A port protection network provided with a joint test action group (JTAG) core and method of use. The port protection network includes an agent device operatively connected with a streaming bus and a test access port (TAP) of the JTAG core. The port protection network also includes a master device operatively connected with the streaming bus and the TAP of the JTAG core. In the port protection network, the agent device is configured to selectively restrict access to the master device through the JTAG core.

Boundary scan system/method for live status monitoring of a circuit is described. Monitoring includes performing a boundary scan on a primary boundary scan compatible device, through a set of pins on a first circuit, providing a JTAG port on the first circuit for sending/receiving data to/from the set of pins, providing a secondary central processing unit, CPU, on a second circuit, and connecting the second circuit to the JTAG port to retrieve data from the primary boundary scan compatible device. The data on can be stored or and/or analysed by a secondary CPU.

The invention discloses an extended joint test action group based controller and a method for functional debugging using the extended joint test action group based controller. The object of the invention to lower the power dissipation (dynamic and leakage) but providing the same functionality of the testing and debugging procedures at the same time will be solved by an extended joint test action group (JTAG) controller for testing flip-flops of a register of an integrated circuit (IC) using a design for testing scan infrastructure on the IC which comprises at least one scan chain, wherein an external debugger is connected to the design for testing scan infrastructure via the JTAG controller which is extended by a debug controller, whereas a feedback loop is formed from an output of the scan chain to an input multiplexer of the scan chain which is activated according to the extended JTAG controller.

Disclosed are methods, systems and devices for implementing built-in self-test (BIST) to be performed by an untrusted party and/or in an unsecure testing environment. In an embodiment, a test access port (TAP) on a device may enable a party to initiate execution of one or more BIST procedures on the device. Additionally, such a TAP may enable loading of encrypted instructions to be executed by one or more processors formed on a device under test.

A controller for a memory component comprises a processing unit and at least one memory unit coupled to the processing unit, the memory unit comprising at least a first area for storing a user firmware and a second area for storing a controller firmware; the processing unit is configured to capture a memory address of a program instruction to be executed, compare the memory address with a reference value, and, based on that comparison, enable/restricting actions associated with the program instruction. A related memory component and related methods are also disclosed.

A method of forming a semiconductor device is disclosed including through-package debug features enabling debug of a BGA package while mounted to a printed circuit board or other host device. In one example, the through-package debug features are filled or plated vias extending from a surface of the semiconductor device, through a device housing, down to test pads on the substrate. In another example, the through-package debug features are open channels formed from a surface of the semiconductor device.

The present disclosure relates to a method wherein a state of an integrated circuit between a first state (e.g., CLOSED), allowing a reading access to the first area of fuse-type non-volatile memory by a processor, and a second state (e.g., OPEN), forbidding the reading access to the memory to the processor, is conditioned to a verification, by a finite state machine, of values of a first fuse word of the memory, representative of a number of transitions to the first state and of a second fuse word of the memory, representative of a number of transitions to the second state.

An on-chip debugging device and method is provided. The on-chip debugging device includes: an external interface module configured for outputting chip debugging state information to an external debugger and receiving a control instruction of the external debugger; a debugging mode control module configured for setting a to-be-sampled type of a specified chip internal signal and setting a debugging trigger condition according to the debugging configuration of the external debugger or the internal CPU; a debugging monitor module configured for sampling and recording the internal signal of the chip of the specified type so as to identify the running state of the chip; and a debugging information processing module configured for storing the running state of the chip in an internal debugging memory and sending it to the external debugger by the external interface module or sending it to the internal CPU via an internal bus. The on-chip debugging functions which are relatively simple, occupy less resources and have more powerful functions can be realized by the device and the method.

A test coverage rate improvement system for pins of tested circuit board and a method thereof are disclosed. In the system, partial pins of a circuit board connector in a tested circuit board are not electrically connected to the boundary scan chip, test pins of the test pin board are pressed with the partial pins by a fixture of a boundary scan interconnect testing workstation to electrically connect the test pins to the partial pins. A test access port controller receives a detection signal for detecting the partial pins, which are not electrically connected to the boundary scan chip, of the circuit board connector through the test pin board from the test adapter card, and determines whether conduction is formed based on the detection signal, thereby achieving the technical effect of improving a test coverage rate for the pins of the tested circuit board.

The invention discloses an interface system for an interconnected die and an MPU and a communication method thereof. The system comprises a data interface, an interrupt interface, and a debugging interface; the data interface comprises an SPI interface, a DDR data interface, and a DMA control interface; the interrupt interface is used for receiving an interrupt data packet from the network and parsing the interrupt data packet to obtain a pulse interrupt input required by the MPU; the debugging interface comprises a JTAG-Core debugging interface, which is used for receiving a debugging data packet from the network and translating the debugging data packet into a JTAG protocol for MPU debugging. The invention realizes the expansion of the master device MPU in the high-performance information processing microsystem and the high-speed communication between the master device and the interconnected dies.