A method for checking compliance of a mechanical part of a vehicle, including an image capture step for producing a study image of the mechanical part, and a step of analyzing the study image by an analysis unit, the analysis step including a results phase transmitting a results signal indicating whether the mechanical part is compliant or non-compliant.

Geographic atrophy of the eye can be detected and measured by imaging the eye at a depth greater than the retinal pigment epithelium (RPE) at a plurality of locations of the eye, for example, using optical coherence tomography (OCT); determining a ratio of the intensities of imaging signals of a retinal layer(s) with respect to the intensity of imaging signals of a sub-RPE layer(s) at each location; determining representative values based at least in part on the determined ratios; generating a map of the representative values; and identifying diseased areas from the map. Contours and binary maps may be generated based on the identified diseased areas. The size and shape of the identified areas may be analyzed and monitored over a period of time.

Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at least one optical parameter of the inspection system. The method also includes generating first image data for the wafer using the output generated using the first optical state and second image data for the wafer using the output generated using the second optical state. In addition, the method includes combining the first image data and the second image data corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer. The method further includes detecting defects on the wafer using the additional image data.

Systems and associated methods and/or utilize a 3D area-scan camera having a FOV and positioned to include a portion of a transport device within the FOV, and configured to capture images in accordance with a known interval; and at least one processor in communication with the 3D area-scan camera, and configured to: receive the images, extract image data associated with the object from the images, and analyze the image data and provide an inspection result corresponding to the object.

Geographic atrophy of the eye can be detected and measured by imaging the eye at a depth greater than the retinal pigment epithelium (RPE) at a plurality of locations of the eye, for example, using optical coherence tomography (OCT); determining a ratio of the intensities of imaging signals of a retinal layer(s) with respect to the intensity of imaging signals of a sub-RPE layer(s) at each location; determining representative values based at least in part on the determined ratios; generating a map of the representative values; and identifying diseased areas from the map. Contours and binary maps may be generated based on the identified diseased areas. The size and shape of the identified areas may be analyzed and monitored over a period of time.

A method for detecting, on the finish of containers, defects in a horizontal mold seal of the container includes the steps of disposing the container between a light source and a camera and ensuring the rotation of the container on itself according to one rotational revolution. The camera acquires, at each increment of rotation of the container, an image so that the number of images per rotational revolution is greater than 36. The images captured for each container are analyzed such that the profile of the finish edge is detected in each image, the profiles of the finish edge of the images are compared with a reference profile of the finish edge so as to detect deviations between these profiles, and a defect in the horizontal mold seal for a container is detected when at least one image of said container has a deviation.

Examples include a method for localizing one or more defects in a semiconductor device. The method includes switching the semiconductor device on and off at a first frequency and switching an irradiating device on and off at a second frequency. The method also includes acquiring images of the semiconductor device and lock-in averaging the images with a first reference signal having the first frequency and a first phase, to obtain amplitudes indicative of temperatures at a surface of the semiconductor device and/or phase signals indicative of a depth location of the one or more defects in the semiconductor device. The method also includes lock-in averaging the images with a second reference signal having the second frequency and a second phase to obtain a topography of the surface of the semiconductor device. The first frequency is different from the second frequency and/or the first phase is different from the second phase.

A method for detecting deformations of high voltage and/or medium voltage cables and/or cable components, include at a first point of time, capturing and storing (302) a first set of 3-dimensional, 3D, surface geometry measurement data of an area of interest of a surface of the cable or cable component. The method also incudes, at a second point of time, capturing and storing (304) a second set of 3-dimensional, 3D, surface geometry measurement data of an area of interest of a surface of the cable or cable component by moving a 3D surface scanner about the cable over the area of interest. The first and second sets of captured 3D surface geometry measurement data is compared to determine changes that have occurred in the cables or cable components between the first and second points of time, where changes indicate a deformation of the cable or cable component.

A method for detecting deformations of high voltage and/or medium voltage cables and/or cable components, include at a first point of time, capturing and storing (302) a first set of 3-dimensional, 3D, surface geometry measurement data of an area of interest of a surface of the cable or cable component. The method also incudes, at a second point of time, capturing and storing (304) a second set of 3-dimensional, 3D, surface geometry measurement data of an area of interest of a surface of the cable or cable component by moving a 3D surface scanner about the cable over the area of interest. The first and second sets of captured 3D surface geometry measurement data is compared to determine changes that have occurred in the cables or cable components between the first and second points of time, where changes indicate a deformation of the cable or cable component.

This invention provides a processing apparatus for determining a state of secular change of a deformation of a construction, comprising a selection unit that selects, as a target for determination of secular change, at least a portion of deformations from among a plurality of deformations included in a first image at a first time period, on the basis of at least one of information relating to deformations, information relating to the construction, user selection, or a shape and a relative positional relationship of two or more deformations; a first determination unit that determines a deformation corresponding to a selected deformation among a plurality of deformations included in a second image at a second time period; and a second determination unit that determines a state of secular change between a selected deformation and a deformation determined by the first determination unit.