A device includes one or more random number generator (RNG) cores (e.g., true random number generator cores) and a built-in self-test controller (BIST) configured to perform various fault tests on each RNG core. The tests include a stuck-at-1 fault test, a stuck-at-0 fault test, and a transition delay fault test. For those RNG cores that have multiple ring oscillators, each individual ring oscillator is fault tested by the BIST controller. For those RNG cores that have a multi-tap inverter chain configuration, the individual taps may be tested by the BIST controller. The RNG core also may comprise a bi-stable cell which can be tested by the BIST controller as well.

Embodiments of the disclosed technology comprise software-based techniques that can be used to improve scan chain test pattern generation and scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. Such embodiments can be used to generate a complete test setthat is, a set of chain diagnosis test patterns that is able to isolate any scan chain defect in a faulty scan chain to a single scan cell.

A method and circuit for implementing register array repair using Logic Built In Self Test (LBIST), and a design structure on which the subject circuit resides are provided. Register array repair includes identifying and creating a list of any repairable Register Arrays (RAs) that effect an LBIST fail result. Next a repair solution is detected for each of the repairable Register Arrays (RAs) isolating a failing location for the detected repair solution for each array.

Systems, methods, and circuitry are provided for a sorting array. In one example, a sorting array element includes an output register and control circuitry. The output register is configured to store an output value. In response to a cell under test (CUT) load signal the output register stores a CUT value and in response to a first register shift signal from a previous sorting array element the output register stores contents of an output register of the previous sorting array element. The control circuitry is configured to generate the CUT load signal and a second register shift signal for a subsequent sorting array element based on relative magnitudes of the CUT value, the output value, and an output value stored in the output register of the previous sorting array element.

The disclosure provides an electronic fuse (eFuse) device and an operation method thereof. The eFuse device includes an eFuse, a readout circuit, a register, and a safety control device. The readout circuit reads out target data recorded by the eFuse to the register and the safety control device. The safety control device compares the target data provided by the readout circuit with the target data provided by the register to determine whether a soft error occurs in the target data stored in the register. When the soft error occurs in the target data stored in the register, the readout circuit reads out the target data recorded by the eFuse again to the register and the safety control device.

A processing device (30, 710) for reducing scan traffic is provided. The processing device (30, 710) comprises one or more interfaces (32, 718) configured to transmit information to at least one register access interface (759, 761) and processing circuitry (34) configured to control the one or more interfaces. Further, the processing circuitry (34) is configured to obtain register parameters of at least one functional unit (760, 762) of a processing unit (750) and to generate an improved bulk register comprising the register parameters of the at least one functional unit.