Systems and methods for calibrating a conducted electrical weapon (CEW) to provide a predetermined amount of current for each pulse of the stimulus signal. Providing the predetermined amount of current, close thereto, increases the effectiveness of the stimulus signal in impeding locomotion of a human or animal target. The calibration process enables a CEW to calibrate the amount of charge in a pulse of the stimulus signal in the environmental conditions where the tester operates and also in the field where the environmental conditions may be different from the environmental conditions during calibration.

An RF electronic impedance tuner uses multiple PIN diodes, Varactors or MOSFETs, mounted in a low loss slab-line, between the bottom surface of the center conductor and ground, are DC controlled individually and spaced appropriately along the slab-line in order to generate maximum Gamma and bandwidth. The electronic tuner is combined with a slide screw tuner, using the same slab-line in various configurations, before, after or sharing the same slab-line section, mounted on top of each-other. Calibration on a VNA allows high Gamma and harmonic tuning.

Systems and methods for calibrating a conducted electrical weapon (CEW) to provide a predetermined amount of current for each pulse of the stimulus signal. Providing the predetermined amount of current, close thereto, increases the effectiveness of the stimulus signal in impeding locomotion of a human or animal target. The calibration process enables a CEW to calibrate the amount of charge in a pulse of the stimulus signal in the environmental conditions where the tester operates and also in the field where the environmental conditions may be different from the environmental conditions during calibration.

In one embodiment, a tester calibration device includes a first board to be installed on one of a plurality of sockets of a tester for testing a semiconductor device, when the tester is to be calibrated. The device further includes a plurality of first pins provided on a first face of the first board, and to be made contact with the one socket when the tester is to be calibrated. The device further includes a wiring configured to electrically connect some of the plurality of first pins with each other.

An electromagnetic wave impedance measuring apparatus includes a network analyzer, configured to measure scattering parameters according to a frequency, including a first port and a second port; and a multilayer substrate, connected to the first port and the second port by a coaxial cable, having a via connecting conductive layers to each other and including three or more conductive layers including at least an uppermost layer, a lowermost layer, and an intermediate layer. The multilayer substrate includes a test sample disposed between the uppermost layer and the lowermost layer; a through calibration standard disposed between the uppermost layer and the lowermost layer; a reflect calibration standard disposed between the uppermost layer and the lowermost layer; and a line calibration standard disposed between the uppermost layer and the lowermost layer. Each of the test sample, the through calibration standard, the reflect calibration standard, and the line calibration standard is connected by a first error box, having the via, and a second error box having the via of the same structure as the via of the first error box.

An electronic overload current breaker supports arc-fault and ground-fault (AFGF) detection along with built-in shunt calibration (BISC). The breaker may include a current sensing shunt and a control circuit electrically coupled to the current sensing shunt. This control circuit is configured to calibrate the current sensing shunt in response to application of a calibration current to the breaker. The control circuit can: (i) determine a magnitude of the calibration current applied to the breaker, (ii) map the magnitude of the calibration current to a first one of a plurality of current ratings for the breaker, and (iii) set the breaker to monitor overload conditions at the first one of the plurality of current ratings. The plurality of current ratings for the breaker can be less than the magnitude of the calibration current.

An apparatus includes an external terminal, an output circuit having an impedance corresponding to a code signal, and a calibration circuit configured to produce the code signal responsive to a comparison of a voltage at the external terminal with a reference voltage, the comparison performed by a first cycle period in a first mode and by a second cycle which is longer than the first cycle period in a second mode.

A measurement accessory device connectable to a measurement apparatus or to a device under test wherein the measurement accessory device comprises means for providing characteristic data of said measurement accessory device in machine readable form used by said measurement apparatus during measurement of said device under test.

Example automatic test equipment (ATE) includes: a test instrument for outputting test signals to test a device under test (DUT), and for receiving response signals based on the test signals; a device interface board (DIB) connected to the test instrument, with the DIB including an application space having a site to which the DUT connects, and with the test signals and the response signals passing through the site; and calibration circuitry in the application space on the DIB. The calibration circuitry includes a communication interface over which communications pass, with the communications comprising control signals to the calibration circuitry and measurement signals from the calibration circuitry. The calibration circuitry also includes non-volatile memory to store calibration data and is controllable, based on the control signals, to pass the test signals from the test instrument to the DUT and to pass the response signals from the DUT to the test instrument.

According to one embodiment, a testing device includes a signal generator that generates a first signal output to a device under test, a channel selector provided after the signal generator and configured to select one of a plurality of channels, a signal receiver that receives the second signal supplied from the device under test, a correction value calculator that calculates a correction value for calibrating loss of a respective one of the channels, wherein the correction value calculator calculates a correction value for calibrating loss of a respective one of the channels included in the channel selector, based on a signal level received by the signal receiver via a loopback channel, when a calibration-level output state indicating a state where a signal level of the first signal generated by the signal generator reaches a predetermined transmission reference level of calibration is assumed.