The invention concerns a test program executor for an Automated Test Equipment, wherein the test program executor is configured to execute a test flow having a plurality of test suites, wherein the test program executor is configured to asynchronously execute the plurality of test suites, wherein a test suite contains a call of a function of a subsystem, wherein the function of the subsystem is related with a subsystem operation that is to be executed by the subsystem, and to signal a call of a function of a subsystem by transmitting an asynchronous request to the subsystem, the asynchronous request having a call-specific call tree hierarchy address and the call-specific operation to be executed by the subsystem, and wherein the test program executor is further configured to determine an execution order of the subsystem operations, such that the execution order of the subsystem operations depends on their call-specific call tree hierarchy addresses.

A measurement apparatus (1) comprising at least one shielded electronic measurement circuit (2) configured to measure and process electrical signals and a user interface (6) used by a user to interact with the electronic measurement circuits (2) of said measurement apparatus (1), wherein the user interface (6) comprises at least one adaptable graphical user interface (6A) projected by a projection unit (7) of said measurement apparatus on one or several projection areas.

A digital sampling oscilloscope (DSO) includes a housing, an analog measurement input interface arranged in a housing wall of the housing and a measurement acquisition system having a digitizer and an acquisition memory coupled to the digitizer. The measurement acquisition system is integrated into the housing and coupled to the analog measurement input interface. The DSO further includes a signal generator integrated into the housing. An operation mode control signal output interface is arranged in a housing wall of the housing. The signal generator is coupled to the operation mode control signal output interface and is configured to output an operation mode control signal to a device under test (DUT) connected to both the operation mode control signal output interface and the analog measurement input interface for controlling a test operation mode of the DUT.

Provided are a measurement system that has a plurality of measurement modules and is capable of creating a program of each measurement module easily and a method of creating a program therefor. A measurement system 100 includes a first and second measurement modules 120 and 130, and a controller 102 controlling thereof, in which the controller includes a first processor, a first memory and a first timer; the first measurement module includes a second processor, a second memory, and a second timer; and the second measurement module includes a third processor, a third memory, a third timer; the controller further includes a first function column including one or more execution steps of a first function sequence to be executed by the first measurement module, and a second function column including one or more execution steps of a second function sequence to be executed by the second measurement module, the second function column being adjacent in a first adjacent direction of the first function column.

Technologies are described herein for enabling the automated testing of remote control units by providing a suitable test system that includes a plurality of test stations for simultaneously testing a plurality of remote control units. Each test station includes features that allow it to interact with the remote control unit's inputs, such as buttons and microphone, and outputs, such as IR and RF remote control codes, status LEDs, and audio output. Each test station may be controlled by a controller that executes test scripts or other routines that exercise the functionality of the remote control unit as desired.

An electronic test equipment apparatus includes a power terminal configured to receive power, an interface for a device under test (DUT), at least one power transistor connected in series between the power terminal and the interface for the DUT, and a protection circuit. The protection circuit is configured to: switch on the at least one power transistor, to electrically connect the power terminal to the DUT through the interface as part of a test routine; and subsequently automatically switch off the at least one power transistor after a predetermined delay, to electrically disconnect the power terminal from the DUT regardless of whether the DUT passes or fails the test routine. A voltage clamp circuit for electronic test equipment and corresponding methods of testing devices using such electronic test equipment are also described.

Recording of a control command sequence related to multiple devices. Each of the multiple devices may receive user input by a user inter-face, and the received user input may be converted to appropriate control commands. Timestamp information is assigned to each control command, and the control commands of the multiple devices are merged together to a common control command sequence based on the assigned timestamp information.

Disclosed is a test and measurement instrument including a plurality of ports. The ports are configured to source a test signal into a device under test (DUT), and receive a signal response from the DUT. The test and measurement instrument also includes a measurement unit configured to measure the signal response. The test and measurement instrument further includes a processor configured to compare the signal response to a data structure. The processor also determines a classification of, and/or connections to, at least one DUT component coupled to at least one of the ports based on results of the comparison.

The present invention provides an improved testing of a complex device under test, in particular a parallel analysis of signals of a device under test. Multiple signals of the device under test may be acquired and characteristic parameters of the acquired signals may be determined. The determined characteristic parameters of the multiple signals may be stored. In particular, the characteristic parameters may be stored in form of an array, table or spread sheet.

A digital sampling oscilloscope (DSO) includes a housing, an analog measurement input interface arranged in a housing wall of the housing and a measurement acquisition system having a digitizer and an acquisition memory coupled to the digitizer. The measurement acquisition system is integrated into the housing and coupled to the analog measurement input interface. The DSO further includes a signal generator integrated into the housing. An operation mode control signal output interface is arranged in a housing wall of the housing. The signal generator is coupled to the operation mode control signal output interface and is configured to output an operation mode control signal to a device under test (DUT) connected to both the operation mode control signal output interface and the analog measurement input interface for controlling a test operation mode of the DUT.