the middle part in the first arrangement direction; and a movable part configured to move the second contact part relative to the middle part in a direction intersecting with the first arrangement direction.

An object of the present disclosure is to make it possible to improve electrical inspection of an object to be inspected by making the conduction characteristics of an electrical signal flowing through an electrical contactor better. An electrical contactor of the present disclosure includes: an installing portion; a base end portion extending continuously toward the installing portion; a plurality of arm portions extending from the base end portion in a longitudinal direction; a coupling portion coupled to the tip of each of the arm portions; a pedestal portion provided continuously toward the coupling portion; and a contact portion provided at a lower end of the pedestal portion, wherein each of the plurality of arm portions elastically supports the contact portion in contact with a first contact target, and a curved portion is provided on the coupling portion side or the base end portion side of a closest-to-contact-portion arm portion that is the closest to the contact portion among the plurality of arm portions.

The present disclosure disclosed a test device, which is defined with a test point connected with a circuit board of a display screen, thereby imputing a test signal to the display screen. The test device includes: a housing and a probe, an accommodation cavity with an open bottom is formed in the housing, a first contact and a second contact are defined on the inner wall of the accommodation cavity, the probe is defined in the accommodation cavity and movable between a first position and a second position in a first direction, when the probe is at a first position, a test signal may be conducted to a test point; when the probe is at a second position, the charge of the probe accumulated may be released.

A probe head includes a first die, a second die, and a plurality of rectangular probes. Each rectangular probe includes a deformable segment arranged between the first and the second dies, a first positioned segment, and a second positioned segment, the latter two of which respectively extend from two opposite ends of the deformable segment and are respectively arranged in a first rectangular wall of the first die and a second rectangular wall of the second die. Each first rectangular wall and the corresponding second rectangular wall have a longitudinal offset and a width offset so as to press the first and second positioned segments of the corresponding rectangular probe, so that the deformable segment of the corresponding rectangular probe is compressed to be in a curved and deformed shape. A ratio of the longitudinal offset to the width offset is within a range of 10 to 1.

A plate spring-type connection pin is proposed. The connection pin includes: a support pin that has a bending lip portion at an upper portion thereof and a base portion at a lower portion thereof, and is vertically elongated; a plate spring that has an upper probe portion vertically extending adjacent to the lip portion, a lower probe portion disposed at the same height as the base portion, a laterally lying V-shaped portion disposed between the upper probe portion and the lower probe portion, an upper bending portion connecting an upper end of the V-shaped portion and a lower end of the upper probe portion, and a lower bending portion connecting a lower end of the V-shaped portion and an upper end of the lower probe portion; and a bridge that is disposed between the base portion of the support pin and the lower probe portion of the plate spring.

Provided is a vertical probe card, the vertical probe card includes: a printed circuit board (PCB) including a bottom hole and a PCB pad surrounding the bottom hole; a cover plate disposed on the PCB and including a cover hole, where the cover hole and the bottom hole are disposed coaxial with each other and form a receiving space; and a probe received in the receiving space. The probe includes a probe head passing through the cover hole to extend out of the cover plate and to contact with a chip, where an end, which is provided with the probe head, of the probe is a first end; and a protruding portion disposed in the mid-portion of the probe and in contact with the PCB pad, where a part between the probe head and the protruding portion of the probe and the protruding portion are conductors.