A method for inspecting a medical container made of a light transmissive material. The method includes scanning a portion of the medical container to be inspected, by a white light emitted from a confocal chromatic system; detecting light reflected by the portion of the medical container by the confocal chromatic system; and determining whether a particle is present or not in or on the said portion of the medical container, based on a detection result obtained by the confocal chromatic system.

A spectral imaging device (1312) for capturing one or more, two-dimensional, spectral images (1313A) of a sample (1310) including (i) an image sensor (1328), (ii) an illumination source (1314), (iii) a beam path adjuster (1362), and (iv) a control system (1330). The illumination source (1314) that generates an illumination beam (1316) that is directed along an incident sample beam path (1360) at the sample (1310). The beam path adjuster (1362) selectively adjusts the incident sample beam path (1360). The control system (1330) controls (i) the illumination source (1314) to generate the illumination beam during the first capture time, (ii) the image sensor (1328) during the first capture time to capture first information for the first spectral image (1313A), and (iii) the beam path adjuster (1362) to selectively adjust the incident sample beam path (1360) relative to the sample (1310) during the first capture time while the image sensor (1328) is accumulating the information for the first spectral image (1313A).

An IR microscope includes an IR light source/interferometer (1) generating a collimated IR beam (26), an effectively beam-limiting element (8) in a stop plane (27), a sample position (15), a detector (19) having an IR sensor (19a), a detector stop (19b), a first optical device focusing the collimated IR beam onto the sample position, and a second optical device imaging the sample position onto the IR sensor. The effectively beam-limiting element is situated in the collimated IR beam. The first and second optical devices image the detector stop opening into an input beam plane. For the area A1 of the image of the detector stop opening in the input beam plane and the area A2 of the cross section of the collimated IR beam in the input beam plane: 0<A1/A2≤1. Thereby, only collimated IR radiation is picked up, while vignetting and stray radiation are avoided.

Disclosed herein, inter alia, are methods and systems of image analysis useful for rapidly identifying and/or quantifying features.

A multi-focal light-sheet structured illumination system that can be implemented as a part of a commercial fluorescence microscope or a module that is adaptable to fit a number of commercially available microscopes. The system provides simultaneous capture of 2D images from multiple planes within a 3D volume, which are resolved laterally and axially to provide improved resolution along the three dimensions (x,y,z). A Wollaston prism allows several axially-localized high-contrast structured illumination patterns to be generated.

In a measurement of a microscope image, a measurement can be conducted with high accuracy when measuring a measuring object including a step having a depth larger than a depth of focus or comparing patterns at different positions along the optical axis of a microscope. A microscope image measuring device includes: a microscope for obtaining a magnified image of a surface of a measuring object by irradiating the surface with white incident light; a spectral camera for obtaining a spectral image of the magnified image; and an image processing part for extracting the spectral image at each wavelength and performs an image measuring process. The microscope forms an image of a different focal position at each wavelength on the imaging surface of the spectral camera, and the image processing part extracts a spectral image with a wavelength where a measuring point has the highest contrast, and performs edge detection.

A confocal microscope is provided that includes one or more lasers focused by an optical system into a line on the surface of a sample mounted to a stage. The microscope further includes, at least one linear array detector that is optically conjugated to the focused line. The stage permits movement of the sample with respect to all other components of the microscope, which remain stationary.

Disclosed herein, inter alia, are methods and systems of image analysis useful for rapidly identifying and/or quantifying features.

Disclosed herein, inter alia, are methods and systems of image analysis useful for rapidly identifying and/or quantifying features.

One embodiment provides an apparatus for facilitating raster scanning of an optical spectrometer. The apparatus can include an enclosure, a lens holder situated within the enclosure, and an actuation mechanism coupled to the lens holder. The lens holder is configured to hold a lens that focuses excitation light onto a sample surface, and the actuation mechanism is configured to cause the lens holder to perform a motion according to a predetermined pattern, thereby causing the focused excitation light to raster scan the sample surface.