A method for automatic defect classification, the method may include acquiring, by a first camera, at least one first image of at least one area of an object; processing the at least one first image to detect a group of suspected defects within the at least one area; performing a first classification process for initially classifying the group of suspected defects; determining whether a completion of a classification of the first subgroup of the suspected defects requires additional information from a second camera; when determining that the first subgroup of the suspected defects requires additional information from the second camera then: acquiring second images, by the second camera while applying image acquisition parameters of the second camera, to provide the additional information; and performing the second classification process for classifying the first subgroup of suspected defects.

A method for automatic defect classification, the method may include (i) acquiring, by a first camera, at least one first image of at least one area of an object; (ii) processing the at least one first image to detect a group of suspected defects within the at least one area; (iii) performing a first classification process for initially classifying the group of suspected defects; (iii) determining whether a first subgroup of the suspected defects requires additional information from a second camera for a completion of a classification; (iv) when determining that the first subgroup of the suspected defects requires additional information from the second camera then: (a) acquiring second images, by the second camera, of the first subgroup of the suspected defects; and (b) performing a second classification process for classifying the first subgroup of suspected defects.

Disclosed is a defect inspection device according to an embodiment of the present disclosure. The defect inspection device includes: a robot arm including a hold unit for holding an object and a driving unit for moving the object; a first camera unit photographing an exterior of the object; an illumination unit irradiating light to the exterior of the object; and a control unit determining whether there is a defect in the object based on an image of the object photographed by the first camera unit.

The present disclosure discloses a method for detecting a wafer backside defect, comprising: Step 1, providing a signal database comprising signal data corresponding to various different defects, the defects comprising convex defects and concave defects, the signal data reflecting 3D information of the corresponding defect; Step 2, performing backside scanning on a tested wafer by using oblique incident light, and collecting corresponding emitted and scattered light data; and Step 3, comparing the collected emitted and scattered light data with the signal data, and fitting a defect 3D distribution map of the backside of the tested wafer. The present disclosure can test the height or depth of a wafer backside defect and form a 3D distribution map of the wafer backside defect, which is beneficial for analyzing the source of the wafer backside defect and processing it in time, reducing the troubleshooting time and improving the product yield.

This invention provides a processing apparatus for determining a state of secular change of a deformation of a construction, comprising a selection unit that selects, as a target for determination of secular change, at least a portion of deformations from among a plurality of deformations included in a first image at a first time period, on the basis of at least one of information relating to deformations, information relating to the construction, user selection, or a shape and a relative positional relationship of two or more deformations; a first determination unit that determines a deformation corresponding to a selected deformation among a plurality of deformations included in a second image at a second time period; and a second determination unit that determines a state of secular change between a selected deformation and a deformation determined by the first determination unit.

The invention relates to a method for checking a printing cylinder for defects in an engraved cylinder surface of the printing cylinder, comprising the steps: capturing a first and at least one further digital image of a cylinder surface of a printing cylinder by means of an optical capture unit, wherein the cylinder surface is cleaned before capturing the at least one further image, comparing the digital images each with a digital engraving master of the printing cylinder, the comparing comprising: determining deviations between each of the digital images and the digital engraving master, and checking the determined deviations for matching deviations between the digital images,
wherein a pseudo defects is concluded if no matching deviations between the digital images have been detected when comparing, and wherein an engraving defect on the printing cylinder is concluded in the case of matching deviations. Furthermore, a corresponding arrangement is described.

An electronic device for optically checking an appearance of products for defects includes a camera device, at least one white light source, and at least one red light source. The camera device is perpendicular to a side surface of a product to be checked, when the white light source is activated, the camera device captures images of the side surface and corners of the side surface of the product. When the red light source is activated, the camera device captures images of the side surface of the product. The electronic device checks for defects in appearance of the side surface of the product according to the images captured by the camera device, such defects including abnormal colors, stair slope errors, scratches, and sanding marks.

A method for additive manufacturing includes forming an object including depositing a first material including a first coloring component and a second material including a second coloring component, wherein both the first material and the second material further include a corresponding fluorescent component, scanning the object, including causing an emission of an optical signal from the object, wherein the emission of the optical signal is caused at least in part by an emission from the fluorescent components interacting with the first coloring component and the second coloring component as it passes from the fluorescent components to the surface of the object, sensing the emission of the optical signal, and determining presence of the first material and the second material based at least in part on the sensed emission of the optical signal.

An electronic device for optically checking an appearance of products for defects includes a camera device, at least one white light source, and at least one red light source. The camera device is perpendicular to a side surface of a product to be checked, when the white light source is activated, the camera device captures images of the side surface and corners of the side surface of the product. When the red light source is activated, the camera device captures images of the side surface of the product. The electronic device checks for defects in appearance of the side surface of the product according to the images captured by the camera device, such defects including abnormal colors, stair slope errors, scratches, and sanding marks.

An electronic device for optically checking an appearance of a product for defects includes a first checking device checking a plane of a product and a second checking device checking side surfaces of the product. The first checking device includes a first camera device, a second camera device, and first white and red light sources. The second checking device includes a third camera device, at least one second white light source, and at least one second red light source. When the first white light source or the first red light source are activated, the first and second camera device capture at least one image of a plane. When the second white light source or the second red light source are activated, the third camera device captures at least one image of a side surface.