A muon detector includes: a chamber having a maximum cross-sectional dimension of 30 cm or less; a gas sealed inside the chamber ionized by the passage of atmospheric muons to form ions in the chamber; a cathode in the chamber at a first position; an anode in the chamber displaced from the first position, the anode including a mesh of wires; a micropattern gaseous detector arranged between the cathode and the anode and proximate to the anode and configured to receive the ions formed in the chamber between the anode and the cathode and generate electrons in response to each ion sufficient to generate a current in one or more of the mesh wires of the anode; and readout electronics in electrical communication with the anode to detect signals in response to the current generated in the mesh wires.

A photoionization detector comprised of a sensor having at least a collector electrode and a grounding electrode, a gas discharge lamp that ionizes molecules of interest to create ionized molecules and electrons, and an amplifier connected to the collector electrode. Each of the collector electrode and the grounding electrode include a feed-thru pin, an inner trace surrounding the feed-thru pin, an outer trace surrounding the inner trace, wherein the outer trace on each electrode is comprised of the same material, a channel between the inner trace and the outer trace, wherein the channel is comprised of a different material than the outer trace and the inner trace, and a bridge connecting the outer trace with the inner trace. The ionized molecules are collectable by a bias electrode and electrons are collectable by the collector electrode.

A radiation source arrangement causes interaction between pump radiation (340) and a gaseous medium (406) to generate EUV or soft x-ray radiation by higher harmonic generation (HHG). The operating condition of the radiation source arrangement is monitored by detecting (420/430) third radiation (422) resulting from an interaction between condition sensing radiation and the medium. The condition sensing radiation (740) may be the same as the first radiation or it may be separately applied. The third radiation may be for example a portion of the condition sensing radiation that is reflected or scattered by a vacuum-gas boundary, or it may be lower harmonics of the HHG process, or fluorescence, or scattered. The sensor may include one or more image detectors so that spatial distribution of intensity and/or the angular distribution of the third radiation may be analyzed. Feedback control based on the determined operating condition stabilizes operation of the HHG source.

A beam profile measurement (BPM) system is described including a BPM phantom including a tank to house liquid, a dosimeter disposed in the tank to detect ionization of a radiation beam emitted from a linear accelerator (LINAC), and a positioning device to move the dosimeter in a vertical direction. The BPM system also includes a BPM controller to operably couple to the BPM phantom and the LINAC. A method is described including positioning, using a BPM controller, a dosimeter of the BPM phantom in a first location, positioning, using the BPM controller, the LINAC in a second location, performing, using the BPM controller, a first movement of the LINAC from the second location to a third location, emitting a radiation beam from the LINAC during the first movement, and performing, via the dosimeter, an ion measurement of the radiation beam during the emitting.

A beam profile measurement (BPM) system is described including a BPM phantom including a tank to house liquid, a dosimeter disposed in the tank to detect ionization of a radiation beam emitted from a linear accelerator (LINAC), and a positioning device to move the dosimeter in a vertical direction. The BPM system also includes a BPM controller to operably couple to the BPM phantom and the LINAC. A method is described including positioning, using a BPM controller, a dosimeter of the BPM phantom in a first location, positioning, using the BPM controller, the LINAC in a second location, performing, using the BPM controller, a first movement of the LINAC from the second location to a third location, emitting a radiation beam from the LINAC during the first movement, and performing, via the dosimeter, an ion measurement of the radiation beam during the emitting.

An ion detection device has a strip of carbon-based nanomaterial (CNM) film and a chamber enclosing the CNM film. A low bias voltage is applied at the ends of the CNM film strip, and ions present in the chamber are detected by a change in the magnitude of current flowing through the CNM film under the bias. Also provided are methods for fabricating the device, methods for measuring pressure of a gas, and methods for monitoring or quantifying an ionizing radiation using the device.

An ion detection device has a strip of carbon-based nanomaterial (CNM) film and a chamber enclosing the CNM film. A low bias voltage is applied at the ends of the CNM film strip, and ions present in the chamber are detected by a change in the magnitude of current flowing through the CNM film under the bias. Also provided are methods for fabricating the device, methods for measuring pressure of a gas, and methods for monitoring or quantifying an ionizing radiation using the device.

An ion filter used for an electron multiplier includes an insulating substrate; a first conductive layer formed on one main surface of the substrate; and a second conductive layer formed on another main surface of the substrate. The ion filter has a plurality of through-holes formed along a thickness direction of the substrate. The one main surface of the substrate is disposed at a downstream side in a moving direction of electrons in a chamber of the electron multiplier and the other main surface of the substrate is disposed at an upstream side in the moving direction of electrons in the chamber of the electron multiplier. A first thickness of the first conductive layer formed on the one main surface of the substrate is thicker than a second thickness of the second conductive layer on the other main surface of the substrate.

Various embodiments are described herein for sensors that may be used to measure radiation from radiation generating device. The sensors may use a collector plate electrode with first and second collection regions having shapes that are inversely related with one another to provide ion chambers with varying sample volumes along a substantial portion of the first and second collection regions which provides virtual spatial sensitivity during use.

Various embodiments are described herein for sensors that may be used to measure radiation from radiation generating device. The sensors may use a collector plate electrode with first and second collection regions having shapes that are inversely related with one another to provide ion chambers with varying sample volumes along a substantial portion of the first and second collection regions which provides virtual spatial sensitivity during use.