Systems, methods, and computer readable medium described herein relate to techniques for characterizing and/or anomaly detection in integrated circuits such as, but not limited to, field programmable gate arrays (FPGAs) and application-specific integrated circuits (ASICs). In one example aspect of certain example embodiments, a fully digital technique relies on the pulse width of signals propagated through a path under test. In another example aspect, the re-configurability of the integrated circuit is leveraged to combine the pulse propagation technique with a delay characterization technique to yield better detection of certain type of Trojans and the like. Another example aspect provides for running the test through reconfigurable path segments in order to isolate and identify anomalous circuit elements. Yet another example aspect provides for performing the characterization and anomaly detection without requiring golden references and the like.

Diagnosing whether controllers of internal vehicle systems are the source of failures detected by a system control managing a vehicle such as a spacecraft. Highspeed data is received via at a field programmable gate array (FPGA) embedded in an assembly of the vehicle. The FPGA includes a controller and a digital diagnostic interface. In one embodiment, the diagnostic interface utilizes Very Highspeed Integrated Circuit (VHSIC) Hardware Description Language (VHDL) for performance modeling of a controller configured to control at least one internal system within the vehicle. The VHDL performance models the controller. Upon receiving an indication of a failure, the performance modeling of the controller is used to ascertain whether or not the controller is the source of the failure. Disassembly of the assembly housing the internal system is not required in order to ascertain whether or not the controller is the source of the failure.

The present invention provides an improved testing of a complex device under test, in particular a parallel analysis of signals of a device under test. Multiple signals of the device under test may be acquired and characteristic parameters of the acquired signals may be determined. The determined characteristic parameters of the multiple signals may be stored. In particular, the characteristic parameters may be stored in form of an array, table or spread sheet.

Configuration values for Lookup tables (LUTs) and programmable routing switches in an FPGA are provided by means of a number of flip flops arranges in a shift register. This shift register may receive test values in a factory test mode, and operational configuration values (implementing whatever functionality the client requires of the FPGA) in an operational mode. The bitstreams are provided at one end of the shift register, and clocked through until the last flip flop receives its value. Values may also be clocked out at the other end of the shift register to be compared to the initial bitstream in order to identify corruption of stored values e.g. due to radiation exposure. A clock gating architecture is proposed for loading data to or reading data from specific selected shift registers.

Methods and apparatus relating to diagnostic testing of FPGAs for safety critical systems are described. In an embodiment, logic circuitry (e.g., a processor) performs one or more diagnostic operations on a portion of a Field Programmable Gate Array (FPGA) based on one or more test vectors. Memory stores the one or more test vectors. The logic circuitry performs the one or more diagnostic operations on the portion of the FPGA during runtime. Other embodiments are also disclosed and claimed.

A method for detecting errors of a first field-programmable gate array (FPGA) program includes: receiving, by a monitoring program executed on a processor connected to an FPGA on which the first FPGA program is executed, a signal value read out from the first FPGA program; and comparing, by the monitoring program executed on the processor, the signal value to a reference value from a source other than the first FPGA program in order to detect errors of the first FPGA program.

An integrated circuit comprising a field programmable gate array including a plurality of logic tiles, wherein, during operation, each logic tile is configurable to connect with at least one other logic tile, and wherein each logic tile includes: (1) a normal operating mode and test mode, (2) an interconnect network including a plurality of multiplexers, wherein during operation, the interconnect network of each logic tile is configurable to connect with the interconnect network of at least one other logic tile in the normal operating mode and (3) bitcells to store data. The FPGA also includes control circuitry, electrically connected to each logic tile, to configure each logic tile in a test mode and enable concurrently writing configuration test data into each logic tile of the plurality of logic tiles when the FPGA is in the test mode.

A configuration and testing method and system for an FPGA chip using a bumping process are disclosed, the method includes creating configuration files for an FPGA chip under test and storing them in a memory; reading, by a master FPGA, a configuration code stream of corresponding configuration codes from the mass memory, configuring the FPGA chip under test via an external test interface, and determining whether the configuration is successful; if the configuration is successful, converting the configuration code stream into a test signal source file that is recognizable, executable and reusable by multiple pieces of test equipment by a developed algorithm and a conversion tool; and automatically loading the test signal source file onto the FPGA chip under test in real time by advanced test equipment.

Provided are a test board and a test system for efficiently testing a semiconductor package, and a manufacturing method for the semiconductor package using the same. A test apparatus includes a field programmable gate array (FPGA) configured to output a first data signal to be transmitted to the semiconductor device and a second data signal to be transmitted to the semiconductor device and a memory configured to store a test result. The FPGA includes a first input/output block configured to output the first data signal, a second input/output block configured to output the second data signal, a serializer/deserializer (SerDes) circuit configured to generate a strobe signal, and a skew calibration input/output block configured to receive the first data signal from the first input/output block, the second data signal from the second input/output block, and the strobe signal from the SerDes circuit.

A circuit includes a test data input (TDI) pin receiving a test data input signal, a test data out (TDO) pin outputting a test data output signal, and debugging test access port (TAP) having a test data input coupled to the TDI pin and a bypass register having an input coupled to the test data input of the debugging TAP. A multiplexer has inputs coupled to the TDI pin and the debugging TAP. A testing TAP has a test data input coupled to the output of the multiplexer, and a data register having an input coupled to the test data input of the testing TAP. The multiplexer switches so the test data input signal is selectively coupled to the input of the data register of the testing TAP so the output of the debugging TAP is selectively coupled to the input of the data register of the testing TAP.