A device comprises a planar substrate having conductive formations defining a substrate integrated waveguide test resonator; the test resonator comprising a three-dimensional region formed at least partly within the substrate having first and second planar conductive layers extending parallel to the plane of the substrate and one or more conductive sidewall formations perpendicular to the plane of the substrate defining a resonator side wall extending around the three-dimensional region; in which one of the first and second planar conductive layers comprises a test port comprising a conductive test connection electrically isolated from the rest of that planar conductive layer.

The exemplary system and method for the characterization procedures for complex permittivity of a dielectric material at radio frequencies, including microwave and millimeter-wave wavelengths. The exemplary system and method employ a highly resonant periodic array affixed or placed in proximity thereto to provide a frequency response that varies based on the constituent electromagnetic properties of a sample of dielectric material.

A sensor to measure dielectric constant of a medium may have a transmission line acting as a probe, and electronic circuit, and cable filter providing to reduce sensitivity of the sensor to cable parameters and influences. The sensor circuit may use a periodic signal generator to produce a carrier wave, which stimulates the transmission line, through a complex network coupling element. The complex impedance network forms a voltage divider with the transmission line, wherein the output of the voltage divider may be demodulated with an AM demodulator, such as a thermally compensated peak detector. This demodulated signal would be related to the characteristic impedance of the transmission line, and thus to the dielectric constant of the material surrounding the partially inserted transmission line probe. The demodulated signal may be offset, scaled, and linearized with a microcontroller containing signal processing routines, linearizing equations, stored calibration constants and look up tables.

A sensor to measure dielectric constant of a medium may have a transmission line acting as a probe, and electronic circuit, and cable filter providing to reduce sensitivity of the sensor to cable parameters and influences. The sensor circuit may use a periodic signal generator to produce a carrier wave, which stimulates the transmission line, through a complex network coupling element. The complex impedance network forms a voltage divider with the transmission line, wherein the output of the voltage divider may be demodulated with an AM demodulator, such as a thermally compensated peak detector. This demodulated signal would be related to the characteristic impedance of the transmission line, and thus to the dielectric constant of the material surrounding the partially inserted transmission line probe. The demodulated signal may be offset, scaled, and linearized with a microcontroller containing signal processing routines, linearizing equations, stored calibration constants and look up tables.

An apparatus for perturbation method electrical permittivity measurements of a sample comprises a waveguide body having a first end, a second end, an upper wall, and a lower wall, a first shorting plug disposed within the waveguide body proximate the first end, a second shorting plug disposed within the waveguide body proximate the second end, a first threaded connector mount attached to the upper wall of the waveguide body at a first position along a length of the waveguide body, a second threaded connector mount attached to the upper wall of the waveguide body at a second position along a length of the waveguide body, and first and second apertures formed centrally in the upper wall and lower wall, respectively, of the waveguide body.

A monitoring system contains a safety cable that has at least one line along which a fault sensor device extends. The safety cable has a capacitor with two electrodes and an inductor which is made of a conductor that is electrically connected to one of the electrodes such that a series resonant circuit is formed. By ascertaining a resonant frequency of the series resonant circuit, the state of the safety cable, in particular the wear of the safety cable, is determined and a possible future fault is predicted in particular. A corresponding safety cable in particular in the form of a prefabricated material available by the meter and a method for operating the monitoring system are described.

Described herein is Complex Dielectric Constant Sensor (CDCS) incorporating microstrip based radial stub and open circuit stub pair structures that utilize interference coupling between degenerate EIT modes to detect CDC of sample-under-test (SUT). In at least one embodiment, CDCS generates two distinct EIT modes when sensor is unloaded. In at least one embodiment, coupling between resonator modes and interaction of electromagnetic fields with material is affected indicating presence of dielectric sample. In at least one embodiment, two EIT modes become degenerate, causing cancellation and suppressing transparency window when dielectric constant of SUT matches a specific value. In at least one embodiment, CDCS can detect slight changes in complex dielectric properties of SUT. In at least one embodiment, CDCS can characterize materials such as substrate samples based on their CDCs for design and characterization of microwave devices, antennas, and thin film devices.

A resonator includes a first waveguide and a second waveguide having plate shapes and opposed to in a first direction, and a multilayer body provided in a space between them. The multilayer body includes a circular conductor foil sandwiched between two dielectric layers having a plate shape. A connecting portion is provided at one end of the propagation path of the waveguide. A communication hole to connect the propagation path with a space between the first waveguide and the second waveguide is provided on the other waveguide side of the one waveguide. The multilayer body is provided between the first waveguide and the second waveguide. In plan view in the first direction, the communication hole is located inside an inner wall of the propagation path and overlaps the propagation path and a center of the circular conductor foil.

The measurement device for measuring permeability and permittivity of an object, includes a probe in which a signal transmission line is formed and on which the object is capable of being disposed close to or in contact with the signal transmission line; a magnetic-field application unit configured to apply a magnetic-field to the object; a signal measurement instrument configured to measure a signal transmitted through the signal transmission line in each state in which the object is disposed and not disposed on the signal transmission line and in each state in which the magnetic-field is applied and not applied; a permeability processing unit configured to obtain the permeability of the object; and a permittivity processing unit configured to obtain the permittivity of the object, the both units obtaining based on the signal transmitted through the signal transmission line in each state in which the magnetic-field is applied and not applied.

Described herein is Complex Dielectric Constant Sensor (CDCS) incorporating microstrip based radial stub and open circuit stub pair structures that utilize interference coupling between degenerate EIT modes to detect CDC of sample-under-test (SUT). In at least one embodiment, CDCS generates two distinct EIT modes when sensor is unloaded. In at least one embodiment, coupling between resonator modes and interaction of electromagnetic fields with material is affected indicating presence of dielectric sample. In at least one embodiment, two EIT modes become degenerate, causing cancellation and suppressing transparency window when dielectric constant of SUT matches a specific value. In at least one embodiment, CDCS can detect slight changes in complex dielectric properties of SUT. In at least one embodiment, CDCS can characterize materials such as substrate samples based on their CDCs for design and characterization of microwave devices, antennas, and thin film devices.