Disclosed herein is a pseudo-random binary sequence (PRBS) generator (200) for performing on-chip testing. It comprises of a plurality of lanes (L1-L4), wherein each lane comprises a latch group (Lg1-Lg4) capable of receiving clock signals, wherein a number of latches in each latch group is based on an output sequence to be generated for performing the on-chip testing. Each latch group is having at least one of a flip-flop and a latch is further connected with a plurality of logic gates in such a manner that an output, generated by the at least one of the flip-flop and the latch of each latch group, is provided as an input to the plurality of logic gates.

In accordance with an embodiment, a system includes an oscillator equipped circuit having an oscillator control circuit configured to be coupled to an external oscillator and a processing unit comprising a clock controller. The clock controller includes an interface circuit configured to exchange handshake signals with the oscillator control circuit, a security circuit configured to receive the external oscillator clock signal and configured to select the external oscillator clock signal as the system clock, and a detection block configured to detect a failure in the external oscillator clock signal. Upon detection of the failure, a different clock signal is selected as the system clock and the interface circuit to interrupts a propagation of the external oscillator.

An Integrated Circuit (IC) includes a storage element and control circuitry. The control circuitry is configured to select, responsively to a scan-enable control, between a functional-data input and a scan-data input to serve as an input to the storage element, to selectively disable toggling of an output of the storage element, responsively to a clock-enable control, by gating a clock signal provided to the storage element, and, while the clock-enable control indicates that the output of the storage element is to be disabled from toggling, to select the input of the storage element to be the scan-data input.

A server Joint Test Action Group (JTAG) component adaptive interconnection system and method. The system includes a JTAG master device, a programmable device, and a plurality of JTAG components. The programmable device is configured to simulate JTAG timing according to a JTAG protocol and test JTAG channels of the JTAG components connected to the programmable device one by one. The programmable device connects in series a Test Data Output (TDO) signal of a previous JTAG component with a Test Data Input (TDI) signal of a next JTAG component in the programmable device, connects a TDI signal of a first JTAG component with a TDI signal of the JTAG master device, and connects a TDO signal of a last JTAG component with a TDO signal of the JTAG master device, so as to form a JTAG interconnection chain.

Embodiments are directed to a computer implemented method and system for the testing, characterization and diagnostics of integrated circuits. A system might include a device under test, such as an integrated circuit, that includes an adaptive microcontroller. The method includes loading a testing program for execution by the adaptive microcontroller, causing the microcontroller to execute the testing program. Once results from the testing program are received, the testing program can be adaptively modified based on the results. The modified testing program can be run again. The testing program can modify parameters of the integrated circuit that are not externally accessible. Other embodiments are also disclosed.

The present disclosure describes novel methods and apparatuses for directly accessing JTAG Tap domains that exist in a scan path of many serially connected JTAG Tap domains. Direct scan access to a selected Tap domain by a JTAG controller is achieved using auxiliary digital or analog terminals associated with the Tap domain and connected to the JTAG controller. During direct scan access, the auxiliary digital or analog terminals serve as serial data input and serial data output paths between the selected Tap domain and the JTAG controller.

A method is disclosed for synchronizing a checking apparatus, in which the checking apparatus is configured for testing at least one first electronic closed-loop control unit. Further disclosed is a checking apparatus which is transferable to a synchronized state. Additionally disclosed is a composite system which includes at least two checking apparatuses. Also disclosed are a checking apparatus for testing at least one first closed-loop control unit, and a composite system including at least one checking apparatus and a further checking apparatus, the latter checking apparatus being configured to have the same effect as the first checking apparatus.

During functional/normal operation of an integrated circuit including multiple independent processing elements, a selected independent processing element is taken offline and the functionality of the selected independent processing element is then tested while the remaining independent processing elements continue functional operation. To minimize voltage drops resulting from current fluctuations produced by the testing of the processing element, clocks used to synchronize operations within each partition of a processing element are staggered. This varies the toggle rate within each partition of the processing element during the testing of the processing core, thereby reducing the resulting voltage drop. This may also improve test quality within an automated test equipment (ATE) environment.

A method includes disconnecting a data bus connecting a test access port (TAP) controller of an integrated circuit (IC) chip to a plurality of test data registers deployed on the chip, simultaneously supplying test data to multiple test data registers among the plurality of test data registers, and storing test response data, received from the plurality of test data registers and responsive to the test data, in storage registers deployed on the chip.

A scan chain may be formed throughout an integrated circuit in which the scan chain is coupled to a set of pins via bi-directional input/output (I/O) buffers. A test pattern may be received from an external tester using the set of I/O pins and buffers operating in parallel. The test pattern is scanned into the scan chain using a shift clock operating at a first rate. The test pattern is then provided to combinatorial logic circuitry coupled to the scan chain. A response pattern is captured in the scan chain and then scanned from the scan chain using a shift clock operating at a second rate that is slower than the first rate. The response pattern is provided to the external tester using the same set of I/O pins and buffers operating in parallel.