Patent classifications
G11C29/82
DATA STORAGE DEVICE AND DATA MAINTENANCE METHOD THEREOF
The present invention provides a data storage device including a flash memory and a controller. The flash memory has a plurality of SLC-spare blocks, a plurality of TLC-data blocks and a plurality of TLC-spare blocks. The controller writes a first data sector into a first TLC-spare block, and determines whether a first TLC-data block corresponding to a first logical address has valid data. When the first TLC-data block has valid data, the controller performs a reverse-lookup to obtain a second logical address corresponding to the first TLC-data block, releases the first TLC-data block, a second TLC-data block and a third TLC-data block which are mapped to the second logical address, and maps the first TLC-spare block to the first logical address.
Apparatuses and methods for operating a memory device
Subject matter described pertains to apparatuses and methods for operating a memory device.
Detecting and managing bad columns
A system, computer readable medium and a method. The method may include sending input data to a NAND flash memory unit that comprises the NAND flash memory array and instructing the NAND flash memory unit to write input data to the NAND flash memory array to provide programmed data; reading from the NAND flash memory array the programmed data to provide read data; comparing the input data and the read data to provide column errors statistics at a column resolution; and defining, by a flash memory controller, bad columns of the NAND flash memory array in response to the column error statistics.
Methods for providing redundancy in a memory array comprising mapping portions of data associated with a defective address
Methods for providing redundancy in a memory include mapping a portion of first data associated with an address of the memory determined to indicate a defective memory cell to an address of a redundant area of the memory array, and writing second data to the memory array, wherein a portion of the second data is written to a column of the memory array associated with the address of the memory determined to indicate a defective memory cell for the first data.
Chunk redundancy architecture for memory
An integrated circuit (IC) includes addressable blocks of memory, and at least one redundant block of memory. A block of memory includes two or more chunks of memory. The IC also includes redundancy control cells. Control circuitry is included to access a first chunk of a redundant block of memory in place of a first remapped chunk one of the addressable blocks of memory, and a second chunk of a redundant block of memory in place of a second remapped chunk one of the addressable blocks of memory, based on the redundancy control cells.
Semiconductor device and semiconductor memory device
A semiconductor device includes a non-volatile memory unit, a data line configured to transfer data sequentially outputted from the non-volatile memory unit, and a shift register unit configured to include a plurality of registers that shift and store the data transferred through the data line in synchronization with a clock. The semiconductor device includes a non-volatile memory unit having an e-fuse array, and transfers the data stored in an e-fuse array to other constituent elements of the semiconductor device that use the data of the e-fuse array in order to have the data stored in the e-fuse array, including diverse setup information and repair information.
MEMORY DEVICE AND OPERATION METHOD OF THE SAME
A memory device includes: a main block that includes a plurality of first pages that are accessible based on a multi-bit address; and a sub-block that includes a plurality of second pages that are accessible based on a portion of bits of the multi-bit address, and stores a replacement data for replacing entire or a portion of the data of an accessed first page among the plurality of the first pages in a second page that stores the same tags as the other bits of the multi-bit address among the accessed second pages.
STORAGE SYSTEM AND INFORMATION PROCESSING SYSTEM FOR CONTROLLING NONVOLATILE MEMORY
According to one embodiment, a storage system includes a controller. The controller receives, from a host, a write command including a block address indicating a first block in a plurality of blocks, and a page address indicating a first page of the first block. The controller writes data designated by the write command to the first page of the first block. The controller notifies the host 2 of a page address indicating a latest readable page which is included in pages of the first block, the pages containing data which was written by the host before the designated data was written to the first page, the latest readable page having become readable by writing the designated data to the first page.
Storage system having a host that manages physical data locations of storage device
A storage device includes a nonvolatile memory, a communication interface connectable to a host, and a controller. The controller is configured to carry out writing of data that is received through the communication interface at a physical location of the nonvolatile memory when a write command associated with the data is received through the communication interface, control the communication interface to return a first notification upon determining that the writing of data at the physical location of the nonvolatile memory has completed, and control the communication interface to return a second notification a predetermined period of time after the first notification has been returned.
MEMORY DEVICE
A memory device includes a cell region in which memory blocks, respectively including gate electrodes and insulating layers, alternately stacked on a substrate, and channel structures, extending in a first direction, perpendicular to an upper surface of the substrate, passing through the gate electrodes and the insulating layers, and connected to the substrate, are arranged. A peripheral circuit region includes a row decoder connected to the gate electrodes and a page buffer connected to the channel structures. The memory blocks include main blocks and at least one spare block, wherein a length of the spare block is shorter than a length of each of the main blocks, in a second direction, parallel to the upper surface of the substrate.