Patent classifications
H01J9/42
PARTIAL DISCHARGE SYNTHESIZER
An apparatus for generating electrical discharge includes a component that generates an electrical discharge, a measurement circuit configured to measure a magnitude of the electrical discharge, and a controller configured to control the magnitudes of the electrical discharge. A method for controlling a reference partial discharge signal in an electric power system includes generating a partial discharge for built in self test, controlling an expected discharge magnitude of the partial discharge, and includes measuring an actual discharge magnitude of the partial discharge.
Barrier coatings
A secondary electron emissive layer resistant to infiltration and fouling. A barrier layer is formed by atomic layer deposition. The barrier layer may be an emissive layer and/or an interlayer. The barrier layer may form an interlayer that is a part of an electron amplifier positioned between an emissive layer and a resistive layer. The barrier layer is resistive to fluorine migration from either the emissive layer or the resistive layer.
Barrier coatings
A secondary electron emissive layer resistant to infiltration and fouling. A barrier layer is formed by atomic layer deposition. The barrier layer may be an emissive layer and/or an interlayer. The barrier layer may form an interlayer that is a part of an electron amplifier positioned between an emissive layer and a resistive layer. The barrier layer is resistive to fluorine migration from either the emissive layer or the resistive layer.
ESTIMATION OF CATHODE SPACE CURRENT FOR A THERMIONIC VACUUM TUBE USING A POLYNOMIAL BASED ON A HEURISTICALLY DETERMINED VARIABLE REPRESENTING THE GRID AND PLATE VOLTAGES
A method includes performing by a processor: estimating a total cathode space current for a thermionic vacuum tube having at least one grid and a plate, such that at least one amplification factor associated with the at least one grid is determined by a polynomial based on a variable that represents at plurality of voltages associated with the at least one grid and the plate, the variable being heuristically determine. Transitions between positive and negative grid operation may experience a step change in estimated current value caused by the inclusion or elimination of grid current. A part of the grid current may be added back into the plate current during transition. This small contribution to plate current may gradually diminish as tube operation moves farther away from the transition boundary.
MEASURING DEVICE AND OPERATION METHOD OF SYSTEM FOR INSPECTING FOCUS RING
In a measuring device provided in a region surrounded by a focus ring and configured to measure an amount of consumption of the focus ring, the measuring device comprises: a disc-shaped base substrate; sensor electrodes provided on the base substrate; a high frequency oscillator configured to apply a high frequency signal to the sensor electrodes; and an operation unit configured to calculate measurement values indicating electrostatic capacitances of the sensor electrodes from detection values corresponding to potentials of the sensor electrodes. The operation unit calculates a representative value (average value) of the measurement values corresponding to the amount of consumption of the focus ring and derives the amount of consumption of the focus ring with reference to a table in which the amount of consumption of the focus ring is associated with the representative value (average value) of the measurement values corresponding to the amount of consumption.
Test fixture for a display device
The disclosure relates to the field of display devices and discloses a test fixture for a display device. The test fixture includes a fixing component, and a test component arranged detachably from the fixing component, wherein the fixing component includes a fixing component body, and a clamp arranged on the fixing component body to clamp the display device, and the test component is configured to be electrically connected with a circuit board of the display device.
APPARATUS FOR AGING FIELD EMISSION DEVICE AND AGING METHOD THEREOF
The inventive concept relates to an apparatus for aging a field emission device configured to emitting electrons based on an electric field between a first electrode and a second electrode, and an aging method thereof. The apparatus according to an embodiment of an inventive concept includes a voltage generator and a current controller. The voltage generator increases the voltage applied to the first electrode to the target voltage level during the first time. The current controller increases the field emission current for the second time to the target current level and increases the pulse width of the field emission current for the third time to the target pulse width. According to the inventive concept, the performance of a large field emission device may be improved with high efficiency and low cost.
APPARATUS FOR AGING FIELD EMISSION DEVICE AND AGING METHOD THEREOF
The inventive concept relates to an apparatus for aging a field emission device configured to emitting electrons based on an electric field between a first electrode and a second electrode, and an aging method thereof. The apparatus according to an embodiment of an inventive concept includes a voltage generator and a current controller. The voltage generator increases the voltage applied to the first electrode to the target voltage level during the first time. The current controller increases the field emission current for the second time to the target current level and increases the pulse width of the field emission current for the third time to the target pulse width. According to the inventive concept, the performance of a large field emission device may be improved with high efficiency and low cost.
CHARGED PARTICLE DEVICE, STRUCTURE MANUFACTURING METHOD, AND STRUCTURE MANUFACTURING SYSTEM
A charged particle device includes an electron emitting part for emitting electrons, an electron irradiated part configured to be irradiated with the electrons emitted from the electron emitting part, a container part configured to evacuate an interior thereof and contain the electron irradiated part in the interior thereof, an electric wire containing part configured to be inserted from an outside of the container part via an insertion part provided in the container part to contain an electric wire through which electricity is conducted to the electron irradiated part contained in the container part, and an insertion-part-side protrusion part configured to surround the electric wire containing part and protrude from a vicinity of the insertion part on an inner wall of the container part to an interior of the container part.
CHARGED PARTICLE DEVICE, STRUCTURE MANUFACTURING METHOD, AND STRUCTURE MANUFACTURING SYSTEM
A charged particle device includes an electron emitting part for emitting electrons, an electron irradiated part configured to be irradiated with the electrons emitted from the electron emitting part, a container part configured to evacuate an interior thereof and contain the electron irradiated part in the interior thereof, an electric wire containing part configured to be inserted from an outside of the container part via an insertion part provided in the container part to contain an electric wire through which electricity is conducted to the electron irradiated part contained in the container part, and an insertion-part-side protrusion part configured to surround the electric wire containing part and protrude from a vicinity of the insertion part on an inner wall of the container part to an interior of the container part.