Patent classifications
G02B21/0048
RE-SCAN MICROSCOPE SYSTEM AND METHOD
A re-scan microscope for forming an image of a sample is disclosed. The system comprises an illumination optical system for directing, and optionally focusing, illumination light at the sample herewith providing an illumination light spot at the sample. The illumination light spot causes emission light from the sample. The microscope system further comprises a detection optical system for focusing at least part of the emission light onto an imaging plane of an imaging system herewith causing an emission light spot on the imaging plane. The microscope system also comprises a rotatable element for, when rotating, moving the illumination light spot over and/or through the sample and simultaneously moving the emission light spot over said imaging plane of the imaging system. The rotatable element comprises at least two reflective surfaces.
Optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope, and laser scanning microscope
The invention relates to an optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope. The optical assembly according to the invention is characterized in that in addition to a first and a second focusing device, a third focusing device is provided in order to generate a third pupil plane which is optically conjugated to a first pupil plane, a third beam deflecting device is arranged on the third pupil plane in order to deflect the excitation radiation and/or manipulation radiation, a first beam deflecting means is provided between the second focusing device and the second pupil plane and the second pupil plane and the third focusing device in order to deflect the excitation radiation and/or manipulation radiation coming from the third focusing device while bypassing the second beam deflecting device in the direction of the second focusing device, a fourth focusing device is provided for generating a fourth pupil plane which is optically conjugated to the third pupil plane, and a variable second beam deflecting means is arranged on the fourth pupil plane in order to switch an optical beam path between a first beam path and a second beam path. The invention additionally relates to a laser scanning microscope.
Method of scanning a sample with a light beam focused by a microscope objective lens and scanning light microscope
Upstream a microscope objective lens, a polarization direction of a light beam is tilted with a first electro-optical deflector between a first polarization direction with which the light beam is deflected by a first polarization beam splitter by a first angle and a second polarization direction with which it is deflected by a second angle. With a second electro-optical deflector, the polarization direction of the light beam is tilted between a third polarization direction with which the light beam is deflected by a second polarization beam splitter by a third angle and a fourth polarization direction with which it is deflected by a fourth angle. By rotating the polarization direction of the light beam by means of the first and second electro-optical deflectors in a coordinated way the light beam is tilted about a fixed point in a pupil of the objective lens.
Varying an illumination path of a selective plane illumination microscopy
A system for illuminating a microscopy specimen includes an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen. The optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen. The optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes.
3-AXIS SIDE-VIEW CONFOCAL FLUORESCENCE ENDOMICROSCOPE
An optical probe assembly as a confocal endomicroscope includes an optical focusing stage that focuses an output beam onto a sample and a mirror scanning stage that is movable for scanning the output beam in both a lateral two dimensional plane and an axial direction, using a side-view configuration. The side-view configuration allows for output beam illumination and fluorescent imaging of the sample with greater imaging resolution and improved access to hard to reach tissue within a subject.
Optical super-resolution microscopic imaging system
The invention provides an optical super-resolution microscopic imaging system comprising a dichroic beamsplitter for annular parallel light to transmit through; a focusing lens used for converging the annular parallel light transmitted through the dichroic beamsplitter; a confocal pinhole for the annular parallel light after being converged to pass through to filter the annular parallel light; a varifocal lens system for collimating the annular parallel light passing through the confocal pinhole into excited annular parallel light; and a detector for receiving and processing fluorescence emitted by the excited sample, the fluorescence emitted by the excited sample being returned by the same way, and the dichroic beamsplitter separating the fluorescence emitted by the sample from an annular parallel light path and turning the fluorescence to the detector to obtain a super-resolution image of the sample.
LIGHT SHEET MICROSCOPE HAVING STREAMLINED FIELD OF VIEW CHANGES
A method for viewing a microscopy specimen is described. The method includes receiving a request to change a field of view of an optical microscope system that images the microscopy specimen. In response to the request, a current field of view is automatically changed to a new field of view. Parameters of the optical microscope system are automatically adjusted to align an illumination plane of a light sheet of the optical microscope system and a detection plane of the optical microscope system. The adjustment of parameters to align the illumination plane with the detection plane is based at least on precalibrated parameters that correspond to the new field of view, the illumination path objective, and the detection path objective.
Microscopy devices, methods and systems
A pulsed beam of NIR excitation light is projected into a sample at an oblique angle and scanned by a scanning element through a volume in the sample. 2-photon excitation excites fluorescence within the sample. The fluorescence is imaged onto an intermediate image plane that remains stationary regardless of the orientation of the scanning element. The image is captured by a linear array of light detecting elements or a linear portion of a rectangular array. At any given position of the scanning element, the linear array (or portion) images all depths simultaneously. A plurality of images are captured for each of a plurality of different orientations of the scanning element. The orientation of the scanning element is controlled to move in a two dimensional pattern, which causes the beam of excitation light to sweep out a three dimensional volume within the sample.
PULSE PICKING APPARATUSES AND METHODS FOR NONLINEAR OPTICAL MICROSCOPY
Embodiments of the present disclosure are disclosed for enhancing resolution for nonlinear optical microscopy. Embodiments include pulse picking using a modulator, such as an acousto-optic modulator, that is optionally controlled by a function generator or a frequency divider. Some embodiments spatially overlap two laser beams prior to the modulator, and still additional embodiments include separating the 1.sup.st diffraction order of the modulated laser output of the acousto-optic modulator and directing the 1.sup.st diffraction order to a microscope. Some embodiments chirp a spatially overlapped laser beam with one pulse rate to a spatially overlapped laser beam with a higher pulse rate, while still additional embodiments utilize a coherent Raman scattering microscope.
Broadband illumination tuning
A tunable filter may include an input focusing optic, an output focusing optic, a linearly-varying filter located at a back focal plane of the input focusing optic and a front focal plane of the output focusing optic, an input angular scanning component located at a front focal plane of the input focusing optic configured to receive an input beam, and an output angular scanning component located at a back focal plane of the output focusing optic. The input focusing optic may receive the input beam from the input angular scanning component and direct the input beam to the linearly-varying filter, where a position of the input beam on the linearly-varying filter is selectable based on an angle of the input angular scanning component. The output focusing optic may receive a filtered beam from the linearly-varying filter and direct the filtered beam to the output angular scanning component.