Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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31/00
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/28
Testing of electronic circuits, e.g. by signal tracer
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G01R31/317
Testing of digital circuits
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G01R31/3185
Reconfiguring for testing, e.g. LSSD, partitioning
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G01R31/318505
Test of Modular systems, e.g. Wafers, MCM's
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G01R31/318508
Board Level Test, e.g. P1500 Standard
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