A write voltage generator is connected with a magnetoresistive random access memory. The write voltage generator provides a write voltage during a write operation. A storage state of a selected memory cell in a write path of the magnetoresistive random access memory is changed in response to the write voltage. The write voltage generator includes a temperature compensation circuit and a process corner compensation circuit. The temperature compensation circuit generates a transition voltage according to an ambient temperature. The transition voltage decreases with the increasing ambient temperature. The process corner compensation circuit receives the transition voltage and generates the write voltage.

A memory device includes a well, a poly layer, a dielectric layer, an alignment layer and an active area. The poly layer is formed above the well. The dielectric layer is formed above the poly layer. The alignment layer is formed on the dielectric layer, used to receive an alignment layer voltage and substantially aligned with the dielectric layer in a projection direction. The active area is formed on the well. The dielectric layer is thicker than the alignment layer. A first overlap area of the poly layer and the active area is smaller than a second overlap area of the poly layer and the dielectric layer excluding the first overlap area.

A memory device, and a method of operating the memory device, includes a memory block configured to include a plurality of memory cells that are stacked to be spaced apart from each other on a substrate and to include word lines coupled to the plurality of memory cells, and bit lines and a source line coupled to both ends of strings including the plurality of memory cells, and peripheral circuits configured to perform an erase operation on the memory block, wherein the peripheral circuits are configured to perform the erase operation on the plurality of memory cells included in the memory block, and thereafter perform a defect detection operation on memory cells selected from among the plurality of memory cells depending on sizes of the plurality of memory cells.

Some embodiments include apparatus and methods using access lines, first memory cells coupled to an access line of the access lines, and a control unit including circuitry. The control unit is configured to apply a first voltage to the access line; check first threshold voltages of the first memory cells after applying the first voltage; obtain offset information based on a determination that at least one of the first threshold voltages is greater than a selected voltage; generate a second voltage, the second voltage being a function of the first voltage and the offset information; and apply the second voltage to one of the access lines during an operation of storing information in second memory cells.

Disclosed in some examples are systems, methods, memory devices, and machine readable mediums for a fast secure data destruction for NAND memory devices that renders data in a memory cell unreadable. Instead of going through all the erase phases, the memory device may remove sensitive data by performing only the pre-programming phase of the erase process. Thus, the NAND doesn't perform the second and third phases of the erase process. This is much faster and results in data that cannot be reconstructed. In some examples, because the erase pulse is not actually applied and because this is simply a programming operation, data may be rendered unreadable at a per-page level rather than a per-block level as in traditional erases.

Numerous embodiments of programming, verifying, and reading systems and methods for use with a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. Selected cells can be programmed and verified with extreme precision to hold one of N different values. During a read operation, the system determines which of the N different values is stored in a selected cell.

A memory device and an operating method of the memory device is disclosed. The memory device includes a memory cell array including a plurality of memory blocks. The memory device further includes a peripheral circuit for performing an erase voltage application operation, a first erase verify operation, and a second erase verify operation on a selected memory block among the plurality of memory blocks. The memory device also includes a control logic for setting a start erase voltage of an erase operation, based on a result of the first erase verify operation, and controlling the peripheral circuit to perform the second erase verify operation when it is determined that the first erase verify operation on the selected memory block has been passed.

A storage device comprising: a nonvolatile memory device including a plurality of memory blocks; and a device controller configured to control the nonvolatile memory device to determine a memory block to perform a refresh operation and to control the memory block to perform the refresh operation to recover data of the memory block.

Provided herein are a page buffer, a memory device having the page buffer, and a method of operating the memory device. The memory device includes a voltage generator configured to generate operating voltages for operating a plurality of memory cells, a program and verify circuit configured to apply the operating voltages to word lines and bit lines coupled to the memory cells and to perform a program operation and a verify operation, and a program operation controller configured to control the program and verify circuit and the voltage generator so that a bit line precharge operation is performed and so that, when the bit line precharge operation has been completed, a bit line discharge operation is performed.

A memory device and an operating method of the memory device is disclosed. The memory device includes a memory cell array including a plurality of memory blocks. The memory device further includes a peripheral circuit for performing an erase voltage application operation, a first erase verify operation, and a second erase verify operation on a selected memory block among the plurality of memory blocks. The memory device also includes a control logic for setting a start erase voltage of an erase operation, based on a result of the first erase verify operation, and controlling the peripheral circuit to perform the second erase verify operation when it is determined that the first erase verify operation on the selected memory block has been passed.