Endurance mechanisms are introduced for memories such as non-volatile memories for broad usage including caches, last-level cache(s), embedded memory, embedded cache, scratchpads, main memory, and storage devices. Here, non-volatile memories (NVMs) include magnetic random-access memory (MRAM), resistive RAM (ReRAM), ferroelectric RAM (FeRAM), phase-change memory (PCM), etc. In some cases, features of endurance mechanisms (e.g., randomizing mechanisms) are applicable to volatile memories such as static random-access memory (SRAM), and dynamic random-access memory (DRAM). The endurance mechanisms include a wear leveling scheme that uses index rotation, outlier compensation to handle weak bits, and random swap injection to mitigate wear out attacks.

A memory system includes a management-information restoring unit. The management-information restoring unit determines whether a short break has occurred referring to a pre-log or a post-log in a NAND memory. The management-information restoring unit determines that a short break has occurred when the pre-log or the post-log is present in the NAND memory. In that case, the management-information restoring unit determines timing of occurrence of the short break, and, after selecting a pre-log or a post-log used for restoration, performs restoration of the management information reflecting these logs on a snapshot. Thereafter, the management-information restoring unit applies recovery processing to all write-once blocks in the NAND memory, takes the snapshot again, and opens the snapshot and the logs in the past.

A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including identifying an amount of storage charge loss (SCL) that has occurred on an open block of the memory device, the open block having one or more erased pages, determining that the amount of SCL satisfies a threshold criterion corresponding to an acceptable amount of SCL to occur on the open block, and responsive to determining that the amount of SCL satisfies the threshold criterion, keeping the open block open for programming the one or more erased pages.

A storage device including a processor, a controller, and a switch is provided. The processor is configured to control a logic circuit. When a main reset signal is enabled, the processor generates a sub-reset signal according to the operation status of the logic circuit. The controller generates a mask signal according to the main reset signal and the sub-reset signal. When the mask signal is enabled, the switch does not transmit the main reset signal to the logic circuit. When the mask signal is not enabled, the switch transmits the main reset signal to the logic circuit to reset the logic circuit.

A data storage device includes a nonvolatile memory device; a randomizing unit configured to randomize data to be stored in the nonvolatile memory device and derandomize data read from the nonvolatile memory device, by using seed values; and a control unit configured to, in the case where return is made from a power failure state to a normal state, detect a page of the nonvolatile memory device in which a power problem has occurred, and randomize data of the page in which the power problem has occurred, by using a seed value that is different from a seed value corresponding to the page in which the power problem has occurred, through the randomizing unit.

According to one embodiment, a semiconductor device includes a non-volatile memory, a temperature measurement circuit that measures a temperature of the non-volatile memory, and a controller. The controller also writes information about the temperature which is measured by the temperature measurement circuit in the non-volatile memory together when writing data in the non-volatile memory. Further, the controller performs write-back processing of writing data, which is written at a temperature in a rewriting temperature range, back when the temperature measured by the temperature measurement circuit is not in the rewriting temperature range.

Managing storage device evacuation that includes a plurality of storage devices, including: detecting, by the storage system, an occurrence of a storage device evacuation event associated with a source storage device within a write group, wherein the write group is a subset of storage devices storing a data set; responsive to detecting the occurrence of the storage device evacuation event, identifying, by the storage system, a target storage device for receiving data stored on the source storage device; and migrating, by the storage system, the data stored on the source storage device to the target storage device.

The present disclosure relates to a method for writing into a one-time programmable memory of an integrated circuit, the method comprising attempting, by a memory control circuit of the integrated circuit, to write data in at least one first register of the one-time programmable memory; verifying, by the memory control circuit, whether the data has been correctly written in the at least one first register; and, in case the data has not been correctly written in the at least one first register, attempting, by the memory control circuit, to write the data in at least one second register of the one-time programmable memory.

A memory system includes a non-volatile memory having a plurality of memory cells, and a controller configured to carry out write operations in a first mode in which n-bit data is written per target memory cell of the non-volatile memory until an allowable data amount of data items has been written, and then, in a second mode in which m-bit data is written per target memory cell of the non-volatile memory, where n is an integer of one or more and m is an integer greater than n. The controller is further configured to detect that an idle state, in which a command has not been received from the host, has continued for a threshold period of time or more, increase the allowable data amount in response thereto, and after the increase, carry out a write operation to write data items in the non-volatile memory in the first mode.

Various examples are directed to memory systems comprising a component and a processing device. The memory system may comprise a plurality of blocks. A first portion of the plurality of blocks may be retired and a second portion of the plurality of blocks may be unretired. The processing device receives a sanitize operation for the plurality of blocks. The processing device initiates a first erase cycle at a first retired block of the plurality of blocks. The processing device determines that the first erase cycle was not successful and sets an erase indicator to false.