Apparatus and methods for compensating supply sensitive circuits for supply voltage variation are provided. An electronic system includes a power supply that outputs a supply voltage having a nominal voltage level, a supply conductor for routing the supply voltage, and a group of integrated circuits (ICs) that each receive the supply voltage from the supply conductor. Each IC includes a supply sensing circuit that generates a sense signal based on a local voltage level of the supply voltage at the IC, a bias control circuit that adjusts a bias signal based on the sense signal to account for a difference between the nominal voltage level and the local voltage level of the supply voltage, and a signal processing circuit biased by the bias signal.

Systems and methods are provided for generating a temperature compensated reference voltage. A temperature compensation circuit may include a proportional-to-absolute temperature (PTAT) circuit, and a complementary-to-absolute temperature (CTAT) circuit, with the PTAT circuit and the CTAT circuit including at least one common metal-oxide-semiconductor field-effect transistor (MOSFET) and being configured to collectively generate a reference voltage in response to a regulated current input. The PTAT circuit may be configured to produce an increase in magnitude of the reference voltage with an increase of temperature, and the CTAT circuit may be configured to generated a decrease in magnitude of the reference voltage with the increase of temperature, wherein the increase in magnitude of the reference voltage produced by the PTAT circuit is at least partially offset by the decrease in magnitude of the reference voltage produced by the CTAT circuit.

A controllable temperature coefficient bias (CTCB) circuit is disclosed. The CTCB circuit can provide a bias to an amplifier. The CTCB circuit includes a variable with temperature (VWT) circuit having a reference circuit and a control circuit. The control circuit has a control output, a first current control element and a second current control element. Each current control element has a “controllable” resistance. One of the two current control elements may have a relatively high temperature coefficient and another a relatively low temperature coefficient. A controllable resistance of one of the current control elements increases when the controllable resistance of the other current control element decreases. However, the “total resistance” of the current control circuit remains constant with a constant temperature. The VWT circuit has an output with a temperature coefficient that is determined by the relative amount of current that flows through each current control element of the control circuit. A Current Digital to Analog Converter (IDAC) scales the output of the VWT and provides the scaled output to an amplifier bias input.

A voltage regulator is provided. The voltage regulator includes a shunt transistor and a feedback circuit. The shunt transistor has a first current electrode coupled to a first voltage source terminal, a second current electrode coupled to a second voltage source terminal, a control electrode coupled to receive a reference voltage, and a body electrode. The feedback circuit has an input terminal coupled to the body electrode of the shunt transistor, and an output terminal coupled to the control electrode of the shunt transistor. The voltage regulator is suitable for use in a passive RFID device to protect the device from over-voltage damage. In another embodiment, a method for regulating a voltage is provided.

Systems and methods are provided for generating a temperature compensated reference voltage. A temperature compensation circuit may include a proportional-to-absolute temperature (PTAT) circuit, and a complementary-to-absolute temperature (CTAT) circuit, with the PTAT circuit and the CTAT circuit including at least one common metal-oxide-semiconductor field-effect transistor (MOSFET) and being configured to collectively generate a reference voltage in response to a regulated current input. The PTAT circuit may be configured to produce an increase in magnitude of the reference voltage with an increase of temperature, and the CTAT circuit may be configured to generated a decrease in magnitude of the reference voltage with the increase of temperature, wherein the increase in magnitude of the reference voltage produced by the PTAT circuit is at least partially offset by the decrease in magnitude of the reference voltage produced by the CTAT circuit.

Apparatus and methods for compensating supply sensitive circuits for supply voltage variation are provided. In certain embodiments, an electronic system includes a power supply that outputs a supply voltage having a nominal voltage level, a supply conductor for routing the supply voltage, and a group of integrated circuits (ICs) that each receive the supply voltage from the supply conductor. Each IC includes a supply sensing circuit that generates a sense signal based on a local voltage level of the supply voltage at the IC, a bias control circuit that adjusts a bias signal based on the sense signal to account for a difference between the nominal voltage level and the local voltage level of the supply voltage, and a signal processing circuit biased by the bias signal.

Systems and methods are provided for generating a temperature compensated reference voltage. A temperature compensation circuit may include a proportional-to-absolute temperature (PTAT) circuit, and a complementary-to-absolute temperature (CTAT) circuit, with the PTAT circuit and the CTAT circuit including at least one common metal-oxide-semiconductor field-effect transistor (MOSFET) and being configured to collectively generate a reference voltage in response to a regulated current input. The PTAT circuit may be configured to produce an increase in magnitude of the reference voltage with an increase of temperature, and the CTAT circuit may be configured to generated a decrease in magnitude of the reference voltage with the increase of temperature, wherein the increase in magnitude of the reference voltage produced by the PTAT circuit is at least partially offset by the decrease in magnitude of the reference voltage produced by the CTAT circuit.

A reference voltage generating circuit includes a bandgap reference (BGR) circuit configured to output an active reference voltage at a first node according to a sample signal; a first charging circuit configured to charge a first capacitor using the active reference voltage according to the sample signal; a second charging circuit configured to charge a second capacitor using the active reference voltage according to the sample signal; and a comparing circuit configured to compare a voltage difference between a charge voltage of the first capacitor and a charge voltage of the second capacitor with a threshold value, wherein the sample signal is a pulse signal generated using an output of the comparing circuit and the charge voltage of the first capacitor is provided as a low power reference voltage in a low power operation mode.

A supply voltage sensitivity of an output current of a bias current generator circuit is reduced. The bias current generator includes a plurality of transistors and a plurality of resistors coupled to the plurality of transistors. The supply voltage sensitivity of the output current of the bias current generator circuit is reduced by applying a second bias current generated by the bias current generator circuit to a first bias current generated by the bias current generator circuit.

A buffer apparatus, a chip and an electronic device. The apparatus comprises: a voltage adjustment module (10) comprising a first P-type metal-oxide-semiconductor field-effect transistor (PMOS), wherein the voltage adjustment module (10) is used for receiving an input voltage, using a threshold voltage for the first PMOS to adjust the input voltage, and outputting a driving voltage; and a buffer module (20) electrically connected to the voltage adjustment module (10) and used for receiving an input signal, buffering the input signal under the driving voltage, and outputting a buffered signal. The driving voltage obtained by using the threshold voltage for the first PMOS to adjust the input voltage can compensate for a process corner of the buffer module (20), such that the range of a flip point voltage of the buffer module (20) becomes small and meets process requirements.