A system includes a memory cell array including multi-level cells, an input data scramble circuit configured to receive input data and match lower error tolerant bits with higher error tolerant bits to provide matched bit sets, wherein each of the matched bit sets includes at least one lower error tolerant bit and at least one higher error tolerant bit, and a write driver configured to receive the matched bit sets and store each of the matched bit sets into one memory cell of the multi-level cells.

A method includes determining that a ratio of valid data portions to a total quantity of data portions of a block of memory cells is greater than or less than a valid data portion threshold and determining that health characteristics for the valid data portions of the block of memory cells are greater than or less than a valid data health characteristic threshold. The method further includes performing a first media management operation on the block of memory cells in response to determining that the ratio of valid data portions to the total quantity of data portions is greater than the valid data portion threshold and performing a second media management operation on at least a portion of the block of memory cells in response to determining that the ratio of valid data portions to the total quantity of data portions is less than the valid data portion threshold and the health characteristics for the valid data portions are greater than the valid data health characteristic threshold.

An average inter-pulse delay of a data unit of the memory device is calculated. An average temperature of the data unit is calculated. A first scaling factor based on the average inter-pulse delay and a second scaling factor based on the average temperature is obtained. A media management metric based on the first scaling factor and the second scaling factor is calculated. Responsive to determining that the media management metric satisfies a media management criterion, a media management operation on the data unit at a predetermined cycle count is performed.

Devices and techniques temperature sensitive NAND programming are disclosed herein. A device controller can receive a command to write data to a component of the device. A temperature can be obtained in response to the command, and the temperature can be combined with a temperature compensation value to calculate a verification level. The command can then be executed in accordance with the verification level.

A storage device comprising: a nonvolatile memory device including a plurality of memory blocks; and a device controller configured to control the nonvolatile memory device to determine a memory block to perform a refresh operation and to control the memory block to perform the refresh operation to recover data of the memory block.

In an embodiment a non-volatile memory device includes a memory array having a plurality of memory cells, a control unit operatively coupled to the memory array, a biasing stage controllable by the control unit and configured to apply a biasing configuration to the memory cells to perform a memory operation and a reading stage coupled to the memory array and controllable by the control unit, the reading stage configured to verify whether the memory operation has been successful based on a verify level, wherein the control unit is configured to adaptively modify a value of the verify level based on an ageing of the memory cells.

Apparatus including an array of memory cells, and a controller configured to cause the apparatus to determine a first value indicative of a number of memory cells of a plurality of memory cells that are activated in response to a control gate voltage having a particular voltage level, compare the first value to a plurality of second values, and determine an expected data age of the plurality of memory cells or a plurality of read voltages in response to the comparison of the first value to the plurality of second values.

A reading method for a non-volatile memory device, includes performing a normal read operation using a default read level in response to a first read command; and performing a read operation using a multiple on-chip valley search (OVS) sensing operation in response to a second read command, when read data read in the normal read operation are uncorrectable.

The present technology relates to an electronic device. A memory controller controls a memory device such that a life of the memory device is increased. The memory controller that controls the memory device includes a flash translation layer configured to generate a device health descriptor based on device information received from the memory device, and a bad block controller configured to generate a bad block table based on bad block information received from the memory device, and generate recycling information for recycling pages in bad blocks recorded in the bad block table based on the device health descriptor.

Broadly speaking, embodiments of the present technique provide apparatus and methods for improved wear-levelling in (volatile and non-volatile) memories. In particular, the present wear-levelling techniques comprise moving static memory states within a memory, in order to substantially balance writes across all locations within the memory.