Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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31/00
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/28
Testing of electronic circuits, e.g. by signal tracer
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G01R31/317
Testing of digital circuits
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G01R31/3183
Generation of test inputs, e.g. test vectors, patterns or sequences
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G01R31/318342
by preliminary fault modelling, e.g. analysis, simulation
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G01R31/31835
Analysis of test coverage or failure detectability
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