An apparatus can be provided according to certain exemplary embodiments. For example, the apparatus can include a waveguiding first arrangement providing at least one electromagnetic radiation. A configuration can be provided that receives and splits the at least one electromagnetic radiation into a first radiation and a second radiation. The apparatus can further include a waveguiding second arrangement which has a first waveguide and a second waveguide, whereas the first waveguide receives the first radiation, and the second waveguide receives the second radiation. The first arrangement, the second arrangement and the configuration can be housed in a probe.

An optical device includes: a light source part configured to project illumination light toward a sensing region; a photodetector configured to receive reflected light of the illumination light reflected on the sensing region; and a condenser mirror. The condenser mirror has a through hole through which the illumination light from the light source part passes and an optical axis of the light source part and an optical axis of the condenser mirror are aligned with each other. A reflection surface of the condenser mirror has a shape obtained by cutting out a columnar body extending in a projection direction of the illumination light, with a spheroid whose rotation axis is a major axis. The photodetector is disposed in a direction toward a first focal position of the condenser mirror. The sensing region is set in a direction toward a second focal position of the condenser mirror.

Described are devices, methods, and systems that are suitable for rapidly and simultaneously determining the concentration of suspended particles in a sample. The devices, methods, and systems allow for the rapid and simultaneous interrogation of a large number of sample wells in a single vessel, for example, samples contained in a two-dimensional array or micro-titer plate, without the need for moving reading heads or moving the sample vessel. The nephelometry system allows the user to rapidly and simultaneously measure the concentration of the particles in numerous samples, adjust the concentration of the particles in the sample with a sample handling system, and re-measure the concentration of the samples in order to achieve a desired concentration.

An apparatus can be provided according to certain exemplary embodiments. For example, the apparatus can include a waveguiding first arrangement providing at least one electromagnetic radiation. A configuration can be provided that receives and splits the at least one electromagnetic radiation into a first radiation and a second radiation. The apparatus can further include a waveguiding second arrangement which has a first waveguide and a second waveguide, whereas the first waveguide receives the first radiation, and the second waveguide receives the second radiation. The first arrangement, the second arrangement and the configuration can be housed in a probe.

A chemical detector for rapid, simultaneous detection of multiple chemicals including chemical warfare agents, toxic industrial chemicals, and explosives having one or more gas chromatography columns each with a chemosorbent or a chemo-reactive stationary phase and an infrared-transparent base, a bright infrared light source, a mechanism to direct the light source to any point along any of the columns, and an infrared sensor. Another disclosed detector has one or more gas chromatography columns each on the surface of a substrate having at least one infrared-transparent waveguide pattern, a bright infrared light source, and at least one ring resonator for each column, where each ring resonator is coated with a chemosorbent or a chemo-reactive stationary phase, and where each ring resonator spectroscopically probes the stationary phase. Also disclosed are the related methods for chemical detection.

The invention provides a spectroscopic instrument, which comprises a projecting optical system for projecting a projecting light emitted from a light source, a photodetecting optical system for receiving a reflection light from an object to be measured and for guiding to a photodetection member, and a spectroscope for detecting a condition of the object to be measured based on the reflection light as received by the photodetection member, wherein the projecting optical system and the photodetecting optical system have a projecting system chromatic aberration decreasing component and a photodetecting system chromatic aberration decreasing component which eliminate chromatic aberrations, respectively.

A chemical detector for rapid, simultaneous detection of multiple chemicals including chemical warfare agents, toxic industrial chemicals, and explosives having one or more gas chromatography columns each with a chemosorbent or a chemo-reactive stationary phase and an infrared-transparent base, a bright infrared light source, a mechanism to direct the light source to any point along any of the columns, and an infrared sensor. Another disclosed detector has one or more gas chromatography columns each on the surface of a substrate having at least one infrared-transparent waveguide pattern, a bright infrared light source, and at least one ring resonator for each column, where each ring resonator is coated with a chemosorbent or a chemo-reactive stationary phase, and where each ring resonator spectroscopically probes the stationary phase. Also disclosed are the related methods for chemical detection.

There is provided a measuring apparatus, including a light receiving element, provided at a position facing a measurement object region on which is placed a measurement object, which forms an image with light from the measurement object region, light emitting elements, arranged surrounding the light receiving element, which emit light for measuring the measurement object, and reflective optical elements, provided above the light emitting elements, which guide, to the measurement object region, emission light radiated from the light emitting elements. A light receiving surface of the light receiving element and light emission surfaces of the light emitting elements are positioned mutually on a same plane. The emission light radiated from the light emitting elements is reflected by the reflective optical elements, and center lines of the emission light radiated from each of the light emitting elements pass through an approximate center of the measurement object region.