Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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21/00
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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G01N21/84
Systems specially adapted for particular applications
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G01N21/88
Investigating the presence of flaws or contamination
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G01N21/8851
Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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G01N2021/8854
Grading and classifying of flaws
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G01N2021/8861
Determining coordinates of flaws
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G01N2021/8864
Mapping zones of defects
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