Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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31/00
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/28
Testing of electronic circuits, e.g. by signal tracer
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G01R31/317
Testing of digital circuits
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G01R31/319
Tester hardware, i.e. output processing circuits
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G01R31/31917
Stimuli generation or application of test patterns to the device under test [DUT]
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