Patent classifications
G11B5/7358
MAGNETIC RECORDING MEDIUM
A magnetic recording medium is provided and includes a layer structure including a magnetic layer, a non-magnetic layer, and a base layer in this order, in which an average thickness t.sub.T of the magnetic recording medium is 3.5 mt.sub.T5.3 m, a dimensional variation w in a width direction of the magnetic recording medium to tension change in a longitudinal direction of the magnetic recording medium is 700 ppm/Nw2000 ppm/N, and an average thickness t.sub.n of the non-magnetic layer is t.sub.n1.0 m.
MAGNETIC RECORDING MEDIUM
In a magnetic recording medium, an average thickness t.sub.T is t.sub.T5.5 m, a dimensional variation w in a width direction to tension change in a longitudinal direction is 650 ppm/Nw, and a rate of shrinkage in the longitudinal direction is 0.08% or less.
Magnetic recording medium having a dimensional variation
The average thickness t.sub.T of a magnetic recording medium meets the requirement that t.sub.T5.5 [m], and the dimensional change amount w in the width direction of the magnetic recording medium with respect to the tension change in the longitudinal direction of the magnetic recording medium meets the requirement that 700 ppm/Nw.
Magnetic tape having characterized magnetic layer
The magnetic tape includes a magnetic layer including ferromagnetic powder, non-magnetic powder, and a binding agent and a back coating layer including non-magnetic powder and a binding agent, in which the ferromagnetic powder is ferromagnetic hexagonal ferrite powder, a center line average surface roughness measured regarding a surface of the magnetic layer is equal to or smaller than 1.8 nm, an intensity ratio of a peak intensity of a diffraction peak of a (110) plane with respect to a peak intensity of a diffraction peak of a (114) plane of a hexagonal ferrite crystal structure obtained by an X-ray diffraction analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, and a contact angle with respect to 1-bromonaphthalene measured regarding a surface of the back coating layer is 15.0 to 30.0.
Magnetic tape having characterized magnetic layer
Provided is a magnetic tape in which an Ra measured regarding a surface of a magnetic layer is equal to or smaller than 1.8 nm, Int(110)/Int(114) of a hexagonal ferrite crystal structure obtained by an XRD analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, full widths at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer before and after performing a vacuum heating with respect to the magnetic tape are greater than 0 nm and equal to or smaller than 10.0 nm, and a difference between the spacings measured by optical interferometry regarding the surface of the back coating layer before and after performing the vacuum heating is greater than 0 nm and equal to or smaller than 8.0 nm.
Magnetic tape having characterized magnetic layer
The magnetic tape includes a magnetic layer including ferromagnetic powder, non-magnetic powder, and a binding agent and a back coating layer including non-magnetic powder and a binding agent, in which the ferromagnetic powder is ferromagnetic hexagonal ferrite powder, an Ra measured regarding a surface of the magnetic layer is equal to or smaller than 1.8 nm, an intensity ratio of a peak intensity of a diffraction peak of a (110) plane with respect to a peak intensity of a diffraction peak of a (114) plane of a hexagonal ferrite crystal structure obtained by an X-ray diffraction analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, and a logarithmic decrement acquired by a pendulum viscoelasticity test performed regarding a surface of the back coating layer is equal to or smaller than 0.060.
MAGNETIC RECORDING MEDIUM AND MAGNETIC RECORDING AND REPRODUCING DEVICE
The magnetic recording medium includes a non-magnetic support; a magnetic layer including a ferromagnetic powder on one surface of the non-magnetic support; and a back coating layer including a non-magnetic powder on the other surface of the non-magnetic support, in which a difference (S.sub.afterS.sub.before) between a spacing S.sub.after measured by optical interferometry regarding a surface of the back coating layer after ethanol cleaning and a spacing S.sub.before measured by optical interferometry regarding the surface of the back coating layer before ethanol cleaning is greater than 0 nm and equal to or smaller than 15.0 nm, and the non-magnetic support is an aromatic polyester support having a moisture absorption of 0.3% or less.
Magnetic recording medium having a dimensional variation
In a magnetic recording medium, an average thickness t.sub.T is t.sub.T5.5 m, a dimensional variation w in a width direction to tension change in a longitudinal direction is 650 ppm/Nw, and a rate of shrinkage in the longitudinal direction is 0.08% or less.
Magnetic recording medium having a dimensional variation
A magnetic recording medium includes a layer structure including a magnetic layer, a non-magnetic layer, and a base layer in this order, in which an average thickness t.sub.T is t.sub.T5.5 m, a dimensional variation w in a width direction to tension change in a longitudinal direction is 660 ppm/Nw, and an average thickness t.sub.n of the non-magnetic layer is t.sub.n1.0 m.
Magnetic tape having characterized magnetic layer
Provided is a magnetic tape in which an Ra measured regarding a surface of a magnetic layer is equal to or smaller than 1.8 nm, Int(110)/Int(114) of a hexagonal ferrite crystal structure obtained by an X-ray diffraction analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, the back coating layer includes one or more kinds of component selected from the group consisting of fatty acid and fatty acid amide, and a CH derived C concentration calculated from a CH peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the back coating layer at a photoelectron take-off angle of 10 degrees is equal to or greater than 35 atom %.