An example test system includes a device interface board (DIB) having one or more signal transmission paths and an interface for connecting to one or more other components of the test system. Test circuitry is configured to inject test signals into the one or more signal transmission paths and to measure transmitted versions of the test signals at the interface to obtain measurement signals. One or more processing devices are configured to generate calibration factors based on differences between the injected test signals and the measurement signals, and to store the calibration factors in computer memory. The calibration factors are for correcting for effects on the test signals of the one or more signal transmission paths.

A system may include a trim circuit configured to provide a trim signal to a circuit under test. The trim circuit may be configured to adjust a trim value of the trim signal based on a selection signal and a value signal. The trim signal may cause a key characteristic of the circuit under test to change based on the adjusted trim value. The system may include a production tester configured to determine whether the key characteristic is within a threshold range. Responsive to the key characteristic being within the threshold range, the production tester may stop performing the trim procedure on the circuit under test. Responsive to the key characteristic not being within the threshold range, the production tester may adjust the value signal based on whether the key characteristic is greater than or less than the threshold range.

A method of absolute phase calibration of at least a first port of a test and measurement equipment, comprising: providing the test and measurement equipment having the first port to be calibrated; providing a calibration mixer having a first port, a second port and a local oscillator port; providing at least one phase reproducible source that outputs a local oscillator signal; and performing at least two UOSM measurements at the first port of the test and measurement equipment, wherein at least one of the at least two UOSM measurements is performed with a frequency shift from a first frequency to a second frequency by using the calibration mixer. Furthermore, a calibration system is described.

The invention relates to a system for calibrating a measurement antenna of an RF test arrangement, comprising: a calibration antenna, and a fixture, wherein the calibration antenna is mounted to the fixture, and wherein the fixture comprises an aperture for removably mounting the fixture on the measurement antenna, wherein the calibration antenna is arranged at a fixed distance from the measurement antenna if the fixture is mounted on the measurement antenna.

A self-calibrated system on a chip includes a semiconductor substrate, at least one silicon intellectual property (SIP) circuit including dynamic random access memories (DRAMs), a calibration circuit, and a function circuit, a cyclic oscillator, and a control circuit. Each DRAM has a coarsely-tuned capacitance value and a coarsely-tuned resistance value. The calibration circuit has a finely-tuned capacitance value and a finely-tuned resistance value. The cyclic oscillator transmits an oscillating clock signal to the control circuit to choose and provide the coarsely-tuned capacitance value, the coarsely-tuned resistance value, the finely-tuned capacitance value and the finely-tuned resistance value for the function circuit, thereby adjusting a function parameter.

A multi-chip system includes a plurality of chips and a monitoring and calibration system. The plurality of chips include at least a first chip and a second chip, wherein an output port of the first chip is connected to an input port of the second chip via a chip-to-chip connection, the first chip transmits an output signal to the second chip via the chip-to-chip connection, and the second chip processes an input signal that is derived from the output signal transmitted via the chip-to-chip connection. The monitoring and calibration system calibrates a chip setting of at least one of the first chip and the second chip for pulse width calibration of the input signal.

A device may determine an analog gain for an aggregated analog signal. The aggregated analog signal may be associated with a calibration test to be used to determine a set of calibration parameters for a load test of a base station. The device may determine the set of calibration parameters for the load test based on an outcome of performing a calibration test. The set of calibration parameters may result in a set of digital gains approximately centered in a digital dynamic gain range. The device may perform the load test after determining the analog gain for the analog signal and based on the set of calibration parameters for the load test.

A test and measurement instrument including a user interface configured to receive instructions to perform a signal path calibration for a user-specific setting from a user; a memory configured to store signal path calibration data; and one or more processors that can determine an actual signal path hardware setting for the user-specific setting, determine an adjustment to adjust the actual signal path hardware setting to the user-specific setting, adjust the actual signal path hardware setting by the adjustment to accurately represent the user-specific setting, and store the user-specific setting and the adjusted signal path hardware setting in the signal path calibration data.

A method of calibrating a measurement and analyzing device for measuring a frequency-converting device under test, comprises the steps of connecting a first port of the measurement and analyzing device with a radio frequency port assigned to the frequency-converting device under test as well as connecting a second port of the measurement and analyzing device with an intermediate frequency port assigned to the frequency-converting device under test. Further, a scalar-mixer calibration is performed at the radio frequency port and the intermediate frequency port, thus providing a precise calibration conversion amplitude. A relative calibration is performed between the radio frequency port and the intermediate frequency port by using a calibration mixer. At least one correction coefficient is determined by the difference between the results obtained from the scalar-mixer calibration and the relative calibration. The at least one correction coefficient is used to correct an error term applied.

A method of calibrating a measurement and analyzing device for measuring a frequency-converting device under test, comprises the steps of connecting a first port of the measurement and analyzing device with a radio frequency port assigned to the frequency-converting device under test as well as connecting a second port of the measurement and analyzing device with an intermediate frequency port assigned to the frequency-converting device under test. Further, a scalar-mixer calibration is performed at the radio frequency port and the intermediate frequency port, thus providing a precise calibration conversion amplitude. A relative calibration is performed between the radio frequency port and the intermediate frequency port by using a calibration mixer. At least one correction coefficient is determined by the difference between the results obtained from the scalar-mixer calibration and the relative calibration. The at least one correction coefficient is used to correct an error term applied.