A memory system includes a non-volatile memory and a controller that includes a toggle encoder configured to encode first data having a first bit length and a first number of toggles, into second data having a second bit length longer than the first bit length and a second number of toggles smaller than the first number of toggles, and transmit the second data to the non-volatile memory. The memory system may further include a toggle decoder configured to decode third data received from the non-volatile memory into fourth data, the third data having the second bit length and the second number of toggles and the fourth data having the first bit length and the first number of toggles.

A self-correcting memory device (SCMD) includes a non-destructive memory array that includes memory cells arranged in rows and columns that includes a storage section, a comparison section, a comparing element, a selective write unit and a row decoder. The storage section stores a first copy, a second copy and a third copy of a data item in physically separated columns. The comparison section temporarily stores the first copy in a first row and the second copy in a second row. The comparing element compares between bits of the first and second rows and provides at least one per bit change indication. The selective write unit receives at least one per bit change indication and fetches from the third copy a correct value for each bit having a positive bit change indication. The row decoder concurrently writes each correct value back to its bit location in the first and second copies.

A memory system includes: a memory device including a plurality of pages; and a controller suitable for generating a read descriptor in response to an entered command, reading and outputting read data stored in at least one page in response to the read descriptor, determining whether each per-page data of the read data includes an error, storing indicators for showing whether each per-page data includes the error, re-reading some of the read data on per-page basis, based on the indicators, without generating another read descriptor, and updating the indicators based on an error check result after the re-reading.

A memory system includes a buffer suitable for buffering victim block information, a queue suitable for queuing the victim block information, a scheduling unit suitable for detecting a read reclaim safety period and generating a trigger signal, a queue management unit suitable for detecting a remaining capacity of the queue during the safety period, a buffer management unit suitable for queuing as much of the buffered victim block information in the queue, as the remaining capacity of the queue during the safety period, and an execution unit suitable for performing a read reclaim operation based on the queued victim block information during the safety period.

A dynamic random access memory (DRAM) device includes an on-die termination (ODT) controller including an input to receive an ODT signal from a memory controller, and ODT circuitry to terminate an interface circuit, the interface circuit to provide a data signal between the memory controller and the DRAM device. The ODT controller is configured in a first impedance switching mode to terminate the interface circuit at a first impedance level in response to a first state of the ODT signal, to terminate the interface circuit at a second impedance level in response to a second state of the ODT signal, and to terminate the interface circuit at a third impedance level in response to a change in the ODT signal from the first state to the second state, the third impedance level being between the first impedance level and the second impedance level.

Aspects of the present disclosure configure a memory sub-system to track error-correction parity calculations in the memory sub-system. For example, a memory sub-system controller of the memory sub-system can generate and use a first data structure to map one or more data chunks of an open data block to one or more buffers in a set of buffers for temporary storage of partial parity calculation results for the one or more data chunks, and generate and use a second data structure to map one or more data chunks of an open data block to one or more memory locations on non-volatile memory space (implemented by a set of memory components) for persistent storage of partial panty calculation results for the one or more data chunks.

Methods, systems, and devices for erroneous bit discovery in a memory system are described. A controller or memory controller, for example, may read a code word from a memory medium. The code word may include a set of bits that each correspond to a respective Minimum Substitution Region (MSR) of the memory medium. Each MSR may include a portion of memory cells of the memory medium and be associated with a counter to count a quantity of erroneous bits in each MSR. When the controller identifies a quantity of erroneous bits in the code word using an error control operation, the controller may update values of counters associated with respective MSRs that correspond to the quantity of erroneous bits to count erroneous bit counts for each MSR. In some cases, the controller may perform operations described herein as part of a background operation.

An integrated circuit includes intellectual property (IP) processing circuitries each including a separate, respective at least one scan chain, and temperature management controller circuitry configured to transmit an input pattern including a plurality of bits to at least one scan chain of a first IP processing circuitry among the IP processing circuitries, detect a temperature of the first IP processing circuitries based on an output pattern received from the at least one scan chain in response to the input pattern being transmitted to the at least one scan chain of the first IP processing circuitry, and control at least one of an operation frequency or an operation voltage of the first IP processing circuitry based on the detected temperature of the first IP processing circuitry.

A method for operating a semiconductor memory device may include applying a program pulse for programming data of a first page included in the semiconductor memory device. The method may include determining whether the number of times of applying the program pulse has exceeded a first critical value. The method may include performing an error bit check on a second page coupled to the same word line as the first page, based on the determined result of whether the first critical value has been exceeded.

A self-correcting memory device (SCMD) includes a non-destructive memory array that includes memory cells arranged in rows and columns that includes a storage section, a comparison section, a comparing element, a selective write unit and a row decoder. The storage section stores a first copy, a second copy and a third copy of a data item in physically separated columns. The comparison section temporarily stores the first copy in a first row and the second copy in a second row. The comparing element compares between bits of the first and second rows and provides at least one per bit change indication. The selective write unit receives at least one per bit change indication and fetches from the third copy a correct value for each bit having a positive bit change indication. The row decoder concurrently writes each correct value back to its bit location in the first and second copies.