A thin-film deposition system deposits a thin-film on a wafer. A radiation source irradiates the wafer with excitation light. An emissions sensor detects an emission spectrum from the wafer responsive to the excitation light. A machine learning based analysis model analyzes the spectrum and detects contamination of the thin-film based on the spectrum.

A method for inspecting a preservation layer of a motor vehicle component during the manufacture of a motor vehicles. A preservation medium is applied having fluorescent additives to a component of the motor vehicle in a coating region. An inspection head having at least one camera and a UV light source is then caused to move adjacent to an inspection region that is a partial region of the coating region. The UV light source is the caused to emit radiating light onto the inspection region and the at least one camera is concurrently caused to record at least one image of the inspection region. An examination of the at least one recorded image is then conducted for a faulty coating with the preservation medium.

An optical metrology device is capable of detection of any combination of photoluminescence light, specular reflection of broadband light, and scattered light from a line across the width of a sample. The metrology device includes a first light source that produces a first illumination line on the sample. A scanning system may be used to scan an illumination spot across the sample to form the illumination line. A detector collects the photoluminescence light emitted along the illumination line. Additionally, a broadband illumination source may be used to produce a second illumination line on the sample, where the detector collects the broadband illumination reflected along the second illumination line. A signal collecting optic may collect the photoluminescence light and broadband light and focus it into a line, which is received by an optical conduit. The output end of the optical conduit has a shape that matches the entrance of the detector.

A magneto-optical defect center magnetometer, such as a diamond nitrogen vacancy (DNV) magnetometer, can include an excitation source, a magneto-optical defect center element, a collection device, a top plate, a bottom plate, and a printed circuit board. The excitation source, the magneto-optical defect center element, and the collection device are each mounted to the printed circuit board

An example system for inspecting a surface includes a laser, an optical system, a gated camera, and a control system. The laser is configured to emit pulses of light, with respective wavelengths of the pulses of light varying over time. The optical system includes at least one optical element, and is configured to direct light emitted by the laser to points along a scan line one point at a time. The gated camera is configured to record a fluorescent response of the surface from light having each wavelength of a plurality of wavelengths at each point along the scan line. The control system is configured to control the gated camera such that an aperture of the gated camera is open during fluorescence of the surface but closed during exposure of the surface to light emitted by the laser.

A method and related apparatus for confirming whether a kill laser successfully destroys an undesired population of cells includes introducing fluorescent dye into cells, exciting the cells with a detection laser or a light emitting diode to cause the cell to fluoresce for a first time, measuring the amount of fluorescence in the cells with a detector capable of emitting a detection pulse, classifying the cells via embedded processing as undesired or desired cells based on the amount of fluorescence, firing a kill beam with a kill laser at any undesired cells, measuring the amount of fluorescence in the cells a second time to determine whether a fluorescent event was generated from the kill beam striking the cells, and providing feedback to an operator of the kill laser as to whether any fluorescent events were generated from the kill beam striking the cells.

A method for inspecting a preservation layer of a motor vehicle component during the manufacture of a motor vehicles. A preservation medium is applied having fluorescent additives to a component of the motor vehicle in a coating region. An inspection head having at least one camera and a UV light source is then caused to move adjacent to an inspection region that is a partial region of the coating region. The UV light source is the caused to emit radiating light onto the inspection region and the at least one camera is concurrently caused to record at least one image of the inspection region. An examination of the at least one recorded image is then conducted for a faulty coating with the preservation medium.

A method and related apparatus for confirming whether a kill laser successfully destroys an undesired population of cells includes introducing fluorescent dye into cells, exciting the cells with a detection laser or a light emitting diode to cause the cell to fluoresce for a first time, measuring the amount of fluorescence in the cells with a detector capable of emitting a detection pulse, classifying the cells via embedded processing as undesired or desired cells based on the amount of fluorescence, firing a kill beam with a kill laser at any undesired cells, measuring the amount of fluorescence in the cells a second time to determine whether a fluorescent event was generated from the kill beam striking the cells, and providing feedback to an operator of the kill laser as to whether any fluorescent events were generated from the kill beam striking the cells.

A method for photoluminescence measurement of a sample that includes a front face and a rear face linked by a contour, the sample resting, via the rear face of same, on a receiving face of an active base. The sample also includes a first region partially delimited by the contour and that emits a photoluminescence signal of an intensity, referred to as the first intensity, that is lower at any point to the average intensity of the photoluminescence signal of the sample, referred to as the reference intensity, the active base emitting a photoluminescence signal of an intensity, referred to as the secondary intensity, that is at least equal to the reference intensity. The active base includes an edge that is set apart from the contour by an overlap distance and that delimits, with said contour, a peripheral section of the active base.

A method for detecting damage to a converter device of a lighting apparatus is provided. The method may include irradiating the converter device with input light, detecting a useful light portion emitted principally by a first section of the converter device by means of a first sensor element. A first detection signal is obtained, detecting a useful light portion emitted principally by a second section of the converter device, said second section being different than the first section, by means of a second sensor element. A second detection signal is obtained. The method further may include automatically obtaining damage information about the converter device from a ratio or a difference of the first detection signal with respect to either the second detection signal or a comparison signal formed therefrom.