Patent classifications
G02B21/0068
CONFOCAL OPTICAL SYSTEM AND COMPONENTS THEREOF
A confocal optical system includes a light source and a spinning polarizer disposed in the optical pathway such the light emitted from the light source passes through the spinning polarizer. A first objective lens is disposed in the optical pathway to allow passage of light that passes through the spinning polarizer. A microlens array member is disposed adjacent the first objective lens to receive light. The microlens array member includes a plate having a plurality of holes arranged in an array pattern. A second objective lens is disposed in the optical pathway to receive and allow passage of light to a sample. The optical pathway is arranged such that, after reaching the sample, the light is directed back through the second objective lens, the microlens or microlens with filter array, and the first objective lens and a fluorescent filter cube as an emission beam to reach at least one camera which provides an image of the sample.
Oblique Plane Microscope for Imaging a Sample
An oblique plane microscope has an objective illuminating a plane of the sample and collecting detection light. A beam splitting system splits the collected detection light into two detection light bundles along two optical paths, respectively. A first intermediate imaging system generates a first intermediate image of the plane in a first intermediate image space. The first intermediate imaging system has a first objective and a first reflecting element in the first intermediate image space and reflecting the first detection light bundle into the first objective. A second intermediate imaging system generates a second intermediate image of the plane in a second intermediate image space. The second intermediate imaging system has a second objective and a second reflecting element positioned in the second intermediate image space and reflecting the second detection light bundle into the second objective. A detection system detects the detection light bundles reflected into the objectives.
OPTICAL MICROSCOPE DEVICE AND OPTICAL MICROSCOPE SYSTEM
An optical microscope device (10) according to the present disclosure includes: a first illumination optical system (13A) including a light source (101) that emits illumination light for illuminating a specimen including biomaterials changing their functions in response to light, an LCOS spatial light modulation element (113) that controls a polarization state of the illumination light, a first illumination optical member that uniformly illuminates the LCOS spatial light modulation element, and a polarization optical element that controls a transmission state of the illumination light directed to the specimen from the LCOS spatial light modulation element in response to the polarization state of the illumination light; a second illumination optical system (13B) including a second illumination optical member that images a light flux from the first illumination optical system (13A) on a specimen surface; and an imaging optical system (13C) for imaging the specimen surface, the imaging optical including an imaging optical member and an imaging element (127).
BROADBAND ILLUMINATION TUNING
A tunable filter may include an input focusing optic, an output focusing optic, a linearly-varying filter located at a back focal plane of the input focusing optic and a front focal plane of the output focusing optic, an input angular scanning component located at a front focal plane of the input focusing optic configured to receive an input beam, and an output angular scanning component located at a back focal plane of the output focusing optic. The input focusing optic may receive the input beam from the input angular scanning component and direct the input beam to the linearly-varying filter, where a position of the input beam on the linearly-varying filter is selectable based on an angle of the input angular scanning component. The output focusing optic may receive a filtered beam from the linearly-varying filter and direct the filtered beam to the output angular scanning component.
SYSTEMS AND METHODS FOR IMAGING A SAMPLE
A method for imaging a sample, wherein the sample changes a polarization state of light as a function of position, wherein the method includes changing a polarization state of a purely polarized light of an incident light striking a micro-retarder array, thereby inducing a changed polarization state of the polarization state. The micro-retarder array is placed in a rear conjugate focal plane of a microscope. The method additionally includes projecting the changed polarization state of the polarization state into an object plane of the microscope containing the sample.
Systems and methods for imaging a sample
A method for imaging a sample, wherein the sample changes a polarization state of light as a function of position, wherein the method includes changing a polarization state of a purely polarized light of an incident light striking a micro-retarder array, thereby inducing a changed polarization state of the polarization state. The micro-retarder array is placed in a rear conjugate focal plane of a microscope. The method additionally includes projecting the changed polarization state of the polarization state into an object plane of the microscope containing the sample.
OPTICAL ASSEMBLY FOR SCANNING EXCITATION RADIATION AND/OR MANIPULATION RADIATION IN A LASER SCANNING MICROSCOPE, AND LASER SCANNING MISCROSCOPE
The invention relates to an optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope. The optical assembly according to the invention is characterized in that in addition to a first and a second focusing device, a third focusing device is provided in order to generate a third pupil plane which is optically conjugated to a first pupil plane, a third beam deflecting device is arranged on the third pupil plane in order to deflect the excitation radiation and/or manipulation radiation, a first beam deflecting means is provided between the second focusing device and the second pupil plane and the second pupil plane and the third focusing device in order to deflect the excitation radiation and/or manipulation radiation coming from the third focusing device while bypassing the second beam deflecting device in the direction of the second focusing device, a fourth focusing device is provided for generating a fourth pupil plane which is optically conjugated to the third pupil plane, and a variable second beam deflecting means is arranged on the fourth pupil plane in order to switch an optical beam path between a first beam path and a second beam path. The invention additionally relates to a laser scanning microscope.
Device and method for capturing images
A device for recording images is provided, an image-recording device and an illumination device being arranged on the same side of a specimen plane in said device. The image-recording device has illumination portions, for example individual light sources, which are actuatable independently of one another in order to be able to illuminate a specimen in the specimen plane at different angles and/or from different directions. In this way, it is possible to record a plurality of images with different illuminations, which can be combined to form a results image with improved properties.
METHOD FOR IMAGING A SAMPLE BY MEANS OF A LIGHT-SHEET MICROSCOPE
A method for imaging a sample using a light-sheet microscope includes illuminating the sample from two different illumination directions using two light sheets, which have different polarization states and are superimposed on one another in a coplanar manner in a target region of the sample. An image of the illuminated target region is generated using an imaging optical unit of the light-sheet microscope. An interference pattern is generated using the two light sheets in the illuminated target region, whereby an image modulation corresponding to the interference pattern is applied to the image of the target region. The image modulation is evaluated. The illuminated target region is aligned in dependence on the evaluated image modulation in relation to a focal region of the imaging optical unit.
Stimulated emission depletion nonlinear structured illumination microscopy (STED-NSIM) apparatus, methods, and applications
A superresolution STED-NSIM apparatus having an epifluorescence architecture utilizing a 2D structured STED pattern having a N.A. less than a N.A. of the microscope objective and no surface plasmon resonance (SPR) effects. A superresolution STED-NSIM imaging method using a fully deterministic imaging processing method, in which a pre-calibrated set of parameters are used to process all image data.