A test device for testing electric characteristics of an object to be tested. The test device includes: a first support member comprising a plurality of guide holes; a second support member comprising a plurality of terminal holes and arranged to be spaced apart from and in parallel with the first support member; a plurality of main contact probes; and a plurality of sub contact probes arranged to be adjacent to the main contact probes along a lengthwise direction. According to the present disclosure, contact reliability is improved by multi contact with the terminal of the test circuit board (interposer) and/or the object to be tested.

A reduced pin count (RPC) device includes an electrical circuitry in a package with uniformly distributed leads, a subset of the leads being electrically disconnected form the circuitry. A contactor pin block with sockets corresponding to the uniformly distributed leads has the sockets corresponding to the leads with electrical connections filled with test pins suitable for contacting respective leads, and the sockets corresponding to the electrically disconnected leads voided of test pins. Dummy plugs are inserted into the voided sockets to block the sockets and prevent accidental insertions of test pins.

An electrical connection device includes: a plurality of probes (10) in which distal end portions contact an inspection object (2) during measurement; and a space transformer (30) including a plurality of connection wirings (33), in each of which a first terminal electrically connected to any of proximal end portions of the plurality of probes (10) is arranged on a first main surface (301), and a second terminal is exposed to a second main surface (302), and having a short-circuit wiring pattern formed on the first main surface, the short-circuit wiring pattern electrically connecting, to the same connection wiring (33), proximal end portions of a plurality of same-potential probes (10) set at a same potential during measurement among the plurality of probes (10).

An electrical connection device includes: a probe head (20) including a guide hole (200), in which a shape perpendicular to an extending direction of the guide hole (200) is a shape formed by round-chamfering corner portions of a polygonal shape; and a probe (10) held by the probe head (20) in a state of penetrating the guide hole (200), wherein notches which go along an axial direction of the probe (10) are formed on angle regions of the probe (10), the angle regions facing the corner portions (200C) of the guide hole (200).

A rectangular probe of a probe card device includes an upper positioned segment, an upper contacting segment, a deformable segment, a lower positioned segment, and a lower contacting segment. The upper positioned segment includes an offset portion, a first positioned portion extending from the offset portion along a first direction, and a second positioned portion extending from a second direction being parallel to and opposite to the first direction. In a width direction perpendicular to the first direction, a width of the first positioned portion is 25%-95% of a width of the offset portion, and a width of the second positioned portion is 25%-95% of the width of the offset portion. The upper contacting segment extends from the first positioned portion along the first direction. The deformable segment, the lower positioned segment, and the lower contacting segment sequentially extend from the second positioned portion along the second direction.

Methods and apparatus are described relating to a probe assembly having a probe head securing mechanism that includes a lock ring housing and a lock ring disposed in the lock ring housing. In an example, a probe assembly includes a rigid substrate, a circuit board coupled to the rigid substrate, and a probe head securing mechanism. The probe head securing mechanism includes a lock ring housing and a lock ring disposed within the lock ring housing. The circuit board has a surface. The lock ring housing is coupled to the rigid substrate. The circuit board is disposed between the lock ring housing and the rigid substrate. The lock ring is rotatable relative to the lock ring housing. Rotation of the lock ring is configured to move the lock ring in a direction perpendicular to the surface of the circuit board.

A probe card device and a rectangular probe thereof are provided. The rectangular probe includes a branch segment, a first contacting segment and a second contacting segment. The branch segment is ring-shaped and has a perforation, and the branch segment includes two branch arms respectively located at two sides of the perforation. The first contacting segment is located at a side of the branch segment and is pierced through a first through hole of a first guide plate. The second contacting segment is located at the other side of the branch segment. A maximum width portion of the branch segment has a variable width greater than a hole size of the first through hole, and the two branch arms of the branch segment are compressible to enable the variable width to be less than or equal to the hole size of the first through hole.

The inspection jig includes a rigid substrate, a flexible substrate connected to the rigid substrate, a contactor block for supporting a part of the flexible substrate in a state that the part of the flexible substrate is protruded with respect to the rigid substrate, a contactor provided on a protruding portion of the flexible substrate, and a spring probe supported by the contactor block, one end of which is in contact with a contact pad provided on a lower surface of the rigid substrate, and the other end of which protrudes from a protruding portion of the flexible substrate.

Illustrative embodiments disclosed herein pertain to a testing apparatus for performing in-circuit tests upon a printed circuit board assembly. Each of these tests may require the use of a set of probes arranged in a customized layout. This is traditionally accomplished by using a set of predefined probe plates, some or all of which may include probes that are either redundant or duplicated amongst the various probe plates, thereby introducing an undesirable cost penalty. A testing apparatus in accordance with the disclosure incorporates a configurable probe fixture that includes a docking plate configured to support a first set of probe modules for carrying out a first test upon a printed circuit board assembly. Some or all of the probe modules can then be selectively removed or replaced by other probe modules for reconfiguring the testing apparatus to carry out other tests upon the printed circuit board assembly.

A contact probe is disclosed having a first end portion with a contact tip adapted to abut onto a contact pad of a device under test, a second end portion with a contact head adapted to abut onto a contact pad of a board of a test equipment, a probe body extended between the first and the second end portions according to a longitudinal development axis, and an elastic stopper provided in an elastic portion of the probe body arranged contiguous to the second end portion. The elastic stopper is deformable between a first working condition, in which it has a transversal diameter greater than a transversal diameter of the probe body, and a second working condition in which it has a transversal diameter corresponding to the transversal diameter of the probe body.