A signal abnormality detection system and a method thereof are provided. The signal abnormality detection system includes a signal sensor and a computing device. The signal sensor generates a sample signal to be tested through sensing. The computing device is signal-connected to the signal sensor to receive the sample signal to be tested, perform a correction on the sample signal to be tested, and perform a time-frequency transform on a one-dimensional signal generated after the correction to generate a two-dimensional time-frequency signal. The computing device reconstructs the two-dimensional time-frequency signal by using an abnormality detection model to calculate a reconstructed difference value. The computing device performs comparison to determine whether the reconstructed difference value is greater than a detection threshold to determine whether the sample signal to be tested is an abnormal sample.

A frequency adaptive harmonic current generator, including a microcontroller board (15) used for controlling the generation of harmonic currents and frequency adaptive operating function; an electronic relay (11) controlled and switched over the digital output of the microcontroller (21), the resistor (23) and the transistor (24); a data collection unit (13) to which the voltage divider (5), the buffer (6) and the current shunt (8) are connected for the measurement of voltage and current harmonics and which reads the current and voltage values and transfers such values to the panel type computer (14); and a panel type computer (14) which includes software for making, presenting and recording the measurements, the external connections of which are ensured by USB connectors (18) and a LAN connector (19), which displays the measurement values to the user, and which has push-button (20) for switching on/off operations.

There is provided an attenuation amount setting unit 19 that sets, in a case where signals are simultaneously output from all output ports 17a, 17b, and 17c of a plurality of interface units 12a and 12b at the same signal level, one of the plurality of interface units 12a and 12b as the reference interface unit 12a, and adds a difference between an attenuation amount of a second attenuator 14 stored in a storage unit 18 of the reference interface unit 12a and an attenuation amount of another second attenuator 14 stored in another storage unit 18 of the other interface unit 12b to an attenuation amount of each of a plurality of third attenuators 15a, 15b, and 15c of the other interface unit 12b to correct the attenuation amount.

A testing device and a method for testing a device under test are provided. The testing device comprises at least two signal generators, at least two numerically controlled oscillators, at least two white gaussian noise generators, at least two digital filters, each of which comprising a respective transfer function H.sub.i, at least two adders, at least two digital-to-analog converters, and an analog processor.

In a method of manufacturing an integrated circuit involving performing an electrostatic discharge (ESD) test, a weak frequency band is detected by sequentially radiating a plurality of first electromagnetic waves on a first test board including the integrated circuit. First peak-to-peak voltage signals are detected by sequentially radiating the plurality of first electromagnetic waves on a second test board including an electromagnetic wave receiving module. A frequency spectrum is detected by radiating a second electromagnetic wave on a housing including a third test board including the electromagnetic wave receiving module. A second peak-to-peak voltage signal is generated based on the weak frequency band, the first peak-to-peak voltage signals and the frequency spectrum. An ESD characteristic associated with an electronic system including the integrated circuit is predicted based on the second peak-to-peak voltage signal.

A test system for a memory card includes a first circuit board. One side of the first circuit board is provided with a plurality of contact groups spaced apart from each other along a row direction. Another side of the first circuit board is provided with slots disposed along the row direction. The test system further includes a second circuit board. The second circuit board is provided with a test circuit, and is inserted into the slot along a direction perpendicular to the first circuit board. The second circuit board provides a test signal to the contact groups.

The present disclosure provides a system and a method for monitoring semiconductor manufacturing equipment. The system includes a sensor, a circuit, and an analysis unit. The sensor provides a sensor signal. The circuit receives the sensor signal and generates an input signal. The analysis unit includes a signal management platform, receiving the input signal and performing a first data process to generate a first data signal; a diagnosis subsystem, receiving the first data signal from the signal management platform and performing a health status monitoring process to generate a second data signal; and a decision subsystem, performing a determination process to generate a third data signal according to the second data signal from the diagnosis subsystem. The diagnosis subsystem generates a feedback signal according to the third data signal, and the signal management platform transmits the feedback signal to the semiconductor manufacturing equipment.

A test and measurement device having a signal source, including an impairment generator configured to output an impairment and a waveform synthesizer. The waveform synthesizer receives an input digital signal to be synthesized, receives the impairment, and synthesizes a synthesized digital signal based on the input digital signal and the impairment. The test and measurement instrument also includes a fixed sample rate digital-to-analog converter configured to receive a clock signal and the synthesized digital signal and output an analog signal.

A method for providing a jitter signal for modulating a switching frequency of a power switch for a power converter. The method comprising receiving a drive signal representative of the switching frequency of the power switch, detecting the switching frequency from the drive signal, determining if the switching frequency is less than a first threshold frequency, and modulating a frequency of the jitter signal in response to determining if the switching frequency is less than the first threshold frequency.

A measurement system includes a source unit to provide a source signal to a sample and a voltage source and/or a current source and a memory. The system also includes a measurement unit configured to acquire from the sample an measurement signal that may be responsive to the source signal and a voltage measuring unit, a current measuring unit, and/or a capacitance measuring unit, and a memory. The system also includes a control unit including a digital signal processing unit; a source converter; a measurement converter. The system further includes a synchronization unit configured to synchronize clocks of the digital signal processing unit, the source converter, the measurement converter, the source unit, and the measurement unit; a calibration unit for calibrating aspects of the system including the control unit; and a reference voltage supply configured to supply a common reference voltage for the control unit.