Techniques to perform semiconductor testing are described. Test equipment may test a chiplet for compliance with a semiconductor specification. A test device may connect to a test package with a model chiplet and a device under test (DUT) chiplet. The model chiplet may comprise a known good model (KGM) of the semiconductor specification. The test device may use the model chiplet to test the DUT chiplet. Other embodiments are described and claimed.

A method for testing systems on a chip during manufacture obtains basic function information of intellectual property cores and relevant information of network on chip and generates one or more test names according to the basic function information, and the relevant information of the network on chip. The method invokes a pre-prepared integral script to construct a running environment configured to invoke basic function scripts of to-be-tested intellectual property cores one by one, according to each of the test names which are generated. The method also generates the results of testing. A related electronic device and a non-transitory storage medium are also disclosed.

An integrated circuit (IC) device and a method for communicating test data utilizes test control circuitry, and a test controller. The test controller is coupled with the test control circuitry and decodes packetized test pattern data to identify configuration data for the test controller and test data for the test control circuitry. The test controller further communicates the test data to the test control circuitry, and packetizes resulting data received from the test control circuitry. The resulting data corresponds to errors identified by a test performed based on the test pattern data.

Embodiments relate to a system, program product, and method for random generation of recoverable errors in the generated instruction stream for post-silicon validation testing. The intentional raising and handling of exceptions in post-silicon validation exercisers randomly creates recoverable errors in a generated instruction test stream. Multiple exceptions may be raised either in a single instruction or in multiple instructions, while the present instruction is permitted to fully execute. The errors responsible for raising the exceptions are automatically repaired.

A hardware design for a main data transformation component is verified. The main data transformation component is representable as a hierarchical set of data transformation components which includes (i) a plurality of leaf data transformation components which do not have children, and (ii) one or more parent data transformation components which each comprise one or more child data transformation components. For each of the plurality of leaf data transformation components, it is verified that an instantiation of the hardware design for the leaf data transformation component generates an expected output transaction in response to each of a plurality of test input transactions. For each of the one or more parent data transformation components, it is formally verified, using a formal verification tool, that an instantiation of an abstracted hardware design for the parent data transformation component generates an expected output transaction in response to each of a plurality of test input transactions. The abstracted hardware design for the parent data transformation component represents each of the one or more child data transformation components of the parent data transformation component with a corresponding abstracted component that for a specific input transaction to the child data transformation component is configured to produce a specific output transaction with a causal deterministic relationship to the specific input transaction.

Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.

A hardware design for a main data transformation component is verified. The main data transformation component is representable as a hierarchical set of data transformation components which includes (i) leaf data transformation components which do not have children, and (ii) parent data transformation components which comprise one or more child data transformation components. For each of the leaf data transformation components, it is verified that an instantiation of the hardware design for the leaf data transformation component generates an expected output transaction. For each of the parent data transformation components, it is formally verified that an instantiation of an abstracted hardware design generates an expected output transaction in response to each of test input transactions. The abstracted hardware design for the parent data transformation component represents each of the child data transformation components of the parent data transformation component with a corresponding abstracted component that for a specific input transaction to the child data transformation component produces a specific output transaction with a causal deterministic relationship to the specific input transaction.

System analysis by receiving a model of a complex system design. The model includes at least one layer. The analysis includes performing a plurality of simulations of the performance of the layer. The number of simulations is determined according to a number of system components associated with the layer. The analysis further includes determining a worst-case result for a set of simulations from the plurality of simulations and assigning the worst-case result to an overall system simulation.

An apparatus includes a daughter die (DD) logic, and an arbitrator connected to the DD logic, and connected to an external testing device and a main die (MD) included in a multi-chip package (MCP). The apparatus further includes an enable logic configured to receive a message from the MD, based on the received message, determine whether the MD or the external testing device is enabled to access the DD logic, and based on the external testing device being determined to be enabled to access the DD logic, control the arbitrator to enable the external testing device to access the DD logic.

Provided is a method for enabling a semiconductor test system for testing field programmable gate arrays (FPGAs) to operate as a device programmer by converting a serial vector format (SVF) file containing a bitstream and converting the file to a vector compatible with the semiconductor test system. When executed on an HP93K test system, as an example, the vector generates JTAG (Joint Test Action Group) signals, which program the bitstream into a Field Programmable Gate Array (FPGA). The inventive method eliminates the need for a separate computer system that is normally required to run FPGA programming software and also eliminates the need to use FPGA vendor provided JTAG programming pods. Eliminating the need for the vendor software, a separate computer system, and programming pods reduces equipment cost, maintenance, and streamlines the electrical test, evaluation, and characterization of FPGAs.