An apparatus comprises a memory and a controller. The memory generally comprises a plurality of memory modules, each having a size less than a total size of the memory and configured to store data. The controller may be configured to process a plurality of read/write operations, classify data pages from multiple blocks of the memory as hot-read data or non hot-read data, and aggregate the hot-read data by selecting one or more of the hot-read data pages from multiple memory blocks and mapping the selected hot-read data pages to dedicated hot-read data blocks using a strong type of error correcting code during one or more of a garbage collection state, a data recycling state, or an idle state. The aggregation of the hot-read data pages and use of the strong type of error correcting code reduces read latency of the hot-read data pages, reduces a frequency of data recycling of the hot-read data pages, and reduces an impact of read disturbs on endurance of the memory.

Writing time is shortened even in a memory writing time for each access unit is not constant. A writing time prediction information holding unit holds writing time prediction information for predicting the writing time in a plurality of memory modules for each of a plurality of memory modules. A request selecting unit preferentially selects a write request of which longer writing time is predicted out of a plurality of write requests requiring writing in each of a plurality of memory modules on the basis of the writing time prediction information.

Disclosed embodiments include an electronic device having a write-once memory (WOM) and a memory controller. The memory controller includes a host interface receiving a data word including first and second symbols, each having at least two bits, a WOM controller that encodes the first and second symbols and outputs a WOM-encoded word including first and second WOM codes corresponding to the first and second symbols, respectively, an error correction code (ECC) controller that encodes the WOM-encoded word and outputs an ECC-encoded word including the first and second WOM codes and a first set of ECC bits corresponding to a first write operation, and a memory device interface that writes the ECC-encoded word the WOM device in the first write operation. Each of the first and second WOM codes include at least three bits with at least two of the at least three bits having the same logic value.

A decoding method, a memory storage device, and a memory control circuit unit are provided. The decoding method includes: reading a codeword from a memory module and estimating error level information of the codeword; inputting the codeword and the error level information to an error checking and correcting circuit through a first message channel and a second message channel respectively; determining whether the error level information meets a default condition; if yes, inputting the codeword to a first decoding engine of the error checking and correcting circuit for decoding; otherwise, inputting the codeword to a second decoding engine of the error checking and correcting circuit for decoding, wherein a power consumption of the first decoding engine is lower than that of the second decoding engine, and a decoding success rate of the first decoding engine is lower than that of the second decoding engine. Therefore, an operating flexibility for decoding may be improved.

A memory system may be provided. The memory system may include a memory apparatus including a plurality of memory cells. The memory system may include and a controller configured to control a write operation and a read operation with respect to the memory apparatus, detect an error occurrence position by performing the write operation and the read operation on a corresponding region of the memory apparatus in which an error occurs based on error occurrence address information generated in the read operation while changing a level of data to be written, and determine a type of error based on the detected error occurrence position.

A system, and corresponding method, is described for updating or calculating ECC where the transaction volume is significantly reduced from a read-modify-write to a write, which is more efficient and reduces demand on the data access bandwidth. The invention can be implemented in any chip, system, method, or HDL code that perform protection schemes and require ECC calculation, of any kind. Embodiments of the invention enable IPs that use different protections schemes to reduce power consumption and reduce bandwidth access to more efficiently communicate or exchange information.

A determination that a first programming operation has been performed on a particular memory cell can be made. A determination can be made, based on one or more threshold criteria, whether the particular memory cell has transitioned from a state associated with a decreased error rate to another state associated with an increased error rate. In response to determining that the particular memory cell has transitioned from the state associated with the decreased error rate to the another state associated with the increased error rate, an operation can be performed on the particular memory cell to transition the particular memory cell from the another state associated with the increased error rate to the state associated with the decreased error rate.

Methods, systems, and apparatus for error correction with syndrome computation in a memory device are described. A first syndrome for first encoded data is generated in a memory device. The first syndrome and the first encoded data are transmitted to a controller that is coupled with the memory device. A second syndrome for first and second encoded data is generated. The first encoded data and the second encoded data are interrelated according to an error correction code. The second syndrome is transmitted to the controller without the second encoded data and the controller is to decode the first encoded data based on at least one of the first syndrome, the second syndrome, or a combination thereof.

Methods, systems, and devices for operating memory cell(s) using a direct-input column redundancy scheme are described. A device that has read data from data planes may replace data from one of the planes with redundancy data from a data plane storing redundancy data. The device may then provide the redundancy data to an error correction circuit coupled with the data plane that stored the redundancy data. An output of the error correction circuit may be used to generate syndrome bits, which may be decoded by a syndrome decoder. The syndrome decoder may indicate whether a bit of the data should be corrected by selectively reacting to inputs based on the type of data to be corrected. For example, the syndrome decoder may react to a first set of inputs if the data bit to be corrected is a regular data bit, and react to a second set of inputs if the data bit to be corrected is a redundant data bit.

A memory controller includes a memory channel controller adapted to receive memory access requests and dispatch associated commands addressable in a system memory address space to a non-volatile storage class memory (SCM) module. The non-volatile error reporting circuit identifies error conditions associated with the non-volatile SCM module and maps the error conditions from a first number of possible error conditions associated with the non-volatile SCM module to a second, smaller number of virtual error types for reporting to an error monitoring module of a host operating system, the mapping based at least on a classification that the error condition will or will not have a deleterious effect on an executable process running on the host operating system.