Patent classifications
G02B21/006
METHODS AND SYSTEMS FOR MULTIDIMENSIONAL IMAGING
A multi-depth confocal imaging system includes at least one light source configured to provide excitation beams and an objective lens. The excitation beams are focused into a sample at a first plurality of focus depths along an excitation direction through the objective lens. An image sensor receives emissions from the sample via the objective lens, wherein the emissions define foci relative to the image sensor at a second plurality of focus depths.
COHERENT ANTI-STOKES RAMAN SCATTERING MICROSCOPE IMAGING APPARATUS
A coherent anti-Stokes Raman scattering microscope imaging apparatus, comprising: a laser light source (21), a two-dimensional oscillating mirror assembly (22), a first light dichroic mirror plate (23), an objective lens (24), a sample translation platform (25), a collection device (26), and a data processing module; the laser light source (21) is used for producing a first laser beam and a second laser beam; the first laser beam and the second laser beam are coaxially emitted; the first laser beam and the second laser beam are incident on the two-dimensional oscillating mirror assembly (22), and the two-dimensional oscillating mirror assembly (22) adjusts the optical path of the first laser beam and the second laser beam; the first laser beam and the second laser beam leaving the two-dimensional oscillating mirror assembly pass in sequence through the first light dichroic mirror plate (23) and the objective lens (24); the objective lens (24) focuses the first laser beam and the second laser beam onto the sample translation platform; the signal light produced on the sample translation platform (25) passes through the objective lens (24), and the collection device (26) produces initial data on the basis of the signal light, and outputs the initial data to the data processing module; the need for beam splitting and wavelength adjustment of a single wavelength laser beam outputted by a laser is thereby avoided.
Methods and systems for single frame autofocusing based on color- multiplexed illumination
The present disclosure includes systems and methods for capture a whole slide image of a sample. In exemplary embodiments, a camera is configured to capture a digital image of a sample. The system captures a bright field image of the sample, and captures a digital image of the sample illuminated from a first incident angle at a first wavelength and a second incident angle at a second wavelength. The system can determine whether the sample is defocused based on the transitional shift between a first wavelength channel and a second wavelength channel of the captured digital image. The system can determine the defocus distance based on the transitional shift and autofocus using the defocus distance such the bright field image is in focus.
3D target for optical system characterization
An imaging target for characterization of an optical system has a structure, formed on a substrate, wherein the structure has a base level and has one or more staging surfaces spaced apart from the base level and disposed over a range of distances from the base level; and one or more localized light sources disposed along the one or more staging surfaces of the structure and configured to direct light through or from the structure.
REAL-TIME FOCUSING IN LINE SCAN IMAGING
Systems and methods for capturing a digital image of a slide using an imaging line sensor and a focusing line sensor. In an embodiment, a beam-splitter is optically coupled to an objective lens and configured to receive one or more images of a portion of a sample through the objective lens. The beam-splitter simultaneously provides a first portion of the one or more images to the focusing sensor and a second portion of the one or more images to the imaging sensor. A processor controls the stage and/or objective lens such that each portion of the one or more images is received by the focusing sensor prior to it being received by the imaging sensor. In this manner, a focus of the objective lens can be controlled using data received from the focusing sensor prior to capturing an image of a portion of the sample using the imaging sensor.
SYSTEMS AND METHODS FOR CONFOCAL MICROSCOPY
A confocal microscope system includes a light source configured to form a light beam, a scanning unit, and an objective lens. The scanning unit is in the form of a mechanically driven scanning unit with a controllable scanning trajectory, and is configured to direct the light beam through the scanning trajectory. The objective lens defines a pupil plane and a focal plane. The light beam is directed from the scanning unit to the objective lens. The confocal microscope system is configured for multi-color line-scanning confocal microscopy, and implements multi-color fluorescence imaging without laser excitation crosstalk.
IMAGE CAPTURE SYSTEM
The positional deviation of an imaging target due to the switching of image capture methods is suppressed. An image capture system includes a first image capture apparatus of an optical interference type and a second image capture apparatus of an optical sheet microscope type, wherein the first image capture apparatus includes a light source unit provided so as to be shared by the second image capture apparatus, a light concentrating unit provided so as to be shared by the second image capture apparatus, a reflecting unit, a branching unit, a synthesizing unit, a first detection unit configured to detect a spectral distribution of a synthetic light, and a calculation unit configured to calculate a boundary surface position in the imaging target, and the second image capture apparatus includes the light source unit, the light concentrating unit, and a second detection unit configured to detect fluorescence.
LASER SCANNING MICROSCOPE AND METHOD FOR ADJUSTING A LASER SCANNING MICROSCOPE
A laser scanning microscope and method for adjusting a laser scanning microscope. The microscope has an optical system which has a light guiding fiber between the first light source and the third beam deflection unit and has no light guiding fibers between the second light source and the third beam deflection unit. In this way, the second light source can be used as an adjustment reference for the first and second beam deflection units. The adjustment can be implemented using test images recorded by means of the third and fourth beam deflection units; additional sensors or internal calibration samples are not required.
SCANNING INFRARED MEASUREMENT SYSTEM
An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.
SLIT LAMP MICROSCOPE
A slit lamp microscope according to some aspect examples includes an illumination system and photographing system. The illumination system projects slit light onto an anterior segment of a subject's eye. The photographing system includes an optical system and an image sensor. The optical system directs light from the anterior segment onto which the slit light is being projected. The image sensor includes a light detecting surface that receives the light directed by the optical system. Further, a subject plane, a principal plane of the optical system, and the light detecting surface are arranged so as to satisfy a Scheimpflug condition. Here, the subject plane includes a focal point of the illumination system in which a position of the focal point is shifted on account of a refractive index of a tissue of the anterior segment.