There is provided is sliding body surface evaluation method and apparatus configured so that a temporal change in a transformed portion at a sliding portion of a sliding body can be observed. The method includes a first step of irradiating, with an electromagnetic wave, a sliding portion of a sliding body sliding on a sliding target body, a second step of detecting light emitted from the sliding portion irradiated with the electromagnetic wave, and a third step of deriving a change in a light emission state of the sliding portion.

A method for in vitro simulation and evaluation of platelet adhesion in blood-contacting medical devices is disclosed, including the following steps: (1) using a glycerin aqueous solution with a mass percentage concentration of 40% in an extracorporeal circulation circuit to simulate a viscosity and hydrodynamic characteristics of blood, and adding fluorescent particles with a diameter of 3 μm to 5 μm to the solution to simulate platelets; (2) after the solution circulates in the circuit for a specified time period, removing flow passage components of a tested device, and observing the deposition of the fluorescent particles on a blood-contacting surface inside the device by naked eyes and photographs; and (3) using laser-induced fluorescence (LIF) technique to apply laser light on a device surface deposited with the fluorescent particles and in contact with blood, and using charge-coupled device (CCD) camera imaging to photograph the aggregation and adhesion of laser-induced fluorescent particles.

A spot on a layer of a 2D semiconductor material deposited on a substrate is irradiated so as to generate excitons, so that photons are emitted from the layer. The photoluminescence spectrum is recorded for different values of the charge carrier concentration in the layer. The modulation of the charge carrier concentration may be realized by modulating the output power of the light source used to irradiate the sample. The relation is recorded between the ratio of the photoluminescence intensity of a first peak in the spectrum related to radiative recombination from indirect bandgaps to the intensity of a second peak in the spectrum related to radiative recombination from direct bandgaps, and the carrier concentration. This relation is fitted to a model of the ratio that takes into account multiple recombination mechanisms, radiative and non-radiative. From this process, the trap density within the bandgap is derived.

A method for detecting a defect in a semiconductor fabrication process is disclosed. The method includes forming photoresist on a substrate; forming a fluorescent agent in the photoresist; and detecting the defect of the photoresist after being subjected to developing by utilizing the fluorescent agent.

There is provided is sliding body surface evaluation method and apparatus configured so that a temporal change in a transformed portion at a sliding portion of a sliding body can be observed. The method includes a first step of irradiating, with an electromagnetic wave, a sliding portion of a sliding body sliding on a sliding target body, a second step of detecting light emitted from the sliding portion irradiated with the electromagnetic wave, and a third step of deriving a change in a light emission state of the sliding portion.

Methods and apparatus for testing solder joints of a PCB assembly using fluorescent-dye penetrants. The use of a suitable fluorescent-dye penetrant may significantly improve the sensitivity of a Dye and Pry test to dye indications compared to a typical sensitivity achievable thereby with a conventional dye penetrant. Some embodiments may use an automated fluorescence imaging system employing a translation stage to sequentially move individual solder-joint parts of a circuit under test into the field of view of a fluorescence microscope and a high-resolution digital camera to capture fluorescence images of the individual solder-joint parts. The movement of the translation stage and processing of the fluorescence images may be referenced to an electronic CAD file of the circuit to enable high-precision automated scanning of the solder-joint parts in the fluorescence imaging system, automated quantification of the extent of cracks in individual solder joints, and automatic generation of examination reports.

A system, having at least one radiation source and at least one mobile terminal, which has at least one optical sensor and a data-processing device, wherein the at least one optical sensor of the at least one mobile terminal is designed and configured to receive reflected radiation of the radiation source, so that surface structures, more particularly fouling, are detected from the received radiation of the radiation source by means of the data-processing device and, in particular, are stored in the data-processing device.

A thin-film deposition system deposits a thin-film on a wafer. A radiation source irradiates the wafer with excitation light. An emissions sensor detects an emission spectrum from the wafer responsive to the excitation light. A machine learning based analysis model analyzes the spectrum and detects contamination of the thin-film based on the spectrum.

An inspection apparatus is an inspection apparatus includes an excitation light source that generates excitation light to irradiate the object, a dichroic mirror that separates fluorescence from the sample by transmitting or reflecting the fluorescence according to a wavelength, a camera that images fluorescence reflected by the dichroic mirror, a camera that images fluorescence transmitted through the dichroic mirror, and a control apparatus that derives color irregularity information of a light-emitting element based on a first fluorescence image acquired by the camera and a second fluorescence image acquired by the camera, and an edge shift width corresponding to a width of a wavelength band in which transmittance and reflectance change according to a change in wavelength in the dichroic mirror is wider than a full width at half maximum of a normal fluorescence spectrum of the light-emitting element.

A device for detecting a coating applied to a surface includes a portable housing, a light source, a light detector, and a processing unit. The light source emits a first light having a first wavelength. The coating includes a fluorophore that re-emits a second light having a second wavelength, which is different than the first wavelength, in response to excitation by the first light. The light detector receives the second light re-emitted from the coating. The processing unit is adapted to determine a re-emission intensity of the second light and to determine a coverage metric of the coating based on the re-emission intensity of the second light. The coverage metric is then used to infer the efficacy of the coating.