This disclosure provides for improvements in managing multi-drive, multi-die or multi-plane NAND flash memory. In one embodiment, the host directly assigns physical addresses and performs logical-to-physical address translation in a manner that reduces or eliminates the need for a memory controller to handle these functions, and initiates functions such as wear leveling in a manner that avoids competition with host data accesses. A memory controller optionally educates the host on array composition, capabilities and addressing restrictions. Host software can therefore interleave write and read requests across dies in a manner unencumbered by memory controller address translation. For multi-plane designs, the host writes related data in a manner consistent with multi-plane device addressing limitations. The host is therefore able to “plan ahead” in a manner supporting host issuance of true multi-plane read commands.

Writing time is shortened even in a memory writing time for each access unit is not constant. A writing time prediction information holding unit holds writing time prediction information for predicting the writing time in a plurality of memory modules for each of a plurality of memory modules. A request selecting unit preferentially selects a write request of which longer writing time is predicted out of a plurality of write requests requiring writing in each of a plurality of memory modules on the basis of the writing time prediction information.

A data storage device utilized for storing a plurality of data includes a memory and a controller. The memory includes a plurality of blocks, and each of the blocks includes a plurality of physical pages. The controller is coupled to the memory. When the data storage device is initiated, or when the data size read by a host is greater than a threshold value, the controller inspects the status of the data stored by the physical pages of the memory.

A decoding method, a memory storage device, and a memory control circuit unit are provided. The decoding method includes: reading a codeword from a memory module and estimating error level information of the codeword; inputting the codeword and the error level information to an error checking and correcting circuit through a first message channel and a second message channel respectively; determining whether the error level information meets a default condition; if yes, inputting the codeword to a first decoding engine of the error checking and correcting circuit for decoding; otherwise, inputting the codeword to a second decoding engine of the error checking and correcting circuit for decoding, wherein a power consumption of the first decoding engine is lower than that of the second decoding engine, and a decoding success rate of the first decoding engine is lower than that of the second decoding engine. Therefore, an operating flexibility for decoding may be improved.

A die read counter and a block read counter are maintained for a specified block of a memory device. An estimated number of read events associated with the specified block is determined based on a value of the block read counter and a value of the die read counter. Responsive to determining that the estimated number of read events satisfies a criterion, a media management operation of one or more pages associated with the specified block is performed.

A data storage device utilized for storing a plurality of data includes a memory and a controller. The memory includes a plurality of blocks, and each of the blocks includes a plurality of physical pages. The controller is coupled to the memory and maps the logical pages to the physical pages of the memory. When the controller detects that a first logical page of the logical pages is a currently-used logical page, it detects whether or not the second logical page which belongs to the last logical page of the first logical page is a currently-used logical page in order to find what is truly the last currently-used logical page.

System and methods are disclosed including a plurality of memory devices and a processing device, operatively coupled with the plurality of memory devices, to perform operations comprising: receiving, from a host system, encrypted write data appended with error-checking data; determining whether the encrypted write data contains an error based on the error-checking data; and responsive to determining that the encrypted write data contains an error, notifying the host system that the encrypted write data contains an error.

Methods, systems, and devices for operating memory cell(s) using a direct-input column redundancy scheme are described. A device that has read data from data planes may replace data from one of the planes with redundancy data from a data plane storing redundancy data. The device may then provide the redundancy data to an error correction circuit coupled with the data plane that stored the redundancy data. An output of the error correction circuit may be used to generate syndrome bits, which may be decoded by a syndrome decoder. The syndrome decoder may indicate whether a bit of the data should be corrected by selectively reacting to inputs based on the type of data to be corrected. For example, the syndrome decoder may react to a first set of inputs if the data bit to be corrected is a regular data bit, and react to a second set of inputs if the data bit to be corrected is a redundant data bit.

A memory system includes a nonvolatile memory which comprises a plurality of memory cells capable of storing 4-bit data represented by first to fourth bits by sixteen threshold regions, and a memory controller configured to cause the nonvolatile memory to execute a first program for writing data of the first bit, the second bit, and the fourth bit and then causes the nonvolatile memory to execute a second program for writing data of the third bit. In fifteen boundaries existing between adjacent threshold regions among the first to sixteenth threshold regions, a maximum value of the number of first boundaries used for determining a value of the data of the first bit, the number of second boundaries used for determining a value of the data of the second bit, the number of third boundaries used for determining a value of the data of the third bit.

A semiconductor device includes an error correction code circuit and a register circuit. The error correction code circuit is configured to generate first data according to second data. The register circuit is configured to generate reset information according to a difference between the first data and the second data, for adjusting a memory cell associated with the second data. A method is also disclosed herein.