An apparatus includes a memory sub-system comprising a plurality of memory blocks and a memory block defect detection component. The memory block defect detection component is to set, for a memory block among the plurality of memory blocks, a first block defect detection rate and determine whether the first block defect detection rate is greater than a threshold block defect detection rate for the at least one memory block. In response to a determination that the first block defect detection rate is greater than the threshold block defect detection rate for the memory block, the memory block defect detection component is to assert a program command on the memory block determine whether a program operation associated with assertion of the program command on the at least one memory block is successful. In response to a determination the program operation is unsuccessful, the memory block defect detection component is to determine that a failure involving a plane associated with the memory block and another plane of the memory sub-system has occurred.

An example apparatus according to an aspect of the present disclosure includes an address scrambler circuit including a sub-wordline scrambler circuit configured to receive a first subset of bits of a row hammer hit address. The sub-wordline scrambler circuit is configured to perform a first set of logical operations on the first subset of bits to provide a second subset of bits, and to perform a second set of logical operations on the first subset of bits and the second subset of bits to provide a third subset of bits of an row hammer refresh address.

Apparatuses and methods for distributing row hammer refresh events across a memory device is disclosed. In one embodiment, the present disclosure is directed to an apparatus that includes a first memory configured to receive a sequential series of refresh commands and to replace a first of the sequential refresh commands with a row hammer refresh operation once during a refresh steal cycle, a second memory configured to receive the sequential series of refresh commands at to replace a second of the sequential refresh command with a row hammer refresh operation once during a refresh steal cycle, wherein the first of the sequential refresh commands and the second of the sequential refresh commands are different commands.

Systems, apparatuses, and methods for performing efficient memory accesses for a computing system are disclosed. In various embodiments, a computing system includes a computing resource and a memory controller coupled to a memory device. The computing resource selectively generates a hint that includes a target address of a memory request generated by the processor. The hint is sent outside the primary communication fabric to the memory controller. The hint conditionally triggers a data access in the memory device. When no page in a bank targeted by the hint is open, the memory controller processes the hint by opening a target page of the hint without retrieving data. The memory controller drops the hint if there are other pending requests that target the same page or the target page is already open.

A system includes a memory controller and a memory device having a command interface, refresh circuitry, control logic, and a plurality of memory banks, each with a plurality of rows of memory cells. The command interface is operable to receive a refresh command from a memory controller and the refresh circuitry is configured to perform one or more refresh operations to refresh data stored in at least one bank of the plurality of memory banks during a refresh time interval in response to the refresh command from the memory controller. The control logic is to configure the command interface to enter a calibration mode during the refresh time interval, and the command interface is configured to perform a calibration operation in the calibration mode during the refresh time interval.

Devices and techniques for temperature informed memory refresh are described herein. A temperature counter can be updated in response to a memory device write performed under an extreme temperature. Here, the write is performed on a memory device element in the memory device. The memory device element can be sorted above other memory device elements in the memory device based on the temperature counter. Once sorted to the top of these memory device elements, a refresh can be performed the memory device element.

In an embodiment, a memory controller in an integrated circuit may generate refreshes for one or more DRAMs coupled to the integrated circuit according to a refresh rate. The integrated circuit may include one or more temperature sensors. A rate of change of the temperature may be determined from the temperature sensors. If the rate is greater than a threshold, the memory controller may generate refreshes according to a refresh rate specified by the DRAMs. If the rate is less than the threshold, the memory controller may generate refreshes at a reduced refresh rate.

Methods and apparatus for row hammer (RH) mitigation and recovery. A host comprising a memory controller is configured to interface with one or more DRAM devices, such as DRAM DIMMs. The memory controller includes host-side RH mitigation logic and the DRAM devices include DRAM-side RH mitigation logic that cooperates with the host-side RH mitigation logic to perform RH mitigation and/or recovery operations in response to detection of RH attacks. The memory controller and DRAM device are configured to support an RH polling mode under which the memory controller periodically polls for RH attack detection indicia on the DRAM device that is toggled when the DRAM device detects an RH attack. The memory controller and DRAM device may also be configured to support an RH ALERT_n mode under which the use of an ALERT_n signal and pin is used to provide an alert to the memory controller to initiate RH mitigation and/or recovery.

Disclosed herein are mechanisms and methods for reducing power consumed by various DRAM technologies (e.g., high-capacity DRAM and/or 3D DRAM) which may impact battery life of the platform. These mechanisms and methods may opportunistically reduce the power consumed by DRAM by inhibiting periodic refresh commands to memory ranks that are not in-use. Since these mechanisms and methods may be based on enhancements to memory controllers, they may accordingly be operating system (OS) agnostic.

An apparatus includes a memory sub-system comprising a plurality of memory blocks and a memory block defect detection component. The memory block defect detection component is to set, for a memory block among the plurality of memory blocks, a first block defect detection rate and determine whether the first block defect detection rate is greater than a threshold block defect detection rate for the at least one memory block. In response to a determination that the first block defect detection rate is greater than the threshold block defect detection rate for the memory block, the memory block defect detection component is to assert a program command on the memory block determine whether a program operation associated with assertion of the program command on the at least one memory block is successful. In response to a determination the program operation is unsuccessful, the memory block defect detection component is to determine that a failure involving a plane associated with the memory block and another plane of the memory sub-system has occurred.