Patent classifications
G06F11/076
MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME
A memory system and a data processing system including the memory system may manage a plurality of memory devices. For example, the data processing system may categorize and analyze error information from the memory devices, acquire characteristic data from the memory devices and set operation modes of the memory devices based on the characteristic data, allocate the memory devices to a host workload, detect a defective memory device among the memory devices and efficiently recover the defective memory device.
Machine learning-based techniques for providing focus to problematic compute resources represented via a dependency graph
Methods, systems, apparatuses, and computer-readable storage mediums are described for machine learning-based techniques for reducing the visual complexity of a dependency graph that is representative of an application or service. For example, the dependency graph is generated that comprises a plurality of nodes and edges. Each node represents a compute resource (e.g., a microservice) of the application or service. Each edge represents a dependency between nodes coupled thereto. A machine learning-based classification model analyzes each of the nodes to determine a likelihood that each of the nodes is a problematic compute resource. For instance, the classification model may output a score indicative of the likelihood that a particular compute resource is problematic. The nodes and/or edges having a score that exceed a predetermined threshold are provided focus via the dependency graph.
Access consistency in high-availability databases
Techniques are disclosed relating to maintaining a high availability (HA) database. In some embodiments, a computer system receives, from a plurality of host computers, a plurality of requests to access data stored in a database implemented using a plurality of clusters. In some embodiments, the computer system responds to the plurality of requests by accessing data stored in an active cluster. The computer system may then determine, based on the responding, health information for ones of the plurality of clusters, wherein the health information is generated based on real-time traffic for the database. In some embodiments, the computer system determines, based on the health information, whether to switch from accessing the active cluster to accessing a backup cluster. In some embodiments, the computer system stores, in respective clusters of the database, a changeover decision generated based on the determining.
Charge loss scan operation management in memory devices
A memory system includes a memory device and a processing device, operatively coupled to the memory device. The processing device performs operations comprising: identifying an operating temperature of the memory device; determining that the operating temperature satisfies a temperature condition; modifying a scan frequency parameter for performing a scan operation on representative blocks of a set of blocks in the memory device; and performing the scan operation at a frequency identified by the scan frequency parameter.
Method, electronic device, and computer product for storage management
Techniques for storage management involve: obtaining information indicating an error of a storage device of a data storage system; if the number of occurrences of the error within a predetermined time period exceeds a predetermined threshold, stopping obtaining the information indicating the error; and generating an event indicating whether the number of occurrences of the error within the predetermined time period exceeds the predetermined threshold for further diagnosis of the error. As a result, errors from the storage device can be automatically managed, which helps to improve the data storage system's capacity to handle different types of errors of the storage device.
METHOD OF OPERATING MEMORY DEVICE, METHOD OF OPERATING MEMORY CONTROLLER AND MEMORY SYSTEM
A method of operating a memory device is provided. The method includes: receiving a first command from a controller; activating a page of a memory cell array based on the first command; reading data of the activated page; detecting an error from the read data; correcting the detected error to generate error correction data; writing back the error correction data to the activated page in based on the detected error being a single-bit error; and blocking write-back of the error correction data to the activated page based on the detected error being a multi-bit error.
Dynamic memory programming voltage step for strenuous device conditions
A memory device can dynamically select a voltage step size for programming (i.e., charging) memory cells. The memory device can increase the voltage step size to reduce programming time or decrease the voltage step size to reduce errors. The memory device can identify device conditions, such as temperature or amount of use (e.g., a count of program/erase cycles). The memory device can increase the voltage step size when the device conditions are less likely to cause errors (e.g., in a middle temperature range or below a threshold number of program/erase cycles) or can decrease the voltage step size when the device conditions are more likely to cause errors (e.g., in a high or low temperature range or above a threshold number of program/erase cycles).
ERROR EVALUATION FOR A MEMORY SYSTEM
Methods, systems, and devices for error evaluation for a memory system are described. A memory device may be configured to monitor access errors of the memory device to evaluate a likelihood that such errors are related to a failure of the memory device itself or to a failure outside the memory device. For example, a memory device may monitor a respective quantity of errors for each of a set of banks and, if the memory device detects that multiple banks are associated with a threshold quantity of access errors, the memory device may infer the presence of a failure outside the memory device. The memory device may store an indication of such a detection, which may be used to support failure diagnosis or resolution efforts, such as refraining from replacing a memory device when access errors are more likely to be the result of a system failure.
COMPENSATING FOR SIGNAL LOSS AT A PRINTED CIRCUIT BOARD
Compensating for signal loss, including determining a first expected loss at a first frequency and a second expected loss at a second frequency at a receiver associated with a first lane of a PCB; calculating an expected rate of change of signal loss between the first and the second frequencies based on the first and the second expected losses; calculating a first measured loss of a first signal transmitted at the first frequency and a second measured loss of a second signal transmitted at the second frequency from a transmitter to the receiver along the first lane of the PCB; calculating a measured rate of change of signal loss between the first and second frequencies based on the first and the second measured losses; comparing the measured rate of change with the expected rate of change; compensating a gain of a signal transmitted from the transmitter to the receiver.
METHOD AND SYSTEM FOR PROACTIVELY RESOLVING APPLICATION UPGRADE ISSUES USING A DEVICE EMULATION SYSTEM OF A CUSTOMER ENVIRONMENT
A method for managing a client environment includes obtaining, by a remediation orchestrator, a remediation request associated with a failed application upgrade on an emulation of a client device; in response to the remediation request: obtaining a remediation policy associated with the application upgrade; obtaining application upgrade information associated with the application upgrade; identifying remediation steps to service the remediation request using the application upgrade information and the remediation policy; and initiating performance of the application upgrade and the remediation steps on the client device.