For checking the confocality of a scanning and descanning microscope assembly comprising a light source providing illumination light focused into a focal area in a focal plane, a detector detecting light coming out of the focal area and having a detection aperture to be arranged in a confocal fashion with respect to the focal area, and a scanner, an auxiliary detection aperture of an auxiliary detector arranged in the focal plane is scanned with the focal area of the illumination light to record a first comparison intensity distribution of the illumination light registered by the auxiliary detector, and the detection aperture of the detector is scanned with auxiliary light that exits out of an auxiliary emission aperture of an auxiliary light source concentrically arranged with respect to the auxiliary detection aperture in the focal plane to record a second comparison intensity distribution of the auxiliary light registered by the detector.

A system includes an imaging optical system that forms an optical image of an observed object; a control apparatus that switches between a superresolution observation mode and a normal observation mode; and a rotatable disk located at a position conjugate to a front focal position of the imaging optical system and having a plurality of apertures. The imaging optical system changes a projection magnification of an intermediate image that is a point image of a portion of the observed object that is formed on the disk. The control apparatus sets, during the superresolution observation mode, the projection magnification in a manner such that the intermediate image becomes at least twice as large as the apertures and sets, during the normal observation mode, the projection magnification in a manner such that the projection magnification becomes lower than the projection magnification in the superresolution observation mode.

A Raman analysing apparatus comprises an imaging optical system for imaging an object along an optical path to an optical detector, an irradiation optical system for illuminating the object, and a scanning device comprising a spinning pinhole disk. The irradiation optical system directs light onto the scanning device to illuminate the object at a plurality of illumination points. The imaging optical system images Raman scattered light emitted from the object at the illumination points to an intermediate image plane at which the scanning device is located. The imaging optical system may include a spectral filter and/or at least one optical spectral analyser. The apparatus enables high speed confocal Raman imaging and/or high speed confocal Raman spectography to be performed.

A method for scanning along a substantially straight line (3D line) lying at an arbitrary direction in a 3D space with a given speed uses a 3D laser scanning microscope having a first pair of acousto-optic deflectors deflecting a laser beam in the x-z plane (x axis deflectors) and a second pair of acousto-optic deflectors deflecting the laser beam in the y-z plane (y axis deflectors) for focusing the laser beam in 3D. Further, a method for scanning a region of interest uses a 3D laser scanning microscope having acousto-optic deflectors for focusing a laser beam within a 3D space defined by an optical axis (Z) of the microscope and X, Y axes that are perpendicular to the optical axis and to each other.

A confocal optical system includes a light source and a spinning polarizer disposed in the optical pathway such the light emitted from the light source passes through the spinning polarizer. A first objective lens is disposed in the optical pathway to allow passage of light that passes through the spinning polarizer. A microlens array member is disposed adjacent the first objective lens to receive light. The microlens array member includes a plate having a plurality of holes arranged in an array pattern. A second objective lens is disposed in the optical pathway to receive and allow passage of light to a sample. The optical pathway is arranged such that, after reaching the sample, the light is directed back through the second objective lens, the microlens or microlens with filter array, and the first objective lens and a fluorescent filter cube as an emission beam to reach at least one camera which provides an image of the sample.

A confocal microscope device for scanning a two-dimensional array of illumination beams over a target surface and scanning a corresponding two-dimensional array of emission beams stimulated by the array of illumination beams on to a sensor of an imaging device. The device comprises first scanning optics operable to scan the array of illumination beams over the target surface along a first axis and scan the array of emission beams over the sensor along the first axis. The device further comprises second scanning optics operable to deflect, on a second axis, the array of illumination beams as they are scanned over the target surface along the first axis, such that uneven stimulation of the target surface by the array of illumination beams due to interference of the illumination beams is reduced, and deflect, on the second axis, the array of emission beams as they are scanned over the sensor of the imaging device along the first axis such that uneven stimulation of the sensor by the array of emission beams due to interference of the emission beams is reduced.

Various embodiments (300, 400, 500) for a multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample are disclosed. The embodiments (300, 400, 500) of the multi-focal SIM system perform a focusing, scaling and summing operation on each generated multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.

Systems and methods to identify and/or reduce or eliminate sample motion artifacts are disclosed. Sample motion artifacts may be reduced or eliminated using scan patterns where an acquisition time difference between when perimeter pixels in adjacent tiles are acquired is reduced, as compared to a conventional raster scan to reduce or eliminate discontinuities that would otherwise appear at tile boundaries in an image. In some embodiments, test images acquired using relatively small test scan patterns or intensities of test points acquired at different times may be compared to determine whether sample motion has occurred. In some embodiments, intensity of adjacent pixels at a tile boundary are compared. In some embodiments, intensity of one or more single pixels is monitored over time to determine whether sample motion has occurred over a period of time. In some embodiments, a flattening or reshaping tool may be used to suppress sample motion during imaging.

A Raman analysing apparatus comprises an imaging optical system for imaging an object along an optical path to an optical detector, an irradiation optical system for illuminating the object, and a scanning device comprising a spinning pinhole disk. The irradiation optical system directs light onto the scanning device to illuminate the object at a plurality of illumination points. The imaging optical system images Raman scattered light emitted from the object at the illumination points to an intermediate image plane at which the scanning device is located. The imaging optical system may include a spectral filter and/or at least one optical spectral analyser. The apparatus enables high speed confocal Raman imaging and/or high speed confocal Raman spectography to be performed.

The present invention relates to a flying-over beam pattern scanning hologram microscope device using a spatial modulation scanner and a translation stage. The present invention provides a flying-over beam pattern scanning hologram microscope device comprising: a scan beam generation unit which converts of a first beam and a second beam to a first spherical wave, and then makes the first and the second spherical waves interfere with each other to form a scan beam; a scanning unit, which comprises a spatial modulation scanner for controlling the scan beam in the horizontal direction, and a translation stage for moving an object in the vertical direction at the rear end of the projection unit; the projection unit projecting the scan beam onto an object plane; and a light collection unit which detects a beam that has passed through the objective lens again after being reflected or fluoresced from the object.