G06F11/1052

Semiconductor device with user defined operations and associated methods and systems
11379299 · 2022-07-05 · ·

Memory devices, systems including memory devices, and methods of operating memory devices are described, in which a memory device may select an option for a host device to access a memory array including a first portion configured to store user data and a second portion configured to store different data based on whether an ECC function of the memory device is enabled or disabled—e.g., storing ECC data when the ECC function is enabled, storing additional user data, metadata, or both when the ECC function is disabled. The host device may disable the ECC function and transmit an input to the memory device as to how to access the memory array. The memory device, based on the input, may select the option for the host device to access the memory array and communicate with the host device in accordance with the selected option.

MEMORY CONTROLLER FOR IMPROVING DATA INTEGRITY AND PROVIDING DATA SECURITY AND A METHOD OF OPERATING THEREOF

A memory controller for improving data integrity and providing data security. The memory controller including a transmit data path to transmit write data to a memory device, the transmit data path comprising a scrambling component, wherein the scrambling component includes a scrambling logic and an exclusive OR logic, wherein the write data is divided into a first portion and a second portion, wherein input of the scrambling logic comprises the first portion of the write data and an address associated with the write data to generate a pseudo-random output, and wherein input of the exclusive OR logic comprises the second portion of the write data, the pseudo-random output and a fixed seed corresponding to the first portion of the write data to generate a scrambled data.

Bypassing error correction code (ECC) processing based on software hint

Methods and apparatus relating to techniques for avoiding cache lookup for cold cache. In an example, an apparatus comprises logic, at least partially comprising hardware logic, to receive metadata from an application, wherein the meta data indicates one or more processing operations which can accommodate a predetermined level of bit errors in read operations from memory, determine, from the metadata, pixel data for which error correction code bypass is acceptable, and generate one or more error correction code bypass hints for subsequent cache access to the pixel data for which error correction code bypass is acceptable, and transmit the one or more error correction code bypass hints to a graphics processing pipeline. Other embodiments are also disclosed and claimed.

SEMICONDUCTOR DEVICE WITH MODIFIED COMMAND AND ASSOCIATED METHODS AND SYSTEMS
20220091938 · 2022-03-24 ·

Memory devices, systems including memory devices, and methods of operating memory devices are described, in which a host device may directly access a portion of memory array that is otherwise reserved for ECC functionality of a memory device. The memory array may correspond to a set of memory addresses, where each memory address of the set corresponds to a first portion of the memory array (e.g., user data plane) and to a second portion of the memory array (e.g., ECC plane). The second portion may be configured to store ECC data or second user data or metadata based on whether the ECC functionality is enabled or disabled. The memory device may determine a command directed to the memory address of the set is configured to access the first portion or the second portion based on a status of a pin associated with the command.

EXTENDED ERROR DETECTION FOR A MEMORY DEVICE
20210311829 · 2021-10-07 ·

Methods, systems, and devices for extended error detection for a memory device are described. For example, during a read operation, the memory device may perform an error detection operation capable of detecting single-bit errors, double-bit errors, and errors that impact more than two bits and indicate the detected error to a host device. The memory device may use parity information to perform an error detection procedure to detect and/or correct errors within data retrieved during the read operation. In some cases, the memory device may associate each bit of the data read during the read operation with two or more bits of parity information. For example, the memory device may use two or more sets of parity bits to detect errors within a matrix of the data. Each set of parity bits may correspond to a dimension of the matrix of data.

SEMICONDUCTOR DEVICE WITH MODIFIED ACCESS AND ASSOCIATED METHODS AND SYSTEMS

Memory devices, systems including memory devices, and methods of operating memory devices are described, in which a host device may access a group of memory cells (e.g., portion of an array configurable to store ECC parity bits) otherwise reserved for ECC functionality of a memory device. The memory device may include a register to indicate whether its ECC functionality is enabled or disabled. When the register indicates the ECC functionality is disabled, the memory device may increase a storage capacity available to the host device by making the group of memory cells available for user-accessible data. Additionally or alternatively, the memory device may store metadata associated with various operational aspects of the memory device in the group of memory cells. Moreover, the memory device may modify a burst length to accommodate additional information to be stored in or read from the group of memory cells.

SEMICONDUCTOR MEMORY DEVICES AND MEMORY SYSTEMS

A semiconductor memory device includes a memory cell array, an error correction code (ECC) engine circuit, an error information register and a control logic circuit. The memory cell array includes memory cell rows. The control logic circuit controls the ECC engine circuit to generate an error generation signal based on performing a first ECC decoding on first sub-pages in a first memory cell row in a scrubbing operation and based on performing a second ECC decoding on second sub-pages in a second memory cell row in a normal read operation on the second memory cell row. The control logic circuit records error information in the error information register and controls the ECC engine circuit to skip an ECC encoding and an ECC decoding on a selected memory cell row of the first memory cell row and the second memory cell row based on the error information.

DATA PROCESSING SYSTEM, MEMORY CONTROLLER THEREFOR, AND OPERATING METHOD THEREOF
20210311831 · 2021-10-07 ·

A data processing system may include a memory module; and a controller configured to exchange data with the memory module in response to a request received from a host. The controller divide a first data into a first data group to error correction and a second data group not to error correction in response to the first data and a first data write request received from the host, generates a first meta data for error correction for the first data group, configures a first data chunk that includes the first data and the first meta data, and transmits the first data chunk to the memory module.

Operating method of memory controller, memory controller, and storage device

An operating method of a memory controller to update metadata using journaling data in a short time during a booting operation, and to maintain reliability of the updated metadata. The operating method of a memory controller includes loading metadata into sub-regions of a buffer memory, updating the metadata using journaling data in a state that error correction code (ECC) functions of memory controller for the sub-regions are disabled, generating a first parity data of data stored in the first sub-region, and enabling the ECC function of the first sub-region, after the first parity data is generated.

Digit validation check control in instruction execution

Digit validation check control for execution of an instruction. A process obtains an instruction to perform operation(s) using input value(s). The instruction includes a no validation indicator for controlling whether digit validation check control is enabled for execution of the instruction. The process executes the instruction, including determining, based on the no validation indicator, whether digit validation check control is enabled for execution of the instruction, and performing processing based on the determining. Based on the no validation indicator being set to a defined value, digit validation check control is enabled and the processing includes forcing a digit check error indicator output by the executing to indicate no digit check error with respect to the at least one input value.