The invention relates to a beam manipulation device for a scanning microscope, comprising a main colour splitter for coupling excitation light into an illumination beam path and for separating excitation light from detection light of a detection beam path, said device comprising a scanner, preferably positioned on a pupil plane, for scanning the excitation light. The device is characterised in that: an additional optical section is provided comprising optical elements which influence a beam path; at least one pupil plane and/or at least one intermediate image plane is formed in the additional optical section by the optical elements which influence the beam path; and an adjustable selection device is provided for activating either a first beam segment of the illumination and/or detection beam path, or the additional optical section, wherein the first beam segment of the illumination and/or detection beam path does not contain a pupil plane of the illumination and/or detection beam path.

A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.

Implementing swept, confocally aligned planar excitation (SCAPE) imaging with asymmetric magnification in the detection arm provides a number of significant advantages. In some preferred embodiments, the asymmetric magnification is achieved using cylindrical lenses in the detection arm that are oriented to increase the magnification of the intermediate image in the width direction but not in the depth direction. SCAPE imaging may also be improved by using an SLM to modify a characteristic of the sheet of excitation light that is projected into the sample. Additional embodiments include a customized version of SCAPE that is optimized for imaging the retina at the back of an eyeball in living subjects.

The invention relates to an optical measurement method and to an optical measurement device for determining the spatial or spatiotemporal distribution of a sample, the sample comprising at least one retransmission source, said at least one retransmission source retransmitting light depending on the projected light, according to a predetermined law, onto the sample, the method comprising: the projection onto the sample of at least two compact light distributions belonging to different topological families, which propagate along the same optical path, the detection of the light retransmitted by said at least one retransmission source of the sample; the generation of at least one optical image from the detected light; and the algorithmic analysis of the optical images for obtaining location data on said at least one retransmission source.

An information processing device comprises: an image processor which generates surface information from point cloud data generated on the basis of position information of an object, using a value of a first parameter and a value of a second parameter; and a display controller which causes a display to display a surface image on the basis of the generated surface information, wherein the image processor generates a plurality of pieces of surface information, using a plurality of values of the first parameter and a plurality of values of the second parameter, and the display controller causes the display to display a plurality of surface images on the basis of the plurality of pieces of generated surface information.

A microscopy high-resolution scanning method, including exciting a sample with illumination radiation focused at a point to form a diffraction-limited illumination spot so as to emit fluorescence radiation. The point is imaged in a diffraction image on a spatially resolving two-dimensional detector. The sample is scanned at scanning positions with increments that are smaller than half the diameter of the spot. An image of the sample with a resolution increased beyond a resolution limit of the image is generated from the data of the two-dimensional detector and the scanning positions. To discriminate between at least two predetermined wavelength ranges in the fluorescence radiation of the sample, Airy disks corresponding to the wavelength ranges are generated on the two-dimensional detector, the Airy disks being offset laterally from one another such that the diffraction image consists of the mutually offset Airy disks. The Airy disks are evaluated when generating the sample image.

An optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous object on a sample. A sequence of at least two compact luminous distributions of different topological families is projected onto the sample, and light re-emitted by the at least one luminous object is detected. At least one optical image is generated for each luminous distribution on the basis of the light detected. The optical images are analyzed to obtain spatiotemporal information regarding the light re-emitted by the at least one luminous object, or location of the at least one luminous object.

A light-scanning microscope including a scan optics for generating a pupil plane conjugate to the pupil plane of the microscope objective, and a variably adjustable beam deflection unit in the conjugate pupil plane. An intermediate image lies between the microscope objective and the scan optics. The scan optics image a second intermediate image (Zb2) into the first intermediate image via the beam deflection unit, wherein the second intermediate image is spatially curved. The deflection unit is not arranged in a collimated section of the beam path, but is instead arranged in a convergent section. Then, in terms of the optical properties and quality thereof, the scan optics needs rather to correspond merely to an eyepiece instead of a conventional scanner objective.

A microscope apparatus includes SLMs each having a modulation plane, an objective lens disposed on an optical path between the modulation plane and an object, and a computer for controlling the SLMs on the basis of a modulation pattern including a correction pattern for correcting aberration caused by a refractive index interface of the object. The computer determines a position of the correction pattern in the modulation pattern on the basis of inclination information of the refractive index interface with respect to a plane perpendicular to an optical axis of the objective lens.

This disclosure is directed to optical microscope calibration devices that can be used with optical microscopes to adjust the microscope imaging parameters so that images of samples can be obtained below the diffraction limit. The microscope calibration devices include at least one calibration target. Each calibration target includes a number of features with dimensions below the diffraction limit of a microscope objective. Separate color component diffraction limited images of one of the calibration targets are obtained for a particular magnification. The color component images can be combined and image processed to obtain a focused and non-distorted image of the calibration target. The parameters used to obtain the focused and non-distorted image of the calibration target can be used to obtain focused and non-distorted images of a sample for the same magnification by using the same parameters.