An image generation system includes a light detector configured to detect light from a sample; a super-resolution image component transmitter including an objective, configured to transmit the light from the sample including a super-resolution image component that exceeds a cut-off frequency of the objective to the light detector; and an image processor configured to enhance the super-resolution image component of an image of the sample in accordance with an output signal from the light detector. The super-resolution image component transmitter includes a light polarization converter that is placed in an optical path of illumination light for illuminating the sample and that is configured to convert a polarization state of the illumination light to make a polarization direction distribution in the light flux of the illumination light symmetric with respect to an optical axis of the illumination light.

Provided is a system for observing an object that emits fluorescence when irradiated with excitation light. The system includes: a hole unit having holes on a plane perpendicular to an optical axis of the objective lens to allow the excitation light to pass through the holes in a direction parallel to the optical axis; and an imaging unit including: an imaging lens configured to focus the fluorescence; a microlens array having microlenses arranged on a plane perpendicular to an optical axis of the imaging lens; and an image sensor having pixels configured to: receive the fluorescence via the objective lens, at least one of the holes, and the microlens array, the fluorescence being emitted when the object is irradiated with the excitation light having passed through at least one of the holes and the objective lens; and output an image signal in accordance with an intensity of the received fluorescence.

A confocal scanner includes a first micro lens disk having a plurality of micro lenses arranged thereon, a second micro lens disk having a plurality of micro lenses, which is arranged in correspondence to an arrangement pattern of the first micro lens disk, and having a common rotation axis to the first micro lens disk, and a beam splitter configured to guide an illumination light, which is to be irradiated to an object, to the first micro lens disk, and to guide a return light from the object having passed through each micro lens of the first micro lens disk to the corresponding micro lens of the second micro lens disk. A numerical aperture of each micro lens arranged on the second micro lens disk is greater than a numerical aperture of each micro lens arranged on the first micro lens disk.

A microscope and method of microscopy having a light source for providing illumination light, a controllable manipulation device for generating in a variable manner an illumination pattern of the illumination light to be selected, an illumination beam path with a microscope lens for guiding the illumination pattern to a sample to be examined, a detector having a plurality of pixels for examining the fluorescent light emitted by the sample, a detection beam path for guiding the fluorescent light emitted by the sample to the detector, a main beam splitter for splitting illumination light and fluorescent light, a control and evaluation unit for controlling the manipulation device and for evaluating the data measured by the detector. The manipulation device is arranged in the illumination beam path upstream from the main beam splitter in the vicinity of an optically conjugated plane to the sample plane such that the pixel of the detector can be individually activated using the control and evaluation unit and in read out patterns to be selected and that the control and evaluation unit is designed to activate pixels of the detectors individually or in a selected read out pattern dependent on the selected illumination pattern.

A confocal microscope includes a data acquisition unit configured to acquire a rough-shape data indicating a rough shape of a sample, an illumination light source configured to generate illumination light for illuminating the sample, an objective lens configured to concentrate the illumination light on the sample, an optical scanner configured to scan an illuminated place on the sample in a field of view of the objective lens, a stage configured to scan the illuminated place along the rough shape of the sample by changing a position of the objective lens relative to the sample, and an optical detector configured to detect reflected light through a confocal optical system, the reflected light being light that has been reflected on the sample and has passed through the objective lens.

Methods and apparatus for optical imaging and scanning of holes machined, drilled or otherwise formed in a substrate made of composite or metallic material. The method utilizes an optical instrument for imaging and scanning a hole in combination with an image processor configured (e.g., programmed) to post-process the image data to generate one complete planarized image without conical optical distortion. The optical instrument includes an optical microscope with confocal illumination and a conical mirror axially positioned to produce a full 360-degree sub-image with conical distortion. In the post-processing step, a mathematical transformation in the form of computer-executable code is used to transform the raw conical sub-images to planar sub-images. The planarized sub-images may be stitched together to form a complete planarized image of the hole.

A laser scanning microscope and method for adjusting a laser scanning microscope. The microscope has an optical system which has a light guiding fiber between the first light source and the third beam deflection unit and has no light guiding fibers between the second light source and the third beam deflection unit. In this way, the second light source can be used as an adjustment reference for the first and second beam deflection units. The adjustment can be implemented using test images recorded by means of the third and fourth beam deflection units; additional sensors or internal calibration samples are not required.

A Koehler integrator device (10) comprises a collimating lens (11) being arranged for collimating a light field created by an incoherent or partially coherent light source, a pair of planar first and second micro-lens arrays (12, 13) being arranged for relaying portions of the collimated light field along separate imaging channels, wherein all micro-lenses of the first and second micro-lens arrays (12, 13) have an equal micro-lens focal length and pitch and the micro-lens arrays (12, 13) are arranged with a mutual distance equal to the micro-lens focal length, and a collecting Fourier lens (4) having a Fourier lens diameter and a Fourier lens focal length defining a Fourier lens front focal plane and a Fourier lens back focal plane, wherein the Fourier lens (14) is arranged for superimposing light from all imaging channels in the Fourier lens front focal plane and wherein the second micro-lens array (13) is arranged in the Fourier lens back focal plane, wherein a third micro-lens array (15) is arranged in the Fourier lens front focal plane for creating a wavelength independent array of illumination spots. Furthermore, a confocal microscope apparatus, which comprises the Koehler integrator device, and a method of using the confocal microscope apparatus are described.

A method for imaging a sample using a microscope having an illumination unit, an imaging lens system and an image sensor, includes: illuminating an area of the sample; imaging and magnifying the sample onto the image sensor and capturing the image using a predetermined number of pixels; providing a plurality of different comparison sample areas; for each comparison sample area, performing a reference measurement, wherein the comparison sample areas are illuminated, imaged and magnified onto the image sensor and captured with the predetermined number of image pixels as a reference image; determining a brightness-correction image with the predetermined number of image pixels by determining the value for each image pixel of the brightness-correction image from the values of allocated image pixels of the reference images, and correcting the image of the area of the sample captured based on the brightness-correction image and outputting it as a corrected image.

An apparatus for generating structured illumination images, comprising a housing; imaging optics mounted within the housing, the imaging optics configured to focus illumination from an illumination source such that an in-focus pattern of light corresponding to a pattern on a photomask is projected onto a sample; a reflector mounted within the housing and configured to reflect the illumination to a sample; a filter apparatus, comprising one or more filters mounted within the housing, the filter apparatus configured to allow only emissions from the illuminated sample to pass through to the sensor; and mounting features on the housing, the mounting features configured to allow the apparatus to be installed within an imaging system.