Thermal conditions can be simulated for an electronic device. Application developers may want to test how applications perform under various thermal conditions on a device that includes thermal management. The application developers can use the tests to determine whether the application should take proactive measures to maintain application performance, and which proactive measures should be taken. For example, an application can reduce its use of resources to ensure that an application maintains a desired quality of user experience (and at a minimum remains responsive) under adverse thermal conditions. Creating adverse conditions can be difficult to replicate, costly to implement, and can potential cause damage to the electronic device being tested. In some examples, simulating thermal conditions can be used instead of placing the device in real-world adverse conditions to improve the testing process for developers.

A computer executable tool analyzes Boolean logic in a gate-level netlist with simulated values and efficiently determines whether a subset of the netlist produces real Xs or not. If whether the netlist produces real Xs or not cannot be quickly determined, further formal analysis needs to be performed, and this step can be time-consuming. By quickly determining whether real Xs are produced, the use of time-consuming formal methods can be reduced, thus reducing X-pessimism analysis time.

It is determined, if a simulated hardware signal of a design for an electronic circuit has an influence on a checker for simulation errors. To achieve this, a checker control flow database is generated for a static code description containing checkers and concerned simulated signals. Further, a database based on the output of instrumented verification code is generated, thus gaining dynamic information about the verification code. Herein, the hardware signal values will be associated with colored values or, alternatively, attributed values. For the checkers in the checker control flow database, a list of attributes is generated and stored. Based on the above operations, a hardware signal database is generated, wherein hardware signals are mapped to a list of checkers, based on determining, for each checker in the checker database, the associated hardware signals from its list of attributed values.

It is determined, if a simulated hardware signal of a design for an electronic circuit has an influence on a checker for simulation errors. To achieve this, a checker control flow database is generated for a static code description containing checkers and concerned simulated signals. Further, a database based on the output of instrumented verification code is generated, thus gaining dynamic information about the verification code. Herein, the hardware signal values will be associated with colored values or, alternatively, attributed values. For the checkers in the checker control flow database, a list of attributes is generated and stored. Based on the above operations, a hardware signal database is generated, wherein hardware signals are mapped to a list of checkers, based on determining, for each checker in the checker database, the associated hardware signals from its list of attributed values.

A computer executable tool analyzes a gate-level netlist and uses an analysis result for accelerating a timing-accurate gate-level logic simulation via a parallel processing. The analysis identifies the following elements in the gate-level netlist: (1) netlist wires at partition boundaries for a value propagation; (2) netlist wires whose activities should be suppressed for a better performance; and (3) upstream FFs for partition boundaries to reduce a synchronization overhead. This information is then used to improve a parallel simulation performance.

For example, a macro model of a semiconductor integrated circuit device is used in a circuit design simulator, and comprises a plurality of functional blocks and a characteristic setting block. The functional blocks are each configured to cause the circuit design simulator to show approximate representation or equivalent representation of the characteristic of the semiconductor integrated circuit device. The characteristic setting block sets at least one of a plurality of internal parameters provided in the functional blocks by using array data derived from evaluation measurement data obtained by actual measurement of the semiconductor integrated circuit device.

Methods and systems for verifying, via formal verification, a hardware design for a data transformation pipeline comprising one or more data transformation elements that perform a data transformation on one or more inputs, wherein the formal verification is performed under conditions that simplify the data transformations calculations that the formal verification tool has to perform. In one embodiment the hardware design for the data transformation pipeline is verified by formally verifying that the output of an instantiation of the hardware design produces the same output as an instantiation of a hardware design for another data transformation pipeline for a predetermined set of transactions under a constraint that substantially equivalent data transformation elements between the data transformation pipelines produce the same output(s) in response to the same input(s).

Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.

Disclosed herein are computer-implemented method, system, and computer-program product (non-transitory computer-readable storage medium) embodiments for automatic test-pattern generation (ATPG) validation. An embodiment includes parsing an ATPG input, semantically analyzing the ATPG input, generating a first HDL model based on the semantic analysis, creating an HDL testbench based on the first HDL model, simulating an ATE test of a circuit structure, and outputting a validation result of the circuit structure, based on the simulating. In some embodiments, the parsing may include lexical and/or syntactic analysis. The HDL model may represent the circuit structure as functionally equivalent to the ATPG input, as determined based on the semantic analysis. In some embodiments, the ATPG input includes a cycle-based test pattern for a first block of the ATPG input, and the HDL testbench includes event-based test patterns that mimic given ATE behavior. The HDL model may be smaller in size than the ATPG input.

The invention refers to an apparatus for testing a circuit, including: an interrupter configured for interrupting based on a circuit model describing at least a part of the circuit a connection between two components of the circuit, wherein the circuit model describes the two components connected by the connection, an inserter configured for inserting based on the circuit model a test element model into the interrupted connection, and an evaluator configured for evaluating based on the circuit model and the test element model a response of the circuit model to the inserted test element model. The invention also refers to a corresponding method.