Systems and methods are disclosed for automated generation of integrated circuit designs and associated data. These allow the design of processors and SoCs by a single, non-expert who understands high-level requirements; allow the en masse exploration of the design-space through the generation processors across the design-space via simulation, or emulation; allow the easy integration of IP cores from multiple third parties into an SoC; allow for delivery of a multi-tenant service for producing processors and SoCs that are customized while also being pre-verified and delivered with a complete set of developer tools, documentation and related outputs. Some embodiments, provide direct delivery, or delivery into a cloud hosting environment, of finished integrated circuits embodying the processors and SoCs.

Embodiments disclosed herein describe switching logic in board-level interconnects and in the system-level interconnects that may provide bitwise dynamic routing and switching between corresponding board-level and system-level components. At board-level, a switching ASIC may receive input data through a backplane from an emulation ASIC in a first logic board and route any bit of the input data to any of the emulation ASIC in a second logic board. At system-level, a switching logic board containing a set of switching ASICs may be associated with a logic cluster and may dynamically route data bits from the emulation ASICs in the logic cluster to emulation ASICs to other logic clusters of the emulation system and/or target systems. Additionally, the switching logic board may dynamically route bits from the other logic clusters to the associated logic cluster.

Embodiments disclosed herein describe switching logic in board-level interconnects and in the system-level interconnects that may provide bitwise dynamic routing and switching between corresponding board-level and system-level components. At board-level, a switching ASIC may receive input data through a backplane from an emulation ASIC in a first logic board and route any bit of the input data to any of the emulation ASIC in a second logic board. At system-level, a switching logic board containing a set of switching ASICs may be associated with a logic cluster and may dynamically route data bits from the emulation ASICs in the logic cluster to emulation ASICs to other logic clusters of the emulation system and/or target systems. Additionally, the switching logic board may dynamically route bits from the other logic clusters to the associated logic cluster.

An integrated circuits with sequential logic circuitry is provided. The sequential logic circuitry may including latching circuits that receive clock signals from on-chip or off-chip clock sources. The clock signals may exhibit clock skew that is native to the integrated circuit. The natively existing clock skew can be leverage to perform time borrowing to help optimize circuit performance. The desired clock skew can be achieved by intelligent placement of the clock sources and deliberate routing of the clock signals from the clock sources to respective types of clock distribution networks on the integrated circuit.

An integrated circuits with sequential logic circuitry is provided. The sequential logic circuitry may including latching circuits that receive clock signals from on-chip or off-chip clock sources. The clock signals may exhibit clock skew that is native to the integrated circuit. The natively existing clock skew can be leverage to perform time borrowing to help optimize circuit performance. The desired clock skew can be achieved by intelligent placement of the clock sources and deliberate routing of the clock signals from the clock sources to respective types of clock distribution networks on the integrated circuit.

A hard disk device simulator, a testing system using the hard disk device simulator and a testing method thereof are disclosed. The hard disk device simulator having a detection circuit is serially connected to a test port of a device under test, and a test program is executed on the device under test to read a signal link status of an insertion slot of the device under test and transmit a detection command through the test port, to drive a detection circuit of the hard disk device simulator to detect signals on a power pin, a clock pin and a system management bus, to generate a detection result, thereby verifying correctness of the device under test based on the signal link status and the detection result. As a result, the technical effect of reducing the cost of testing the device under test can be achieved.

Techniques include retrieving a first structural netlist (SN1) that indicates electronic components, values of programmable parameters, and connections for a first electronic circuit, and retrieving a first placed and routed netlist (PR1) that indicates physical placement of the electronic components and physical routing of connections for SN1. Also retrieved is a second structural netlist (SN2) for a different second electronic circuit. For each component in SN2, a matching component, if any, is found in SN1 based on type of component and inputs that are output from other matching components. A different second placed and routed netlist (PR2) is generated for the second circuit by deriving new placement and routing for only for non-matching components in SN2.

Techniques include retrieving a first structural netlist (SN1) that indicates electronic components, values of programmable parameters, and connections for a first electronic circuit, and retrieving a first placed and routed netlist (PR1) that indicates physical placement of the electronic components and physical routing of connections for SN1. Also retrieved is a second structural netlist (SN2) for a different second electronic circuit. For each component in SN2, a matching component, if any, is found in SN1 based on type of component and inputs that are output from other matching components. A different second placed and routed netlist (PR2) is generated for the second circuit by deriving new placement and routing for only for non-matching components in SN2.

Apparatuses and methods related to commands to transfer data and/or perform logic operations are described. For example, a command that identifies a location of data and a target for transferring the data may be issued to a memory device. Or a command that identifies a location of data and one or more logic operations to be performed on that data may be issued to a memory device. A memory module may include different memory arrays (e.g., different technology types), and a command may identify data to be transferred between arrays or between controllers for the arrays. Commands may include targets for data expressed in or indicative of channels associated with the arrays, and data may be transferred between channels or between memory devices that share a channel, or both. Some commands may identify data, a target for the data, and a logic operation for the data.

Apparatuses and methods related to commands to transfer data and/or perform logic operations are described. For example, a command that identifies a location of data and a target for transferring the data may be issued to a memory device. Or a command that identifies a location of data and one or more logic operations to be performed on that data may be issued to a memory device. A memory module may include different memory arrays (e.g., different technology types), and a command may identify data to be transferred between arrays or between controllers for the arrays. Commands may include targets for data expressed in or indicative of channels associated with the arrays, and data may be transferred between channels or between memory devices that share a channel, or both. Some commands may identify data, a target for the data, and a logic operation for the data.