A thin film resistor and a method of fabricating the same are provided. The thin film resistor includes a substrate, a first end electrode, a second end electrode, a resistor layer, an electrostatic protection layer and an electrostatic electrode layer disposed on the resistor layer. The first end electrode and the second end electrode are disposed on two end portions of an upper surface of the substrate, respectively. The resistor layer and the electrostatic protection layer are disposed on the upper surface of the substrate. The electrostatic protection layer is disposed adjacent to one side of the resistor layer. The electrostatic protection layer includes two separated portions, and at least one of the two separated portions has a tip portion. Therefore, electrostatic charges can be prevented from flowing into the resistor layer, and moisture penetration into the resistor layer can be blocked.

The present invention relates to a device for use with an electrical component, wherein the device is configured to surround at least a component portion of the electrical component at least partially around the axis thereby defining a region therebetween. The device comprises two members, wherein at least one of the members comprises at least one varying property that varies along an axis.

The present invention relates to a device for use with an electrical component, wherein the device is configured to surround at least a component portion of the electrical component at least partially around the axis thereby defining a region therebetween. The device comprises two members, wherein at least one of the members comprises at least one varying property that varies along an axis.