A memory device comprises a memory array, a counter unit, and a service unit. The memory array comprises cells arranged in rows and columns, wherein a subset of the cells in each of the rows holds a row activation count for each row. The counter unit, in response to an activation of the row caused by a read operation on at least a portion of the row, increments the row activation count for at least one of the rows prior to a completion of the read operation, and writes-back the row activation count in an incremented state to the subset of the cells in the row that held the row activation count prior to the activation. The service unit is coupled to the counter unit and performs a service with respect to one or more other rows, offset from the row, in response to the row activation count associated with the row satisfying service criteria.

A memory device comprises a memory array, a counter unit, and a service unit. The memory array comprises cells arranged in rows and columns, wherein a subset of the cells in each of the rows holds a row activation count for each row. The counter unit, in response to an activation of the row caused by a read operation on at least a portion of the row, increments the row activation count for at least one of the rows prior to a completion of the read operation, and writes-back the row activation count in an incremented state to the subset of the cells in the row that held the row activation count prior to the activation. The service unit is coupled to the counter unit and performs a service with respect to one or more other rows, offset from the row, in response to the row activation count associated with the row satisfying service criteria.

A synergistic approach to mitigating crosstalk in a Dynamic Random-Access Memory (DRAM) implements the use of a random number generator to increment a counter in a probabilistic manner. The counter is formed by reclaiming bytes of a double data rate (DDR) fault isolation feature. The random number generator value may be compared against a predetermined parameter value and a determination may be made whether or not to extract and increment the counter based on a result of the comparison. A logic controller compares the counter value to a predetermined hotness threshold parameter and a flag is set based on an existence of an address match in local memory. Based on the results of the comparison, access to the DRAM is reduced.

Apparatuses and methods for pure-time, self-adopt sampling for RHR refresh. An example apparatus includes a memory bank comprising a plurality of rows each associated with a respective row address, and a sampling timing generator circuit configured to provide a timing signal having a plurality of pulses. Each of the plurality of pulses is configured to initiate sampling of a respective row address associated with a row of the plurality of rows to detect a row hammer attack. The sampling timing generator includes first circuitry configured to provide a first subset of pulses of the plurality of pulses during a first time period and includes second circuitry configured to initiate provision of a second subset of pulses of the plurality of pulses during a second time period after the first time period.

A memory includes: a random seed generation circuit suitable for generating a random seed including process variation information; a random signal generator suitable for generating a random signal that is randomly activated based on the random seed; and an address sampling circuit suitable for sampling an active address while the random signal is activated.

A memory includes: a random seed generation circuit suitable for generating a random seed including process variation information; a random signal generator suitable for generating a random signal that is randomly activated based on the random seed; and an address sampling circuit suitable for sampling an active address while the random signal is activated.

A semiconductor memory device includes a memory cell array including a plurality of memory cell rows, a row hammer management circuit, and a refresh control circuit. The row hammer management circuit captures row addresses accompanied by first active commands randomly selected from active commands, each of which has a first selection probability that is uniform, from an external memory controller during a reference time interval, and selects at least one row address from among the captured row addresses as a hammer address a number of times proportional to access counts of an active command corresponding to the at least one row address during the reference time interval. The refresh control circuit receives the hammer address and performs a hammer refresh operation on one or more victim memory cell rows which are physically adjacent to a memory cell row corresponding to the hammer address.

An electronic device includes a memory having a plurality of memory rows and a memory refresh functional block that performs a victim row refresh operation. For the victim row refresh operation, the memory refresh functional block selects one or more victim memory rows that may be victims of data corruption caused by repeated memory accesses in a specified group of memory rows near each of the one or more victim memory rows. The memory refresh functional block then individually refreshes each of the one or more victim memory rows.

Apparatuses, systems, and methods for a system on chip (SoC) replacement mode. A memory device may be coupled to a SoC which may act as a controller of the memory. Commands and addresses may be sent along a command/address (CA) bus to a first decoder of the memory. The first decoder may use a first reference voltage to determine a value of signals along the CA bus. One of the pins of the CA bus may be coupled to a second decoder which may use a different second reference voltage. When the voltage on the pin exceeds the second reference voltage, the memory device may enter a SoC replacement mode, in which the memory may take various actions to preserve data integrity, while a new SoC comes online.

Methods, systems, and devices for life expectancy monitoring for memory devices are described. Some memory devices may degrade over time, and this degradation may include or refer to a reduction of an ability of the memory device to reliably store, read, process, or communicate information, among other degradation. In accordance with examples as disclosed herein, a system may include components configured for monitoring health or life expectancy of the memory device, such as components that perform comparisons between signals or other operating characteristics resulting from operating at the memory device and one or more threshold values that may be indicative of a life expectancy of the memory device. In various examples, a memory device may perform a subsequent operation based on such a comparison, or may provide an indication of a life expectancy to a host device based on one or more comparisons or determinations about health or life expectancy.