A system for programming integrated circuit (IC) dies formed on a wafer includes a magnetic field transmitter that outputs a digital test program as a magnetic signal. At least one digital magnetic sensor (e.g., Hall effect sensor) is formed with the IC dies on the wafer. The digital magnetic sensor detects and receives the magnetic signal. A processor formed on the wafer converts the magnetic signal to the digital test program and the digital test program is stored in memory on the wafer in association with one of the IC dies. The magnetic field transmitter does not physically contact the dies, but can flood an entire surface of the wafer with the magnetic signal so that all of the IC dies are concurrently programmed with the digital test program.

Disclosed is a device for testing of far-field wireless charging, including a first transceiver configured to conduct a far-field wireless power transfer between the device and a device under test, DUT; a second transceiver configured to conduct a data transfer between the device and the DUT; and a processor configured to establish a figure of merit of a wireless charging of the DUT in dependence of the power transfer and the data transfer.

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system comprises pre-qualifying test components, functional test components, a controller, a transceiver, and a switch. The pre-qualifying test components are configured to perform pre-qualifying testing on a device under test. The functional test components are configured to perform functional testing on the device under test. The controller is configured to direct selection between the pre-qualifying testing and functional testing. The transceiver is configured to transmit and receive signals to/from the device under test. The switch is configured to selectively couple the transceiver to the pre-qualifying test components and functional test components.

A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.

The present disclosure provides a method of testing a single device under test (DUT) through multiple cores in parallel, which includes steps as follows. The test quantity of the DUT is calculated; the test quantity of the DUT is evenly allocated to to a plurality of test cores, so as to control a period of testing the DUT through the test cores in parallel.

Embodiments of the present invention provide an RF probe for coupling out a probe signal from a transmission line of a circuit. The RF probe includes at least two probe pins having first ends for contacting the circuit and second ends. Furthermore, the RF probe includes a provider for providing a variable impedance at the second ends of the probe pins. The RF probe is configured to provide the probe signal based on a signal propagating along at least one of the probe pins.

A test equipment has a signal input/signal output and a use-site calibration unit for determining a user-site compensation function. The user-site compensation function has a compensation magnitude function and a compensation Hilbert phase function. The calibration unit has a level meter and a calculator. The level meter is configured to measure a magnitude characteristic of the electrical signal, the magnitude characteristic being the basis for the determination of the compensation Hilbert phase function. The calculator is configured to determine a Hilbert phase characteristic of the electrical signal based on a Hilbert transformation of a function dependent on the measured magnitude characteristic and to determine the compensation Hilbert phase function on the basis of the Hilbert phase characteristic.

In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to the test instrument, and that is programmed to control operation of the test instrument, a second processing system that is dedicated to device testing, the second processing system being programmable to run one or more test programs to test the device, and programmable logic configured to act as an interface between the test instrument and the device, the programmable logic being configurable to perform one or more tests on the device. The first processing system and the second processing system are programmable to access the device via the programmable logic.

A measurement instrument for testing a device under test is described. The device under test has at least two test points. The measurement instrument includes a first measurement channel, a second measurement channel, and a machine-learning circuit. The first measurement channel is configured to process a first input signal associated with one of the at least two test points, thereby generating a first measurement signal. The second measurement channel is configured to process a second input signal associated with another one of the at least two test points, thereby generating a second measurement signal. The machine-learning circuit is configured to determine at least one correlation quantity based on the first measurement signal and based on the second measurement signal, wherein the at least one correlation quantity is indicative of a correlation between the first measurement signal and the second measurement signal. Further, a measurement system and a signal processing method are described.

A system to classify signals includes an input to receive incoming waveform data; a memory, and one or more processors configured to execute code to cause the one or more processors to: generate a ramp sweep signal from the incoming waveform data, locate a data burst in the incoming waveform data using a burst detector, receive a signal from the burst detector to cause the memory to store cyclic loop image data in the form of the incoming waveform data as y-axis data and the ramp sweep signal as x-axis data, and employ a machine learning system to receive the cyclic loop image data and classify the data burst. A method of classifying signals includes generating a ramp sweep signal from incoming waveform data, locating a data burst in the incoming waveform data, storing cyclic loop image data for the data burst in the form of the incoming waveform data as Y-axis data and the ramp sweep signal as X-axis data, and using a machine learning system to receive the cyclic loop image and classify the data burst.