A repairing method for an array substrate is provided. The array substrate includes at least one defective signal line, which is a data line or a gate line having a breakpoint. The defective signal line is divided by the breakpoint into a first portion and a second portion. The repairing method includes disconnecting a connection between a first thin film transistor and a data line or a gate line to which the first thin film transistor is connected, the first thin film transistor being a thin film transistor closest to the breakpoint among thin film transistors connected to the first portion; electrically connecting a first terminal of the first thin film transistor to the first portion; and taking a common electrode line segment from a common electrode line to which the first pixel electrode corresponds as a repair line.

An array substrate manufacturing method includes forming a plurality of first lead lines, a plurality of pixel electrodes, and a plurality of connecting lines over a substrate. Each first lead line is insulated from any pixel electrode, and each connecting line is insulated from any first lead line and is configured to electrically couple at least two pixel electrodes such that a set of pixel electrodes electrically coupled by each set of connecting lines substantially form an equivalent lead line. The method further includes detecting whether there is a short circuit between one equivalent lead line and a first lead line, and severing each of the plurality of connecting lines such that any two of the plurality of pixel electrodes are not electrically coupled.

The present disclosure illustrates a method for correcting an active matrix substrate. The method includes steps: performing the broken-line inspection process to inspect whether the broken line exists on the first and second gate lines; if one first gate line is inspected to be broken, performing a source line repair-section forming process to cut off the cut portions of the second source lines disposed at two sides of a pixel electrode corresponding to a broken location of the first gate line, to form source line repair sections overlapping with the broken first gate line and the second gate line; performing a gate line repair-section forming process on the second gate line, adjacent to the broken first gate line, to cut off the cut portions of the second gate line to form a gate line repair section overlapping with the second source lines; and performing a connection process.

A method for repairing the gate-line disconnection includes: determining a disconnected position of a gate line; determining two connecting elements that are closest to the disconnected position and are respectively located at two sides of the disconnected position along an extending direction of the gate line; selecting one or two sub-pixels electrically connected to the two connecting elements as repair sub-pixels, determining a common electrode line coupled to a common electrode of each repair sub-pixel as a selected common electrode line; forming a communication path between a front portion and a rear portion at the disconnected position to bypass the disconnected position, the communication path including at least the common electrode of each repair sub-pixel and a separate line segment cut from the selected common electrode line; disconnecting the common electrode in the communication path from other common electrodes; and disconnecting each repair sub-pixel from a data line.

Disclosed are an array substrate and a display panel formed by cutting the array substrate, the array substrate includes a substrate body, a first test line, a second test line, and a cutting line; the substrate body includes a plurality of display units and a cutting area located between the plurality of display units; the first test line and the second test line are disposed in the cutting area; the first test line is disposed across the second test line and insulated from each other; the first test line and/or the second test line includes a bending segment disposed across the cutting line.

A display device and a method of inspecting signal lines of the display device facilitating inspection of a large number of signal lines are disclosed. According to one embodiment, the display device includes: a substrate; a first signal line disposed in a display area of the substrate; and a first inspection line disposed in a non-display area of the substrate and connected to the first signal line. The first inspection line includes: a first line connected to the first signal line; a second line disposed on a layer substantially the same as a layer on which the first line is disposed, the second line spaced apart from the first line; and a third line disposed on a layer different from the layer on which the first line and the second line are disposed with an insulating layer interposed therebetween, the third line overlapping at least a portion of the first line and a portion of the second line.

The present invention provides an array substrate and a display panel. A second data line is disposed on the array substrate, so that a first data line is connected to the second data line. Therefore, after the first data line is disconnected, signals can be transmitted from the second data line, which solves a technical problem that current display panels cannot solve poor display caused by disconnection of the data lines.

A display device includes an array substrate, a first region in which a plurality of scan lines extending in a first direction, a plurality of signal lines extending in a second direction, and a plurality of pixels are provided on the array substrate and that has a first side, a second side, a third side, a fourth side, and a plurality of curved line parts, a second region positioned between an end part of the array substrate and the first region, a signal-line coupling circuit disposed in the second region and coupled to the signal lines, a shield layer disposed in the second region and covering at least part of the signal-line coupling circuit near at least one of the curved line parts, and a gate driver circuit disposed in the second region outside the signal-line coupling circuit and coupled to the scan lines.

Embodiments of the present disclosure are related to a display device, as repairing a disconnection of a gate line by using a driving voltage line and a driving voltage line connection pattern disposed on a pixel where a point that the gate line is disconnected is located, the disconnection of the gate line can be repaired easily while minimizing an arrangement of additional components. Furthermore, as making a pixel where a repaired point is located to be darkened and to be connected to adjacent pixel to be driven, a disconnection defect of the gate line can be repaired while preventing an image abnormality due to the disconnection and the repair of the gate line.

An array substrate having a display area, a peripheral area, and a bonding area inside the peripheral area is provided. The array substrate includes a bonding pad in the bonding area, the bonding pad configured to be connected to a peripheral circuit through a bonding connector, a test signal line including a first portion and a second portion. The first portion is in the peripheral area and substantially surrounds the display area. The first portion is electrically connected to the bonding pad. The first portion is completely inside the array substrate and has no exposed terminal. The second portion is in the bonding area. A first terminal of the second portion is electrically connected to the bonding pad. A second terminal of the second portion has an end along an edge of the array substrate in the bonding area.